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機構	日期	題名	作者
國立臺灣科技大學	2006	Tool replacement for production with a low fraction of defectives	Pearn, W. L. ; Hsu, Y. C. ; Wu, Chien-Wei
國立臺灣科技大學	2006	Measuring production yield for processes with multiple quality characteristics	Pearn, W. L. ; Wang, F. K. ; Yen, C. H.
國立臺灣科技大學	2006	Multi-process performance analysis chart based on process loss indices	Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei
國立臺灣科技大學	2006	Measuring process performance based on expected loss for asymmetric tolerances	Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei
國立臺灣科技大學	2006	Variables sampling plans with PPM fraction of defectives and process loss consideration	Pearn, W. L. ; Wu, Chien-Wei
國立臺灣科技大學	2006	Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of defectives	Pearn, W. L. ; Wu, Chien-Wei
元培科技大學	2006	Tool Replacement for Production with Low Fraction Defective,	Pearn, W. L.; Hsu, Ya Chen ; Wu, Chien-Wei
大葉大學	2005-06	A Bayesian Approach to Obtain a Lower Bound for the Cpm Capability Index	Lin, G. H.;Pearn, W. L.;Yang, Y. S.
國立高雄應用科技大學	2005	Monitoring manufacturing quality for multiple Li-BPIC processes based on capability index Cpmk	PEARN, W. L.; SHU, M. H.; HSU, B. M.; 蘇明鴻
國立臺灣科技大學	2005	A Bayesian approach for assessing process precision based on multiple samples	Pearn, W. L. ; Wu, Chien-Wei
國立臺灣科技大學	2005	Capability measure for asymmetric tolerances non-normal processes applied to speaker driver manufacturing	Pearn, W. L. ; Wu, Chien-Wei; Wang, K. H.
國立臺灣科技大學	2005	Measuring manufacturing capability for couplers and wavelength division multiplexers	Wu, Chien-Wei; Pearn, W. L.
國立臺灣科技大學	2005	Bootstrap approach for estimating process quality yield with application to light emitting diodes	Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei
國立臺灣科技大學	2005	Procedures for testing manufacturing precision Cp based on (Xbar, R) or (Xbar, S) control chart samples	Pearn, W. L. ; Wu, Chien-Wei; Chuang, H. C.
國立臺灣科技大學	2005	An effective modern approach for measuring high-tech product manufacturing process quality	Pearn, W. L. ; Wu, Chien-Wei
國立臺灣科技大學	2005	Process capability assessment for index Cpk based on Bayesian approach	Pearn, W. L. ; Wu, Chien-Wei
國立臺灣科技大學	2005	Capability testing based on Cpm with multiple samples	Wu, Chien-Wei; Pearn, W. L.
國立勤益科技大學	2004	The C”pk index for asymmetric tolerances: Implications and inference	Pearn, W.L.; Lin, P.C.; Chen, K.S.
國立勤益科技大學	2004	The C”pk index for asymmetric tolerances: Implications and inference	Pearn, W.L. ; Lin, P.-C. ; Chen, K.-S.
國立勤益科技大學	2004	Testing process performance based on capability indexCpk with critical values	Pearn, W.L. ; Lin, P.-C.
國立臺灣科技大學	2004	Procedure for supplier selection based on Cpm applied to super twisted nematic liquid crystal display processes	Pearn, W. L. ; Wu, Chien-Wei; Lin, H. C.
國立臺灣科技大學	2004	Quality-yield measure for production with very low fraction of defectives	Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei
國立臺灣科技大學	2004	Distributional and inferential properties of the process loss indices	Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei
大葉大學	2003-06	Distributional and inferential Properties of the Estimated Precision Cp based on Multiple Samples	Pearn, W. L.;Yang, Y. S.
國立勤益科技大學	2003	Capability Measures For processes With Multiple Characteristics	Chen, K.S.; Pearn, W.L.; Lin, P.C.
國立勤益科技大學	2003	Distributional properties and implications of the estimated process incapability index	Lin, P.C. ; Pearn, W.L. ; Chen, K. S.
國立勤益科技大學	2002	Testing process performance based on the yield: an application to the liquid-crystal display module	Chen, Jann-Pygn ; Pearn, W.L.
國立勤益科技大學	2002	One-sided capability indices Cpu and Cpl: decision making with sample information	Pearn, W.L.; Chen, K.S.
國立勤益科技大學	2002	Testing process capability for one-sided specification limit with application to the voltage level translator	Lin, P.-C. ; Pearn, W.L.
國立勤益科技大學	2002	A Practical Implementation of the Incapability Index Cpp	Pearn, W.L. ; Chen, K.L. ; Chen, K.S.
國立勤益科技大學	2001	Testing process capability using the index Cpmk with an application	Pearn, W.L.; Yang, S.L.; Chen, K.S.; Lin, P.C.
國立勤益科技大學	2001	Estimating process capability index C”pmk asymmetric tolerances: distributional properties	Pearn, W.L.; Lin, P.C.; Chen, K.S.
國立勤益科技大學	2001	Testing process capability using the index Cpmk with an application	Pearn, W.L. ; Yang, S.-L. ; Chen, K.-S. ; Lin, P.-C.
國立勤益科技大學	2001	Estimating process capability index C”pmk for asymmetric tolerances: Distributional properties	Pearn, W.L. ; Lin, P.-C. ; Chen, K.-S.
國立勤益科技大學	2001	Capability indices for processes with asymmetric tolerances	Chen, K.S. ; Pearn, W.L.
國立勤益科技大學	1999	Making decisions in assessing process capability index Cpk	Pearn, W.L.; Chen, K.S.
國立勤益科技大學	1999	A generalization of Clements' method for non-normal Pearsonian processes with asymmetric tolerances	Pearn, W.L. ; Chen, K.S. ; Lin, G.H.
國立勤益科技大學	1999	A new generalization of Cpm for processes with asymmetric tolerances	Chen, K.-S.;Pearn, W.L.; Lin, P.-C.
國立勤益科技大學	1999	A new generalization of Cpm for processes with asymmetric tolerances	Chen, K.S. ; Pearn, W.L. ; Lin, P.C.
國立勤益科技大學	1998	Distributional and inferential properties of the process accuracy and process precision indices	Pearn, W.L. ; Lin, G.H. ; Chen, K.S.
國立勤益科技大學	1998	New generalization of the process capability index Cpk	Pearn, W.L. ; Chen, K.S.
國立勤益科技大學	1997	Capability indices for non-normal distributions with an application in electrolytic capacitor manufacturing	Pearn, W.L.; Chen, K.S.
國立勤益科技大學	1997	A practical implementation of the process capability index Cpk	Pearn, W.L.; Chen, K.S.
國立勤益科技大學	1997	An application of non-normal Process capability indices	Chen, K.S. ; Pearn, W.L.
國立勤益科技大學	1997	Multi-process performance analysis: a case study	Pearn, W.L. ; Chen, K.S.
國立勤益科技大學	1996	A Bayesian-like estimator of Cpk	Pearn, W.L. ; Chen, K.S.
國立勤益科技大學	1995	Estimating process capability indices for non-normal Pearsonian populations	Pearn, W.L. ; Chen, K.S.

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