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Showing items 1-8 of 8 (1 Page(s) Totally)
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| 國立成功大學 |
2022 |
Accurate Estimation of Test Pattern Counts for a Wide-Range of EDT Input/Output Channel Configurations
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Zheng, S.-X.;Yeh, C.-Y.;Lee, K.-J.;Wang, C.;Cheng, W.-T.;Kassab, M.;Rajski, J.;Reddy, S.M. |
| 國立成功大學 |
2020 |
Generating Single-and Double-Pattern Tests for Multiple CMOS Fault Models in One ATPG Run
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Kung, Y.-C.;Lee, K.-J.;Reddy, S.M. |
| 國立成功大學 |
2020 |
Prediction of Test Pattern Count and Test Data Volume for Scan Architectures under Different Input Channel Configurations
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Tsai, F.-J.;Ye, C.-S.;Lee, K.-J.;Zheng, S.-X.;Huang, Y.;Cheng, W.-T.;Reddy, S.M.;Kassab, M.;Rajski, J.;Wang, C.;Zawada, J. |
| 國立成功大學 |
2020 |
Efficient Prognostication of Pattern Count with Different Input Compression Ratios
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Tsai, F.-J.;Ye, C.-S.;Huang, Y.;Lee, K.-J.;Cheng, W.-T.;Reddy, S.M.;Kassab, M.;Rajski, J. |
| 國立成功大學 |
2020 |
Estimation of Test Data Volume for Scan Architectures with Different Numbers of Input Channels
|
Tsai, F.-J.;Ye, C.-S.;Huang, Y.;Lee, K.-J.;Cheng, W.-T.;Reddy, S.M.;Kassab, M.;Rajski, J.;Zheng, S.-X. |
| 國立成功大學 |
2019 |
An Efficient Diagnosis-Aware ATPG Procedure to Enhance Diagnosis Resolution and Test Compaction
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Wu, C.-H.;Lee, K.-J.;Reddy, S.M. |
| 國立成功大學 |
2019 |
Generating Compact Test Patterns for DC and AC Faults Using One ATPG Run
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Kung, Y.-C.;Lee, K.-J.;Reddy, S.M. |
| 國立成功大學 |
2017 |
Test generation for open and delay faults in CMOS circuits
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Wu, C.-H.;Lee, K.-J.;Reddy, S.M. |
Showing items 1-8 of 8 (1 Page(s) Totally)
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