| 國立臺灣科技大學 |
2006 |
Tool replacement for production with a low fraction of defectives
|
Pearn, W. L. ; Hsu, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2006 |
Measuring production yield for processes with multiple quality characteristics
|
Pearn, W. L. ; Wang, F. K. ; Yen, C. H. |
| 國立臺灣科技大學 |
2006 |
Multi-process performance analysis chart based on process loss indices
|
Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2006 |
Measuring process performance based on expected loss for asymmetric tolerances
|
Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2006 |
Variables sampling plans with PPM fraction of defectives and process loss consideration
|
Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2006 |
Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of defectives
|
Pearn, W. L. ; Wu, Chien-Wei |
| 元培科技大學 |
2006 |
Tool Replacement for Production with Low Fraction Defective,
|
Pearn, W. L.; Hsu, Ya Chen ; Wu, Chien-Wei |
| 大葉大學 |
2005-06 |
A Bayesian Approach to Obtain a Lower Bound for the Cpm Capability Index
|
Lin, G. H.;Pearn, W. L.;Yang, Y. S. |
| 國立高雄應用科技大學 |
2005 |
Monitoring manufacturing quality for multiple Li-BPIC processes based on capability index Cpmk
|
PEARN, W. L.; SHU, M. H.; HSU, B. M.; 蘇明鴻 |
| 國立臺灣科技大學 |
2005 |
A Bayesian approach for assessing process precision based on multiple samples
|
Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
Capability measure for asymmetric tolerances non-normal processes applied to speaker driver manufacturing
|
Pearn, W. L. ; Wu, Chien-Wei; Wang, K. H. |
| 國立臺灣科技大學 |
2005 |
Measuring manufacturing capability for couplers and wavelength division multiplexers
|
Wu, Chien-Wei; Pearn, W. L. |
| 國立臺灣科技大學 |
2005 |
Bootstrap approach for estimating process quality yield with application to light emitting diodes
|
Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
Procedures for testing manufacturing precision Cp based on (Xbar, R) or (Xbar, S) control chart samples
|
Pearn, W. L. ; Wu, Chien-Wei; Chuang, H. C. |
| 國立臺灣科技大學 |
2005 |
An effective modern approach for measuring high-tech product manufacturing process quality
|
Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
Process capability assessment for index Cpk based on Bayesian approach
|
Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
Capability testing based on Cpm with multiple samples
|
Wu, Chien-Wei; Pearn, W. L. |
| 國立勤益科技大學 |
2004 |
The C”pk index for asymmetric tolerances: Implications and inference
|
Pearn, W.L.; Lin, P.C.; Chen, K.S. |
| 國立勤益科技大學 |
2004 |
The C”pk index for asymmetric tolerances: Implications and inference
|
Pearn, W.L. ; Lin, P.-C. ; Chen, K.-S. |
| 國立勤益科技大學 |
2004 |
Testing process performance based on capability indexCpk with critical values
|
Pearn, W.L. ; Lin, P.-C. |
| 國立臺灣科技大學 |
2004 |
Procedure for supplier selection based on Cpm applied to super twisted nematic liquid crystal display processes
|
Pearn, W. L. ; Wu, Chien-Wei; Lin, H. C. |
| 國立臺灣科技大學 |
2004 |
Quality-yield measure for production with very low fraction of defectives
|
Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2004 |
Distributional and inferential properties of the process loss indices
|
Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 大葉大學 |
2003-06 |
Distributional and inferential Properties of the Estimated Precision Cp based on Multiple Samples
|
Pearn, W. L.;Yang, Y. S. |
| 國立勤益科技大學 |
2003 |
Capability Measures For processes With Multiple Characteristics
|
Chen, K.S.; Pearn, W.L.; Lin, P.C. |
