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"pearn wl"
Showing items 46-55 of 91 (10 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:38:57Z |
Lower confidence bounds for C-PU and C-PL based on multiple samples with application to production yield assurance
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Pearn, WL; Shu, MH; Hsu, BM |
| 國立交通大學 |
2014-12-08T15:38:52Z |
C-pm MPPAC for manufacturing quality control applied to the precision voltage reference process
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Pearn, WL; Shu, MH; Hsu, BM |
| 國立交通大學 |
2014-12-08T15:38:50Z |
Procedure for supplier selection based on C-pm applied to super twisted nematic liquid crystal display processes
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Pearn, WL; Wu, CW; Lin, HC |
| 國立交通大學 |
2014-12-08T15:37:25Z |
Distributional and inferential properties of the process loss indices
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Pearn, WL; Chang, YC; Wu, CW |
| 國立交通大學 |
2014-12-08T15:37:20Z |
Algorithms for the wafer probing scheduling problem with sequence-dependent set-up time and due date restrictions
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Pearn, WL; Chung, SH; Yang, MH; Chen, YH |
| 國立交通大學 |
2014-12-08T15:37:14Z |
Quality-yield measure for production processes with very low fraction defective
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Pearn, WL; Chang, YC; Wu, CW |
| 國立交通大學 |
2014-12-08T15:37:13Z |
Testing process performance based on capability index C-pk with critical values
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Pearn, WL; Lin, PC |
| 國立交通大學 |
2014-12-08T15:36:51Z |
Bootstrap approach for estimating process quality yield with application to light emitting diodes
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Pearn, WL; Chang, YC; Wu, CW |
| 國立交通大學 |
2014-12-08T15:36:51Z |
Procedures for testing manufacturing precision C(p)based on ((X)over-bar, R) or ((X)over-bar, S) control chart samples
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Pearn, WL; Wu, CW; Chuang, HC |
| 國立交通大學 |
2014-12-08T15:36:50Z |
Capability measure for asymmetric tolerance non-normal processes applied to speaker driver manufacturing
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Pearn, WL; Wu, CW; Wang, KH |
Showing items 46-55 of 91 (10 Page(s) Totally)
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