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机构 日期 题名 作者
國立交通大學 2014-12-08T15:39:20Z A case study on the multistage IC final testing scheduling problem with reentry Pearn, WL; Chung, SH; Chen, AY; Yang, MH
國立交通大學 2014-12-08T15:39:16Z C-pm MPPAC for manufacturing quality control applied to precision voltage reference process Pearn, WL; Shu, MH; Hsu, BM
國立交通大學 2014-12-08T15:39:09Z On the distributional properties of the estimated process accuracy index C-a Lin, GH; Pearn, WL
國立交通大學 2014-12-08T15:39:06Z Accuracy analysis of the estimated process treld based onS(pk) Pearn, WL; Chuang, CC
國立交通大學 2014-12-08T15:39:04Z Optimal management of the N-policy M/E-k/1 queuing system with a removable service station: a sensitivity investigation Pearn, WL; Chang, YC
國立交通大學 2014-12-08T15:38:57Z Lower confidence bounds for C-PU and C-PL based on multiple samples with application to production yield assurance Pearn, WL; Shu, MH; Hsu, BM
國立交通大學 2014-12-08T15:38:52Z C-pm MPPAC for manufacturing quality control applied to the precision voltage reference process Pearn, WL; Shu, MH; Hsu, BM
國立交通大學 2014-12-08T15:38:50Z Procedure for supplier selection based on C-pm applied to super twisted nematic liquid crystal display processes Pearn, WL; Wu, CW; Lin, HC
國立交通大學 2014-12-08T15:37:25Z Distributional and inferential properties of the process loss indices Pearn, WL; Chang, YC; Wu, CW
國立交通大學 2014-12-08T15:37:20Z Algorithms for the wafer probing scheduling problem with sequence-dependent set-up time and due date restrictions Pearn, WL; Chung, SH; Yang, MH; Chen, YH

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