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"pearn w l"
Showing items 126-135 of 182 (19 Page(s) Totally) << < 8 9 10 11 12 13 14 15 16 17 > >> View [10|25|50] records per page
| 國立臺灣科技大學 |
2007 |
Accuracy analysis of the percentile method for estimating non-normal manufacturing quality
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Wu, Chien-Wei; Pearn, W. L. ; Chang, C. S. ; Chen, H. C. |
| 國立臺灣科技大學 |
2007 |
On the sampling distributions of the estimated process loss indices with asymmetric tolerances
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Chang, Y. C. ; Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2007 |
Multivariate capability indices: distributional and inferential properties
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Pearn, W. L. ; Wang, F. K. ; Yen, C. H. |
| 國立臺灣科技大學 |
2007 |
An effective decision making method for product acceptance
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Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2007 |
Accuracy in Estimating Process Capability Analysis
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Pearn, W. L. ; Wu, Chien-Wei |
| 元培科技大學 |
2007 |
Optimal Tool Replacement for Processes with Low Fraction Defective,
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Pearn, W. L. ; Hsu, Ya Chen |
| 元培科技大學 |
2007 |
Optimal Tool Replacement Policy for one-sided Processes with Low Fraction Defective,
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Pearn, W. L.; Hsu, Ya Chen; Shiau, H. J. |
| 國立臺灣科技大學 |
2006 |
Production quality and yield assurance for processes with multiple independent characteristics
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Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2006 |
Quality yield measure for processes with asymmetric tolerances
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Pearn, W. L. ; Lin, P. C. ; Chang, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2006 |
Bayesian approach for measuring EEPROM process capability based on the one-sided indices CPU and CPL
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Wu, Chien-Wei; Pearn, W. L. |
Showing items 126-135 of 182 (19 Page(s) Totally) << < 8 9 10 11 12 13 14 15 16 17 > >> View [10|25|50] records per page
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