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"pearn w l"
Showing items 141-150 of 182 (19 Page(s) Totally)
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| 國立臺灣科技大學 |
2006 |
Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of defectives
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Pearn, W. L. ; Wu, Chien-Wei |
| 元培科技大學 |
2006 |
Tool Replacement for Production with Low Fraction Defective,
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Pearn, W. L.; Hsu, Ya Chen ; Wu, Chien-Wei |
| 大葉大學 |
2005-06 |
A Bayesian Approach to Obtain a Lower Bound for the Cpm Capability Index
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Lin, G. H.;Pearn, W. L.;Yang, Y. S. |
| 國立高雄應用科技大學 |
2005 |
Monitoring manufacturing quality for multiple Li-BPIC processes based on capability index Cpmk
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PEARN, W. L.; SHU, M. H.; HSU, B. M.; 蘇明鴻 |
| 國立臺灣科技大學 |
2005 |
A Bayesian approach for assessing process precision based on multiple samples
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Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
Capability measure for asymmetric tolerances non-normal processes applied to speaker driver manufacturing
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Pearn, W. L. ; Wu, Chien-Wei; Wang, K. H. |
| 國立臺灣科技大學 |
2005 |
Measuring manufacturing capability for couplers and wavelength division multiplexers
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Wu, Chien-Wei; Pearn, W. L. |
| 國立臺灣科技大學 |
2005 |
Bootstrap approach for estimating process quality yield with application to light emitting diodes
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Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
Procedures for testing manufacturing precision Cp based on (Xbar, R) or (Xbar, S) control chart samples
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Pearn, W. L. ; Wu, Chien-Wei; Chuang, H. C. |
| 國立臺灣科技大學 |
2005 |
An effective modern approach for measuring high-tech product manufacturing process quality
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Pearn, W. L. ; Wu, Chien-Wei |
Showing items 141-150 of 182 (19 Page(s) Totally)
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