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教育部委托研究计画 计画执行:国立台湾大学图书馆
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"pearn wl"的相关文件
显示项目 11-20 / 91 (共10页)
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| 國立交通大學 |
2014-12-08T15:43:28Z |
Capability indices for processes with asymmetric tolerances
|
Chen, KS; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:43:00Z |
A case study on the wafer probing scheduling problem
|
Pearn, WL; Chung, SH; Yang, MH |
| 國立交通大學 |
2014-12-08T15:42:49Z |
Minimizing the total machine workload for the wafer probing scheduling problem
|
Pearn, WL; Chung, SH; Yang, MH |
| 國立交通大學 |
2014-12-08T15:42:45Z |
On the distribution of the estimated process yield index S-pk
|
Lee, JC; Hung, HN; Pearn, WL; Kueng, TL |
| 國立交通大學 |
2014-12-08T15:42:45Z |
Estimated incapability index: Reliability and decision making with sample information
|
Pearn, WL; Lin, GH |
| 國立交通大學 |
2014-12-08T15:42:16Z |
Computer program for calculating the p-value in testing process capability index C-pmk
|
Pearn, WL; Lin, PC |
| 國立交通大學 |
2014-12-08T15:42:13Z |
A multiprocess performance analysis chart based on the incapability index C-pp: an application to the chip resistors
|
Pearn, WL; Ko, CH; Wang, KH |
| 國立交通大學 |
2014-12-08T15:42:07Z |
Testing process performance based on the yield: an application to the liquid-crystal display module
|
Chen, JP; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:42:05Z |
The wafer probing scheduling problem (WPSP)
|
Pearn, WL; Chung, SH; Yang, MH |
| 國立交通大學 |
2014-12-08T15:41:44Z |
A note on the interval estimation of C-pk with asymmetric tolerances
|
Lin, GH; Pearn, WL |
显示项目 11-20 / 91 (共10页)
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