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Taiwan Academic Institutional Repository >
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"pearn wl"
Showing items 41-90 of 91 (2 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:39:20Z |
A case study on the multistage IC final testing scheduling problem with reentry
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Pearn, WL; Chung, SH; Chen, AY; Yang, MH |
| 國立交通大學 |
2014-12-08T15:39:16Z |
C-pm MPPAC for manufacturing quality control applied to precision voltage reference process
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Pearn, WL; Shu, MH; Hsu, BM |
| 國立交通大學 |
2014-12-08T15:39:09Z |
On the distributional properties of the estimated process accuracy index C-a
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Lin, GH; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:39:06Z |
Accuracy analysis of the estimated process treld based onS(pk)
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Pearn, WL; Chuang, CC |
| 國立交通大學 |
2014-12-08T15:39:04Z |
Optimal management of the N-policy M/E-k/1 queuing system with a removable service station: a sensitivity investigation
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Pearn, WL; Chang, YC |
| 國立交通大學 |
2014-12-08T15:38:57Z |
Lower confidence bounds for C-PU and C-PL based on multiple samples with application to production yield assurance
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Pearn, WL; Shu, MH; Hsu, BM |
| 國立交通大學 |
2014-12-08T15:38:52Z |
C-pm MPPAC for manufacturing quality control applied to the precision voltage reference process
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Pearn, WL; Shu, MH; Hsu, BM |
| 國立交通大學 |
2014-12-08T15:38:50Z |
Procedure for supplier selection based on C-pm applied to super twisted nematic liquid crystal display processes
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Pearn, WL; Wu, CW; Lin, HC |
| 國立交通大學 |
2014-12-08T15:37:25Z |
Distributional and inferential properties of the process loss indices
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Pearn, WL; Chang, YC; Wu, CW |
| 國立交通大學 |
2014-12-08T15:37:20Z |
Algorithms for the wafer probing scheduling problem with sequence-dependent set-up time and due date restrictions
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Pearn, WL; Chung, SH; Yang, MH; Chen, YH |
| 國立交通大學 |
2014-12-08T15:37:14Z |
Quality-yield measure for production processes with very low fraction defective
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Pearn, WL; Chang, YC; Wu, CW |
| 國立交通大學 |
2014-12-08T15:37:13Z |
Testing process performance based on capability index C-pk with critical values
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Pearn, WL; Lin, PC |
| 國立交通大學 |
2014-12-08T15:36:51Z |
Bootstrap approach for estimating process quality yield with application to light emitting diodes
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Pearn, WL; Chang, YC; Wu, CW |
| 國立交通大學 |
2014-12-08T15:36:51Z |
Procedures for testing manufacturing precision C(p)based on ((X)over-bar, R) or ((X)over-bar, S) control chart samples
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Pearn, WL; Wu, CW; Chuang, HC |
| 國立交通大學 |
2014-12-08T15:36:50Z |
Capability measure for asymmetric tolerance non-normal processes applied to speaker driver manufacturing
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Pearn, WL; Wu, CW; Wang, KH |
| 國立交通大學 |
2014-12-08T15:36:50Z |
Measuring manufacturing capability for couplers and wavelength division multiplexers
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Wu, CW; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:36:10Z |
Process capabitity assessment for index C-pk based on bayesian approach
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Pearn, WL; Wu, CW |
| 國立交通大學 |
2014-12-08T15:34:57Z |
Capability testing based on CPM with multiple samples
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Wu, CW; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:34:50Z |
A linear programming model for the control wafers downgrading problem
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Chung, SH; Pearn, WL; Kang, HY |
| 國立交通大學 |
2014-12-08T15:19:28Z |
Control wafers inventory management in the wafer fabrication photolithography area
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Chung, SH; Pearn, WL; Kang, HY |
| 國立交通大學 |
2014-12-08T15:19:20Z |
Analytic network process (ANP) approach for product mix planning in semiconductor fabricator
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Chung, SH; Lee, AHI; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:19:05Z |
Assessing process performance based on the incapability index C-pp
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Lin, PC; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:19:00Z |
Product mix optimization for semiconductor manufacturing based on AHP and ANP analysis
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Chung, SH; Lee, AHI; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:18:54Z |
Cost benefit analysis of series systems with warm standby components and general repair time
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Wang, KH; Liu, YC; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:18:52Z |
Monitoring manufacturing quality for multiple Li-BPIC processes based on capability index C-pmk
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Pearn, WL; Shu, MH; Hsu, BM |
| 國立交通大學 |
2014-12-08T15:18:52Z |
Maximum entropy analysis to the N policy M/G/1 queueing system with server breakdowns and general startup times
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Wang, KH; Wang, TY; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:18:33Z |
The integrated circuit packaging scheduling problem (ICPSP): A case study
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Pearn, WL; Chung, SH; Yang, MH; Chen, CY |
| 國立交通大學 |
2014-12-08T15:18:31Z |
A service level model for the control wafers safety inventory problem
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Chung, SH; Kang, HY; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:18:23Z |
A Bayesian approach for assessing process precision based on multiple samples
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Pearn, WL; Wu, CW |
| 國立交通大學 |
2014-12-08T15:18:20Z |
A Bayesian approach to obtain a lower bound for the C-pm capability index
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Lin, GH; Pearn, WL; Yang, YS |
| 國立交通大學 |
2014-12-08T15:18:12Z |
Approximate solutions for the Maximum Benefit Chinese Postman Problem
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Pearn, WL; Chiu, WC |
| 國立交通大學 |
2014-12-08T15:18:02Z |
Testing manufacturing performance based on capability index C-pm
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Lin, PC; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:17:59Z |
Testing process capability based on C-pm in the presence of random measurement errors
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Pearn, WL; Shu, MH; Hsu, BM |
| 國立交通大學 |
2014-12-08T15:17:40Z |
Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of detectives
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Pearn, WL; Wu, CW |
| 國立交通大學 |
2014-12-08T15:16:52Z |
Variables sampling plans with PPM fraction of defectives and process loss consideration
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Pearn, WL; Wu, CW |
| 國立交通大學 |
2014-12-08T15:16:22Z |
Tool replacement for production with a low fraction of defectives
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Pearn, WL; Hsu, YC; Wu, CW |
| 國立交通大學 |
2014-12-08T15:16:07Z |
Quality yield measure for processes with asymmetric tolerances
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Pearn, WL; Lin, PC; Chang, YC; Wu, CW |
| 國立交通大學 |
2014-12-08T15:15:53Z |
Production quality and yield assurance for processes with multiple independent characteristics
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Pearn, WL; Wu, CW |
| 國立交通大學 |
2014-12-08T15:04:46Z |
DISTRIBUTIONAL AND INFERENTIAL PROPERTIES OF PROCESS CAPABILITY INDEXES
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PEARN, WL; KOTZ, S; JOHNSON, NL |
| 國立交通大學 |
2014-12-08T15:04:40Z |
SOME PROCESS CAPABILITY INDEXES ARE MORE RELIABLE THAN ONE MIGHT THINK
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KOTZ, S; PEARN, WL; JOHNSON, NL |
| 國立交通大學 |
2014-12-08T15:03:54Z |
ALGORITHMS FOR THE WINDY POSTMAN PROBLEM
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PEARN, WL; LI, ML |
| 國立交通大學 |
2014-12-08T15:03:44Z |
SOLVABLE CASES OF THE K-PERSON CHINESE POSTMAN PROBLEM
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PEARN, WL |
| 國立交通大學 |
2014-12-08T15:03:25Z |
ALGORITHMS FOR THE CHINESE POSTMAN PROBLEM ON MIXED NETWORKS
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PEARN, WL; LIU, CM |
| 國立交通大學 |
2014-12-08T15:03:11Z |
ESTIMATING PROCESS CAPABILITY INDEXES FOR NONNORMAL PEARSONIAN POPULATIONS
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PEARN, WL; CHEN, KS |
| 國立交通大學 |
2014-12-08T15:03:09Z |
ALGORITHMS FOR THE RURAL POSTMAN PROBLEM
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PEARN, WL; WU, TC |
| 國立交通大學 |
2014-12-08T15:02:59Z |
A Bayesian-like estimator of C-pk
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Pearn, WL; Chen, KS |
| 國立交通大學 |
2014-12-08T15:02:09Z |
The performance of process capability index C-s on skewed distributions
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Pearn, WL; Chang, CS |
| 國立交通大學 |
2014-12-08T15:02:06Z |
The asymptotic distribution of the estimated process capability index (C)over-tilde(pk)
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Chen, SM; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:01:21Z |
An application of non-normal process capability indices
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Chen, KS; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:01:16Z |
Capability indices for non-normal distributions with an application in electrolytic capacitor manufacturing
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Pearn, WL; Chen, KS |
Showing items 41-90 of 91 (2 Page(s) Totally)
1 2 > >>
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