|
English
|
正體中文
|
简体中文
|
总笔数 :0
|
|
造访人次 :
51808030
在线人数 :
919
教育部委托研究计画 计画执行:国立台湾大学图书馆
|
|
|
"pearn w l"的相关文件
显示项目 141-150 / 182 (共19页)
<< < 10 11 12 13 14 15 16 17 18 19 > >>
每页显示[10|25|50]项目
| 國立臺灣科技大學 |
2006 |
Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of defectives
|
Pearn, W. L. ; Wu, Chien-Wei |
| 元培科技大學 |
2006 |
Tool Replacement for Production with Low Fraction Defective,
|
Pearn, W. L.; Hsu, Ya Chen ; Wu, Chien-Wei |
| 大葉大學 |
2005-06 |
A Bayesian Approach to Obtain a Lower Bound for the Cpm Capability Index
|
Lin, G. H.;Pearn, W. L.;Yang, Y. S. |
| 國立高雄應用科技大學 |
2005 |
Monitoring manufacturing quality for multiple Li-BPIC processes based on capability index Cpmk
|
PEARN, W. L.; SHU, M. H.; HSU, B. M.; 蘇明鴻 |
| 國立臺灣科技大學 |
2005 |
A Bayesian approach for assessing process precision based on multiple samples
|
Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
Capability measure for asymmetric tolerances non-normal processes applied to speaker driver manufacturing
|
Pearn, W. L. ; Wu, Chien-Wei; Wang, K. H. |
| 國立臺灣科技大學 |
2005 |
Measuring manufacturing capability for couplers and wavelength division multiplexers
|
Wu, Chien-Wei; Pearn, W. L. |
| 國立臺灣科技大學 |
2005 |
Bootstrap approach for estimating process quality yield with application to light emitting diodes
|
Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
Procedures for testing manufacturing precision Cp based on (Xbar, R) or (Xbar, S) control chart samples
|
Pearn, W. L. ; Wu, Chien-Wei; Chuang, H. C. |
| 國立臺灣科技大學 |
2005 |
An effective modern approach for measuring high-tech product manufacturing process quality
|
Pearn, W. L. ; Wu, Chien-Wei |
显示项目 141-150 / 182 (共19页)
<< < 10 11 12 13 14 15 16 17 18 19 > >>
每页显示[10|25|50]项目
|
