國立交通大學 |
2014-12-08T15:38:57Z |
Lower confidence bounds for C-PU and C-PL based on multiple samples with application to production yield assurance
|
Pearn, WL; Shu, MH; Hsu, BM |
國立交通大學 |
2014-12-08T15:38:52Z |
C-pm MPPAC for manufacturing quality control applied to the precision voltage reference process
|
Pearn, WL; Shu, MH; Hsu, BM |
國立交通大學 |
2014-12-08T15:38:50Z |
Procedure for supplier selection based on C-pm applied to super twisted nematic liquid crystal display processes
|
Pearn, WL; Wu, CW; Lin, HC |
國立交通大學 |
2014-12-08T15:37:25Z |
Distributional and inferential properties of the process loss indices
|
Pearn, WL; Chang, YC; Wu, CW |
國立交通大學 |
2014-12-08T15:37:20Z |
Algorithms for the wafer probing scheduling problem with sequence-dependent set-up time and due date restrictions
|
Pearn, WL; Chung, SH; Yang, MH; Chen, YH |
國立交通大學 |
2014-12-08T15:37:14Z |
Quality-yield measure for production processes with very low fraction defective
|
Pearn, WL; Chang, YC; Wu, CW |
國立交通大學 |
2014-12-08T15:37:13Z |
Testing process performance based on capability index C-pk with critical values
|
Pearn, WL; Lin, PC |
國立交通大學 |
2014-12-08T15:36:51Z |
Bootstrap approach for estimating process quality yield with application to light emitting diodes
|
Pearn, WL; Chang, YC; Wu, CW |
國立交通大學 |
2014-12-08T15:36:51Z |
Procedures for testing manufacturing precision C(p)based on ((X)over-bar, R) or ((X)over-bar, S) control chart samples
|
Pearn, WL; Wu, CW; Chuang, HC |
國立交通大學 |
2014-12-08T15:36:50Z |
Capability measure for asymmetric tolerance non-normal processes applied to speaker driver manufacturing
|
Pearn, WL; Wu, CW; Wang, KH |
國立交通大學 |
2014-12-08T15:36:50Z |
Measuring manufacturing capability for couplers and wavelength division multiplexers
|
Wu, CW; Pearn, WL |
國立交通大學 |
2014-12-08T15:36:10Z |
Process capabitity assessment for index C-pk based on bayesian approach
|
Pearn, WL; Wu, CW |
國立交通大學 |
2014-12-08T15:34:57Z |
Capability testing based on CPM with multiple samples
|
Wu, CW; Pearn, WL |
國立交通大學 |
2014-12-08T15:34:50Z |
A linear programming model for the control wafers downgrading problem
|
Chung, SH; Pearn, WL; Kang, HY |
國立交通大學 |
2014-12-08T15:19:28Z |
Control wafers inventory management in the wafer fabrication photolithography area
|
Chung, SH; Pearn, WL; Kang, HY |
國立交通大學 |
2014-12-08T15:19:20Z |
Analytic network process (ANP) approach for product mix planning in semiconductor fabricator
|
Chung, SH; Lee, AHI; Pearn, WL |
國立交通大學 |
2014-12-08T15:19:05Z |
Assessing process performance based on the incapability index C-pp
|
Lin, PC; Pearn, WL |
國立交通大學 |
2014-12-08T15:19:00Z |
Product mix optimization for semiconductor manufacturing based on AHP and ANP analysis
|
Chung, SH; Lee, AHI; Pearn, WL |
國立交通大學 |
2014-12-08T15:18:54Z |
Cost benefit analysis of series systems with warm standby components and general repair time
|
Wang, KH; Liu, YC; Pearn, WL |
國立交通大學 |
2014-12-08T15:18:52Z |
Monitoring manufacturing quality for multiple Li-BPIC processes based on capability index C-pmk
|
Pearn, WL; Shu, MH; Hsu, BM |
國立交通大學 |
2014-12-08T15:18:52Z |
Maximum entropy analysis to the N policy M/G/1 queueing system with server breakdowns and general startup times
|
Wang, KH; Wang, TY; Pearn, WL |
國立交通大學 |
2014-12-08T15:18:33Z |
The integrated circuit packaging scheduling problem (ICPSP): A case study
|
Pearn, WL; Chung, SH; Yang, MH; Chen, CY |
國立交通大學 |
2014-12-08T15:18:31Z |
A service level model for the control wafers safety inventory problem
|
Chung, SH; Kang, HY; Pearn, WL |
國立交通大學 |
2014-12-08T15:18:23Z |
A Bayesian approach for assessing process precision based on multiple samples
|
Pearn, WL; Wu, CW |
國立交通大學 |
2014-12-08T15:18:20Z |
A Bayesian approach to obtain a lower bound for the C-pm capability index
|
Lin, GH; Pearn, WL; Yang, YS |