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Institution Date Title Author
臺大學術典藏 2022-04-15T03:14:25Z Epigenetic reprogramming and post-transcriptional regulation during the epithelial-mesenchymal transition Hsu W.-B.; Shih J.-L.; Shih J.R.; Du J.-L.; SHU-CHUN TENG; Huang L.-M.; Wang W.-B.
臺大學術典藏 2021-06-24T07:16:42Z Cellular protein HAX1 interacts with the influenza A virus PA polymerase subunit and impedes its nuclear translocation Hsu W.-B.; Shih J.-L.; Shih J.R.; Du J.-L.; Teng S.-C.; LI-MIN HUANG; Wang W.-B.
臺大學術典藏 2018-09-10T09:48:39Z Securing M2M with post-quantum public-key cryptography Shih, J.-R.; Hu, Y.; Hsiao, M.-C.; Chen, M.-S.; Shen, W.-C.; Yang, B.-Y.; Wu, A.-Y.; Cheng, C.-M.; CHEN-MOU CHENG; AN-YEU(ANDY) WU; Shih, J.-R.;Hu, Y.;Hsiao, M.-C.;Chen, M.-S.;Shen, W.-C.;Yang, B.-Y.;Wu, A.-Y.;Cheng, C.-M.
國立成功大學 2009-12 Mechanisms of Hot-Carrier-Induced Threshold-Voltage Shift in High-Voltage p-Type LDMOS Transistors Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Wu, Kuo-Ming; Shih, J. R.; Wu, Kenneth
國立成功大學 2009-11 Convergence of Hot-Carrier-Induced Saturation Region Drain Current and On-Resistance Degradation in Drain Extended MOS Transistors Chen, Jone F.; Chen, Shiang-Yu; Wu, Kuo-Ming; Shih, J. R.; Wu, Kenneth
國立成功大學 2009-09 An Investigation on Anomalous Hot-Carrier-Induced On-Resistance Reduction in n-Type LDMOS Transistors Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Wu, Kuo-Ming; Shih, J. R.; Wu, Kenneth
國立成功大學 2006-10-30 Effects of gate bias on hot-carrier reliability in drain extended metal-oxide-semiconductor transistors Wu, Kuo-Ming; Chen, Jone-Fang; Su, Yan-Kuin; Lee, J. R.; Lin, K. W.; Shih, J. R.; Hsu, S. L.
國立成功大學 2006-09 Anomalous reduction of hot-carrier-induced ON-resistance degradation in n-type DEMOS transistors Wu, Kuo-Ming; Chen, Jone-Fang; Su, Yan-Kuin; Lee, J. R.; Lin, Y. C.; Hsu, S. L.; Shih, J. R.

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