| 國立臺灣科技大學 |
2007 |
Accuracy analysis of the percentile method for estimating non-normal manufacturing quality
|
Wu, Chien-Wei; Pearn, W. L. ; Chang, C. S. ; Chen, H. C. |
| 國立臺灣科技大學 |
2007 |
On the sampling distributions of the estimated process loss indices with asymmetric tolerances
|
Chang, Y. C. ; Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2007 |
Multivariate capability indices: distributional and inferential properties
|
Pearn, W. L. ; Wang, F. K. ; Yen, C. H. |
| 國立臺灣科技大學 |
2007 |
An effective decision making method for product acceptance
|
Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2007 |
Accuracy in Estimating Process Capability Analysis
|
Pearn, W. L. ; Wu, Chien-Wei |
| 元培科技大學 |
2007 |
Optimal Tool Replacement for Processes with Low Fraction Defective,
|
Pearn, W. L. ; Hsu, Ya Chen |
| 元培科技大學 |
2007 |
Optimal Tool Replacement Policy for one-sided Processes with Low Fraction Defective,
|
Pearn, W. L.; Hsu, Ya Chen; Shiau, H. J. |
| 國立臺灣科技大學 |
2006 |
Production quality and yield assurance for processes with multiple independent characteristics
|
Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2006 |
Quality yield measure for processes with asymmetric tolerances
|
Pearn, W. L. ; Lin, P. C. ; Chang, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2006 |
Bayesian approach for measuring EEPROM process capability based on the one-sided indices CPU and CPL
|
Wu, Chien-Wei; Pearn, W. L. |
| 國立臺灣科技大學 |
2006 |
Tool replacement for production with a low fraction of defectives
|
Pearn, W. L. ; Hsu, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2006 |
Measuring production yield for processes with multiple quality characteristics
|
Pearn, W. L. ; Wang, F. K. ; Yen, C. H. |
| 國立臺灣科技大學 |
2006 |
Multi-process performance analysis chart based on process loss indices
|
Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2006 |
Measuring process performance based on expected loss for asymmetric tolerances
|
Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2006 |
Variables sampling plans with PPM fraction of defectives and process loss consideration
|
Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2006 |
Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of defectives
|
Pearn, W. L. ; Wu, Chien-Wei |
| 元培科技大學 |
2006 |
Tool Replacement for Production with Low Fraction Defective,
|
Pearn, W. L.; Hsu, Ya Chen ; Wu, Chien-Wei |
| 大葉大學 |
2005-06 |
A Bayesian Approach to Obtain a Lower Bound for the Cpm Capability Index
|
Lin, G. H.;Pearn, W. L.;Yang, Y. S. |
| 國立高雄應用科技大學 |
2005 |
Monitoring manufacturing quality for multiple Li-BPIC processes based on capability index Cpmk
|
PEARN, W. L.; SHU, M. H.; HSU, B. M.; 蘇明鴻 |
| 國立臺灣科技大學 |
2005 |
A Bayesian approach for assessing process precision based on multiple samples
|
Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
Capability measure for asymmetric tolerances non-normal processes applied to speaker driver manufacturing
|
Pearn, W. L. ; Wu, Chien-Wei; Wang, K. H. |
| 國立臺灣科技大學 |
2005 |
Measuring manufacturing capability for couplers and wavelength division multiplexers
|
Wu, Chien-Wei; Pearn, W. L. |
| 國立臺灣科技大學 |
2005 |
Bootstrap approach for estimating process quality yield with application to light emitting diodes
|
Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
Procedures for testing manufacturing precision Cp based on (Xbar, R) or (Xbar, S) control chart samples
|
Pearn, W. L. ; Wu, Chien-Wei; Chuang, H. C. |
| 國立臺灣科技大學 |
2005 |
An effective modern approach for measuring high-tech product manufacturing process quality
|
Pearn, W. L. ; Wu, Chien-Wei |
