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Taiwan Academic Institutional Repository >
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"tai ya hsiang"
Showing items 151-175 of 203 (9 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:16:01Z |
Threshold-voltage-compensation methods for AMOLED pixel and analog buffer circuits
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Chen, Bo-Ting; Tai, Ya-Hsiang; Wei, Ying-Jyun; Tsai, Chun-Chien; Huang, Chun-Yao; Kuo, Yu-Ju; Cheng, Huang-Chung |
| 國立交通大學 |
2014-12-08T15:15:21Z |
Study on electrical degradation of p-type low-temperature polycrystalline silicon thin film transistors with C-V measurement analysis
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Huang, Shih-Che; Kao, Yu-Han; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:15:21Z |
Statistical study on the states in the low-temperature poly-silicon films with thin film transistors
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Huang, Shih-Che; Chou, Yen-Pang; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:15:20Z |
Analysis of poly-Si TFT degradation under gate pulse stress using the slicing model
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Tai, Ya-Hsiang; Huang, Shih-Che; Chen, Chien-Kwen |
| 國立交通大學 |
2014-12-08T15:15:06Z |
Degradation of the capacitance-voltage behaviors of the low-temperature polysilicon TFTs under DC stress
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Tai, Ya-Hsiang; Huang, Shih-Che; Lin, Chien Wen; Chiu, Hao Lin |
| 國立交通大學 |
2014-12-08T15:14:31Z |
Investigation of source-follower type analog buffer using low temperature poly-Si TFTs
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Chen, Bo-Ting; Tai, Ya-Hsiang; Wei, Ying-Jyun; Wei, Kai-Fang; Tsai, Chun-Chien; Huang, Chun-Yao; Kuo, Yu-Ju; Cheng, Huang-Chung |
| 國立交通大學 |
2014-12-08T15:13:37Z |
Statistical study on the temperature dependence of the turn-on characteristics for p-type LTPS TFTs
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Kuo, Yan-Fu; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:13:02Z |
A statistical model for simulating the effect of UPS TFT device variation for SOP applications
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Tai, Ya-Hsiang; Huang, Shih-Che; Chen, Wan-Ping; Chao, Yu-Te; Chou, Yen-Pang; Peng, Guo-Feng |
| 國立交通大學 |
2014-12-08T15:12:56Z |
Elimination of photoleakage current in poly-Si TFTs using a metal-shielding structure
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Lu, Hau-Yan; Chang, Ting-Chang; Liu, Po-Tsun; Li, Hung-Wei; Hu, Chin-Wei; Lin, Kun-Chih; Tai, Ya-Hsiang; Chi, Sien |
| 國立交通大學 |
2014-12-08T15:12:18Z |
Reduction of photoleakage current in polycrystalline silicon thin-film transistor using NH(3) plasma treatment on buffer layer
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Lu, Hau-Yan; Chang, Ting-Chang; Liu, Po-Tsun; Li, Hung-Wei; Hu, Chin-Wei; Lin, Kun-Chin; Wang, Chao-Chun; Tai, Ya-Hsiang; Chi, Sien |
| 國立交通大學 |
2014-12-08T15:12:16Z |
Variation and mismatch effects of the low-temperature poly-Si TFTs on the circuit for the X-ray active matrix sensor
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Tai, Ya-Hsiang; Huang, Shih-Che; Su, Ko-Ching; Tseng, Chen-Yeh |
| 國立交通大學 |
2014-12-08T15:12:05Z |
Capacitance-voltage behaviors of the LTPS TFTs before and after DC stress explained by the slicing model
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Kuo, Yan-Fu; Huang, Shih-Che; Chao, Yu-Te; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:12:04Z |
Highly reliable integrated amorphous silicon thin film transistors gate driver
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Liu, Chin-Wei; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:12:03Z |
Charge-Trapping-Induced Parasitic Capacitance and Resistance in SONOS TFTs Under Gate Bias Stress
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Li, Hung-Wei; Chen, Shih-Ching; Chuang, Ying-Shao; Chen, Te-Chih; Tai, Ya-Hsiang; Lee, Ming-Hsien; Chen, Jim-Shone |
| 國立交通大學 |
2014-12-08T15:12:02Z |
A low temperature polycrystalline silicon thin film transistor phase locked loop circuit used for clock regeneration
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Tai, Ya-Hsiang; Tseng, Chen-Yeh |
| 國立交通大學 |
2014-12-08T15:12:01Z |
Generalized Hot-Carrier Degradation and Its Mechanism in Poly-Si TFTs Under DC/AC Operations
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Tai, Ya-Hsiang; Huang, Shih-Che; Chen, Po-Ting; Lin, Chih-Jung |
| 國立交通大學 |
2014-12-08T15:11:58Z |
Dynamic stress effects on the reliability of poly-Si TFT
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Kuo, Yan-Fu; Huang, Shih-Che; Shih, Wei-Lun; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:11:54Z |
Anomalous on-current and subthreshold swing improvement in low-temperature polycrystalline-silicon thin-film transistors under Gate bias stress
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Li, Hung-Wei; Chen, Yi-Chuan; Chen, Te-Chih; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:11:53Z |
Estimation of the effect of channel shortening for P-type poly-Si TFTs under AC stress
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Huang, Shih-Che; Tsao, Hung-Chuan; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:11:44Z |
Environment-dependent thermal instability of sol-gel derived amorphous indium-gallium-zinc-oxide thin film transistors
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Chung, Wan-Fang; Chang, Ting-Chang; Li, Hung-Wei; Chen, Shih-Ching; Chen, Yu-Chun; Tseng, Tseung-Yuen; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:11:35Z |
Analysis of P-type poly-Si TFT degradation under dynamic gate voltage stress using the slicing model
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Huang, Shih-Che; Tsao, Hung-Chuan; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:11:09Z |
Characterization of poly-Si TFT variation using interdigitated method
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Huang, Shih-Che; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:11:07Z |
Novel gate-all-around poly-Si TFTs with multiple nanowire channels
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Liao, Ta-Chuan; Tu, Shih-Wei; Yu, Ming H.; Lin, Wei-Kai; Liu, Cheng-Chin; Chang, Kuo-Jui; Tai, Ya-Hsiang; Cheng, Huang-Chung |
| 國立交通大學 |
2014-12-08T15:11:06Z |
The Linear Combination Model for the Degradation of Amorphous Silicon Thin Film Transistors under Drain AC Stress
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Tai, Ya Hsiang; Tsai, Ming-Hsien; Huang, Shih-Che |
| 國立交通大學 |
2014-12-08T15:10:35Z |
Dependence of Photosensitive Effect on the Defects Created by DC Stress for LTPS TFTs
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Tai, Ya-Hsiang; Kuo, Yan-Fu; Lee, Yun-Hsiang |
Showing items 151-175 of 203 (9 Page(s) Totally)
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