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"pearn wl"的相關文件
顯示項目 11-35 / 91 (共4頁)
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| 國立交通大學 |
2014-12-08T15:43:28Z |
Capability indices for processes with asymmetric tolerances
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Chen, KS; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:43:00Z |
A case study on the wafer probing scheduling problem
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Pearn, WL; Chung, SH; Yang, MH |
| 國立交通大學 |
2014-12-08T15:42:49Z |
Minimizing the total machine workload for the wafer probing scheduling problem
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Pearn, WL; Chung, SH; Yang, MH |
| 國立交通大學 |
2014-12-08T15:42:45Z |
On the distribution of the estimated process yield index S-pk
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Lee, JC; Hung, HN; Pearn, WL; Kueng, TL |
| 國立交通大學 |
2014-12-08T15:42:45Z |
Estimated incapability index: Reliability and decision making with sample information
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Pearn, WL; Lin, GH |
| 國立交通大學 |
2014-12-08T15:42:16Z |
Computer program for calculating the p-value in testing process capability index C-pmk
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Pearn, WL; Lin, PC |
| 國立交通大學 |
2014-12-08T15:42:13Z |
A multiprocess performance analysis chart based on the incapability index C-pp: an application to the chip resistors
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Pearn, WL; Ko, CH; Wang, KH |
| 國立交通大學 |
2014-12-08T15:42:07Z |
Testing process performance based on the yield: an application to the liquid-crystal display module
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Chen, JP; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:42:05Z |
The wafer probing scheduling problem (WPSP)
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Pearn, WL; Chung, SH; Yang, MH |
| 國立交通大學 |
2014-12-08T15:41:44Z |
A note on the interval estimation of C-pk with asymmetric tolerances
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Lin, GH; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:41:42Z |
A practical implementation of the incapability index C-pp
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Pearn, WL; Chen, KL; Chen, KS |
| 國立交通大學 |
2014-12-08T15:41:41Z |
Maximum entropy analysis to the N policy M/G/1 queueing system with a removable server
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Wang, KH; Chuang, SL; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:41:39Z |
Testing process capability for one-sided specification limit with application to the voltage level translator
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Lin, PC; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:41:27Z |
Job order releasing and throughput planning for multi-priority orders in wafer fabs
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Chung, SH; Pearn, WL; Lee, AHI; Ke, WT |
| 國立交通大學 |
2014-12-08T15:41:25Z |
A Bayesian-like estimator of the process capability index C-pmk
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Pearn, WL; Lin, GH |
| 國立交通大學 |
2014-12-08T15:41:16Z |
Capability measures for processes with multiple characteristics
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Chen, KS; Pearn, WL; Lin, PC |
| 國立交通大學 |
2014-12-08T15:41:15Z |
Capability measures for m-dependent stationary processes
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Chen, SM; Hsu, YS; Pearn, WL |
| 國立交通大學 |
2014-12-08T15:41:14Z |
An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators
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Pearn, WL; Shu, MH |
| 國立交通大學 |
2014-12-08T15:41:08Z |
A reliable procedure for testing linear regulators with one-sided specification limits based on multiple samples
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Pearn, WL; Lin, GH |
| 國立交通大學 |
2014-12-08T15:40:48Z |
Manufacturing capability control for multiple power-distribution switch processes based on modified C-pk MPPAC
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Pearn, WL; Shu, MH |
| 國立交通大學 |
2014-12-08T15:40:33Z |
An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators (vol 43, pg 495, 2003)
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Pearn, WL; Shu, MH |
| 國立交通大學 |
2014-12-08T15:40:32Z |
On the Maximum Benefit Chinese Postman Problem
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Pearn, WL; Wang, KH |
| 國立交通大學 |
2014-12-08T15:40:12Z |
Lower confidence bounds with sample size information for C-pm applied to production yield assurance
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Pearn, WL; Shu, MH |
| 國立交通大學 |
2014-12-08T15:40:08Z |
Distributional and inferential properties of the estimated precision C-p based on multiple samples
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Pearn, WL; Yang, YS |
| 國立交通大學 |
2014-12-08T15:40:07Z |
Cost benefit analysis of series systems with warm standby components
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Wang, KH; Pearn, WL |
顯示項目 11-35 / 91 (共4頁)
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