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"shih j r"的相关文件
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| 臺大學術典藏 |
2022-04-15T03:14:25Z |
Epigenetic reprogramming and post-transcriptional regulation during the epithelial-mesenchymal transition
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Hsu W.-B.; Shih J.-L.; Shih J.R.; Du J.-L.; SHU-CHUN TENG; Huang L.-M.; Wang W.-B. |
| 臺大學術典藏 |
2021-06-24T07:16:42Z |
Cellular protein HAX1 interacts with the influenza A virus PA polymerase subunit and impedes its nuclear translocation
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Hsu W.-B.; Shih J.-L.; Shih J.R.; Du J.-L.; Teng S.-C.; LI-MIN HUANG; Wang W.-B. |
| 臺大學術典藏 |
2018-09-10T09:48:39Z |
Securing M2M with post-quantum public-key cryptography
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Shih, J.-R.; Hu, Y.; Hsiao, M.-C.; Chen, M.-S.; Shen, W.-C.; Yang, B.-Y.; Wu, A.-Y.; Cheng, C.-M.; CHEN-MOU CHENG; AN-YEU(ANDY) WU; Shih, J.-R.;Hu, Y.;Hsiao, M.-C.;Chen, M.-S.;Shen, W.-C.;Yang, B.-Y.;Wu, A.-Y.;Cheng, C.-M. |
| 國立成功大學 |
2009-12 |
Mechanisms of Hot-Carrier-Induced Threshold-Voltage Shift in High-Voltage p-Type LDMOS Transistors
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Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Wu, Kuo-Ming; Shih, J. R.; Wu, Kenneth |
| 國立成功大學 |
2009-11 |
Convergence of Hot-Carrier-Induced Saturation Region Drain Current and On-Resistance Degradation in Drain Extended MOS Transistors
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Chen, Jone F.; Chen, Shiang-Yu; Wu, Kuo-Ming; Shih, J. R.; Wu, Kenneth |
| 國立成功大學 |
2009-09 |
An Investigation on Anomalous Hot-Carrier-Induced On-Resistance Reduction in n-Type LDMOS Transistors
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Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Wu, Kuo-Ming; Shih, J. R.; Wu, Kenneth |
| 國立成功大學 |
2006-10-30 |
Effects of gate bias on hot-carrier reliability in drain extended metal-oxide-semiconductor transistors
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Wu, Kuo-Ming; Chen, Jone-Fang; Su, Yan-Kuin; Lee, J. R.; Lin, K. W.; Shih, J. R.; Hsu, S. L. |
| 國立成功大學 |
2006-09 |
Anomalous reduction of hot-carrier-induced ON-resistance degradation in n-type DEMOS transistors
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Wu, Kuo-Ming; Chen, Jone-Fang; Su, Yan-Kuin; Lee, J. R.; Lin, Y. C.; Hsu, S. L.; Shih, J. R. |
显示项目 1-8 / 8 (共1页)
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