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"tai ya hsiang"的相關文件
顯示項目 151-200 / 203 (共5頁)
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| 國立交通大學 |
2014-12-08T15:16:01Z |
Threshold-voltage-compensation methods for AMOLED pixel and analog buffer circuits
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Chen, Bo-Ting; Tai, Ya-Hsiang; Wei, Ying-Jyun; Tsai, Chun-Chien; Huang, Chun-Yao; Kuo, Yu-Ju; Cheng, Huang-Chung |
| 國立交通大學 |
2014-12-08T15:15:21Z |
Study on electrical degradation of p-type low-temperature polycrystalline silicon thin film transistors with C-V measurement analysis
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Huang, Shih-Che; Kao, Yu-Han; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:15:21Z |
Statistical study on the states in the low-temperature poly-silicon films with thin film transistors
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Huang, Shih-Che; Chou, Yen-Pang; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:15:20Z |
Analysis of poly-Si TFT degradation under gate pulse stress using the slicing model
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Tai, Ya-Hsiang; Huang, Shih-Che; Chen, Chien-Kwen |
| 國立交通大學 |
2014-12-08T15:15:06Z |
Degradation of the capacitance-voltage behaviors of the low-temperature polysilicon TFTs under DC stress
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Tai, Ya-Hsiang; Huang, Shih-Che; Lin, Chien Wen; Chiu, Hao Lin |
| 國立交通大學 |
2014-12-08T15:14:31Z |
Investigation of source-follower type analog buffer using low temperature poly-Si TFTs
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Chen, Bo-Ting; Tai, Ya-Hsiang; Wei, Ying-Jyun; Wei, Kai-Fang; Tsai, Chun-Chien; Huang, Chun-Yao; Kuo, Yu-Ju; Cheng, Huang-Chung |
| 國立交通大學 |
2014-12-08T15:13:37Z |
Statistical study on the temperature dependence of the turn-on characteristics for p-type LTPS TFTs
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Kuo, Yan-Fu; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:13:02Z |
A statistical model for simulating the effect of UPS TFT device variation for SOP applications
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Tai, Ya-Hsiang; Huang, Shih-Che; Chen, Wan-Ping; Chao, Yu-Te; Chou, Yen-Pang; Peng, Guo-Feng |
| 國立交通大學 |
2014-12-08T15:12:56Z |
Elimination of photoleakage current in poly-Si TFTs using a metal-shielding structure
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Lu, Hau-Yan; Chang, Ting-Chang; Liu, Po-Tsun; Li, Hung-Wei; Hu, Chin-Wei; Lin, Kun-Chih; Tai, Ya-Hsiang; Chi, Sien |
| 國立交通大學 |
2014-12-08T15:12:18Z |
Reduction of photoleakage current in polycrystalline silicon thin-film transistor using NH(3) plasma treatment on buffer layer
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Lu, Hau-Yan; Chang, Ting-Chang; Liu, Po-Tsun; Li, Hung-Wei; Hu, Chin-Wei; Lin, Kun-Chin; Wang, Chao-Chun; Tai, Ya-Hsiang; Chi, Sien |
| 國立交通大學 |
2014-12-08T15:12:16Z |
Variation and mismatch effects of the low-temperature poly-Si TFTs on the circuit for the X-ray active matrix sensor
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Tai, Ya-Hsiang; Huang, Shih-Che; Su, Ko-Ching; Tseng, Chen-Yeh |
| 國立交通大學 |
2014-12-08T15:12:05Z |
Capacitance-voltage behaviors of the LTPS TFTs before and after DC stress explained by the slicing model
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Kuo, Yan-Fu; Huang, Shih-Che; Chao, Yu-Te; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:12:04Z |
Highly reliable integrated amorphous silicon thin film transistors gate driver
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Liu, Chin-Wei; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:12:03Z |
Charge-Trapping-Induced Parasitic Capacitance and Resistance in SONOS TFTs Under Gate Bias Stress
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Li, Hung-Wei; Chen, Shih-Ching; Chuang, Ying-Shao; Chen, Te-Chih; Tai, Ya-Hsiang; Lee, Ming-Hsien; Chen, Jim-Shone |
| 國立交通大學 |
2014-12-08T15:12:02Z |
A low temperature polycrystalline silicon thin film transistor phase locked loop circuit used for clock regeneration
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Tai, Ya-Hsiang; Tseng, Chen-Yeh |
| 國立交通大學 |
2014-12-08T15:12:01Z |
Generalized Hot-Carrier Degradation and Its Mechanism in Poly-Si TFTs Under DC/AC Operations
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Tai, Ya-Hsiang; Huang, Shih-Che; Chen, Po-Ting; Lin, Chih-Jung |
| 國立交通大學 |
2014-12-08T15:11:58Z |
Dynamic stress effects on the reliability of poly-Si TFT
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Kuo, Yan-Fu; Huang, Shih-Che; Shih, Wei-Lun; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:11:54Z |
Anomalous on-current and subthreshold swing improvement in low-temperature polycrystalline-silicon thin-film transistors under Gate bias stress
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Li, Hung-Wei; Chen, Yi-Chuan; Chen, Te-Chih; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:11:53Z |
Estimation of the effect of channel shortening for P-type poly-Si TFTs under AC stress
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Huang, Shih-Che; Tsao, Hung-Chuan; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:11:44Z |
Environment-dependent thermal instability of sol-gel derived amorphous indium-gallium-zinc-oxide thin film transistors
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Chung, Wan-Fang; Chang, Ting-Chang; Li, Hung-Wei; Chen, Shih-Ching; Chen, Yu-Chun; Tseng, Tseung-Yuen; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:11:35Z |
Analysis of P-type poly-Si TFT degradation under dynamic gate voltage stress using the slicing model
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Huang, Shih-Che; Tsao, Hung-Chuan; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:11:09Z |
Characterization of poly-Si TFT variation using interdigitated method
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Huang, Shih-Che; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:11:07Z |
Novel gate-all-around poly-Si TFTs with multiple nanowire channels
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Liao, Ta-Chuan; Tu, Shih-Wei; Yu, Ming H.; Lin, Wei-Kai; Liu, Cheng-Chin; Chang, Kuo-Jui; Tai, Ya-Hsiang; Cheng, Huang-Chung |
| 國立交通大學 |
2014-12-08T15:11:06Z |
The Linear Combination Model for the Degradation of Amorphous Silicon Thin Film Transistors under Drain AC Stress
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Tai, Ya Hsiang; Tsai, Ming-Hsien; Huang, Shih-Che |
| 國立交通大學 |
2014-12-08T15:10:35Z |
Dependence of Photosensitive Effect on the Defects Created by DC Stress for LTPS TFTs
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Tai, Ya-Hsiang; Kuo, Yan-Fu; Lee, Yun-Hsiang |
| 國立交通大學 |
2014-12-08T15:10:25Z |
Photosensitivity Analysis of Low-Temperature Poly-Si Thin-Film Transistor Based on the Unit-Lux-Current
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Tai, Ya-Hsiang; Kuo, Yan-Fu; Lee, Yun-Hsiang |
| 國立交通大學 |
2014-12-08T15:09:52Z |
Degradation Mechanism of Poly-Si TFTs Dynamically Operated in OFF Region
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Tai, Ya-Hsiang; Huang, Shih-Che; Chen, Po-Ting |
| 國立交通大學 |
2014-12-08T15:07:52Z |
Degradation of Low Temperature Polycrystalline Silicon Thin Film Transistors under Negative Bias Temperature Instability Stress with Illumination Effect
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Li, Hung-Wei; Hsu, Wei-Che; Chen, Shih-Ching; Tai, Ya-Hsiang; Jian, Fu-Yen; Chen, Te-Chih; Tu, Kuan-Jen; Wu, Hsing-Hua; Chen, Yi-Chan |
| 國立交通大學 |
2014-12-08T15:07:50Z |
Analysis of Anomalous Capacitance Induced by TAGIDL in p-Channel LTPS TFTs
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Li, Hung-Wei; Chen, Shih-Ching; Jian, Fu-Yen; Chuang, Ying-Shao; Chen, Te-Chih; Chen, Yu-Chun; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:07:21Z |
Characterization of the Channel-Shortening Effect on P-Type Poly-Si TFTs
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Tai, Ya-Hsiang; Huang, Shih-Che; Chen, Po-Ting |
| 國立交通大學 |
2014-12-08T15:06:57Z |
An Empirical Defect-Related Photo Leakage Current Model for LTPS TFTs Based on the Unit Lux Current
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Tai, Ya-Hsiang; Kuo, Yan-Fu; Sun, Guo-Pei |
| 國立交通大學 |
2014-12-08T15:06:41Z |
Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress
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Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Chen, Shih-Ching; Lu, Jin; Chung, Wan-Fang; Tai, Ya-Hsiang; Tseng, Tseung-Yuen |
| 國立交通大學 |
2014-12-08T15:05:29Z |
Formation and nonvolatile memory characteristics of W nanocrystals by in-situ steam generation oxidation
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Chen, Shih-Cheng; Chang, Ting-Chang; Hsieh, Chieh-Ming; Li, Hung-Wei; Sze, S. M.; Nien, Wen-Ping; Chan, Chia-Wei; Yeh (Huang), Fon-Shan; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:04:22Z |
Characterization of device degradation of poly-Si TFTs under dynamic operation with drain biased
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Tai, Ya-Hsiang; Huang, Shih-Che; Chan, Chang-Lung |
| 國立成功大學 |
2014-10-21 |
Influence of an anomalous dimension effect on thermal instability in amorphous-InGaZnO thin-film transistors
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Liu, Kuan-Hsien; Chang, Ting-Chang; Chou, Wu-Ching; Chen, Hua-Mao; Tsai, Ming-Yen; Wu, Ming-Siou; Hung, Yi-Syuan; Hung, Pei-Hua; Hsieh, Tien-Yu; Tai, Ya-Hsiang; Chu, Ann-Kuo; Yeh, Bo-Liang |
| 國立成功大學 |
2014-09 |
Ultrahigh Sensitivity Self-Amplification Phototransistor Achieved by Automatic Energy Band Lowering Behavior
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Chen, Hua-Mao; Chang, Ting-Chang; Tai, Ya-Hsiang; Chen, Yu-Chun; Yang, Man-Chun; Chou, Cheng-Hsu; Chang, Jung-Fang; Deng, Shao-Zhi |
| 國立成功大學 |
2014-06 |
On the Origin of Anomalous OffCurrent Under Hot Carrier Stress in p-Channel DDDMOS Transistors With STI Structure
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Chen, Ching-En; Chang, Ting-Chang; Chen, Hua-Mao; You, Bo; Yang, Kai-Hsiang; Ho, Szu-Han; Tsai, Jyun-Yu; Liu, Kuan-Ju; Lu, Ying-Hsin; Hung, Yu-Ju; Tai, Ya-Hsiang; Tseng, Tseung-Yuen |
| 國立成功大學 |
2014-06 |
Temperature-Dependent Instability of Bias Stress in InGaZnO Thin-Film Transistors
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Chang, Geng-Wei; Chang, Ting-Chang; Jhu, Jhe-Ciou; Tsai, Tsung-Ming; Chang, Kuan-Chang; Syu, Yong-En; Tai, Ya-Hsiang; Jian, Fu-Yen; Hung, Ya-Chi |
| 國立成功大學 |
2014-01 |
Improvement mechanism of resistance random access memory with supercritical CO2 fluid treatment
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Chang, Kuan-Chang; Chen, Jung-Hui; Tsai, Tsung-Ming; Chang, Ting-Chang; Huang, Syuan-Yong; Zhang, Rui; Chen, Kai-Huang; Syu, Yong-En; Chang, Geng-Wei; Chu, Tian-Jian; Liu, Guan-Ru; Su, Yu-Ting; Chen, Min-Chen; Pan, Jhih-Hong; Liao, Kuo-Hsiao; Tai, Ya-Hsiang; Young, Tai-Fa; Sze, Simon M.; Ai, Chi-Fong; Wang, Min-Chuan; Huang, Jen-Wei |
| 國立成功大學 |
2013-09-28 |
Abnormal threshold voltage shift under hot carrier stress in Ti1-xNx/HfO2 p-channel metal-oxide-semiconductor field-effect transistors
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Tsai, Jyun-Yu;Chang, Ting-Chang;Lo, Wen-Hung;Ho, Szu-Han;Chen, Ching-En;Chen, Hua-Mao;Tseng, Tseung-Yuen;Tai, Ya-Hsiang;Cheng, Osbert;Huang, Cheng-Tung |
| 國立成功大學 |
2013-07-08 |
Abnormal sub-threshold swing degradation under dynamic hot carrier stress in HfO2/TiN n-channel metal-oxide-semiconductor field-effect-transistors
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Tsai, Jyun-Yu; Chang, Ting-Chang; Lo, Wen-Hung; Chen, Ching-En; Ho, Szu-Han; Chen, Hua-Mao; Tai, Ya-Hsiang; Cheng, Osbert; Huang, Cheng-Tung |
| 國立成功大學 |
2013-05 |
Origin of Hopping Conduction in Graphene-Oxide-Doped Silicon Oxide Resistance Random Access Memory Devices
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Chang, Kuan-Chang; Zhang, Rui; Chang, Ting-Chang; Tsai, Tsung-Ming; Lou, J. C.; Chen, Jung-Hui; Young, Tai-Fa; Chen, Min-Chen; Yang, Ya-Liang; Pan, Yin-Chih; Chang, Geng-Wei; Chu, Tian-Jian; Shih, Chih-Cheng; Chen, Jian-Yu; Pan, Chih-Hung; Su, Yu-Ting; Syu, Yong-En; Tai, Ya-Hsiang; Sze, Simon M. |
| 國立成功大學 |
2013-04 |
Low Temperature Improvement Method on Zn:SiOx Resistive Random Access Memory Devices
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Chang, Kuan-Chang; Tsai, Tsung-Ming; Chang, Ting-Chang; Wu, Hsing-Hua; Chen, Kai-Huang; Chen, Jung-Hui; Young, Tai-Fa; Chu, Tian-Jian; Chen, Jian-Yu; Pan, Chih-Hung; Su, Yu-Ting; Syu, Yong-En; Tung, Cheng-Wei; Chang, Geng-Wei; Chen, Min-Chen; Huang, Hui-Chun; Tai, Ya-Hsiang; Gan, Der-Shin; Wu, Jia-Jie; Hu, Ying; Sze, Simon M. |
| 國立成功大學 |
2013-04 |
Charge Quantity Influence on Resistance Switching Characteristic During Forming Process
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Chu, Tian-Jian; Chang, Ting-Chang; Tsai, Tsung-Ming; Wu, Hsing-Hua; Chen, Jung-Hui; Chang, Kuan-Chang; Young, Tai-Fa; Chen, Kai-Hsang; Syu, Yong-En; Chang, Geng-Wei; Chang, Yao-Feng; Chen, Min-Chen; Lou, Jyun-Hao; Pan, Jhih-Hong; Chen, Jian-Yu; Tai, Ya-Hsiang; Ye, Cong; Wang, Hao; Sze, Simon M. |
| 國立成功大學 |
2013-03 |
Characteristics and Mechanisms of Silicon-Oxide-Based Resistance Random Access Memory
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Chang, Kuan-Chang; Tsai, Tsung-Ming; Chang, Ting-Chang; Wu, Hsing-Hua; Chen, Jung-Hui; Syu, Yong-En; Chang, Geng-Wei; Chu, Tian-Jian; Liu, Guan-Ru; Su, Yu-Ting; Chen, Min-Chen; Pan, Jhih-Hong; Chen, Jian-Yu; Tung, Cheng-Wei; Huang, Hui-Chun; Tai, Ya-Hsiang; Gan, Der-Shin; Sze, Simon M. |
| 國立成功大學 |
2013-02-18 |
Hole injection-reduced hot carrier degradation in n-channel metal-oxide-semiconductor field-effect-transistors with high-k gate dielectric
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Tsai, Jyun-Yu; Chang, Ting-Chang; Lo, Wen-Hung; Chen, Ching-En; Ho, Szu-Han; Chen, Hua-Mao; Tai, Ya-Hsiang; Cheng, Osbert; Huang, Cheng-Tung |
| 國立成功大學 |
2013 |
Investigation of Lateral Trap Position by Random Telegraph Signal Analysis in Moderate Inversion in n-Channel MOSFETs
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Chen, Ching-En; Chang, Ting-Chang; You, Bo; Lo, Wen-Hung; Ho, Szu-Han; Dai, Chih-Hao; Tsai, Jyun-Yu; Chen, Hua-Mao; Liu, Guan-Ru; Tai, Ya-Hsiang; Tseng, Tseung-Yuen |
| 國立成功大學 |
2012-12 |
Origin of Hopping Conduction in Sn-Doped Silicon Oxide RRAM With Supercritical CO2 Fluid Treatment
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Tsai, Tsung-Ming; Chang, Kuan-Chang; Chang, Ting-Chang; Chang, Geng-Wei; Syu, Yong-En; Su, Yu-Ting; Liu, Guan-Ru; Liao, Kuo-Hsiao; Chen, Min-Chen; Huang, Hui-Chun; Tai, Ya-Hsiang; Gan, Der-Shin; Ye, Cong; Wang, Hao; Sze, Simon M. |
| 國立成功大學 |
2012-12 |
Bipolar Resistive RAM Characteristics Induced by Nickel Incorporated Into Silicon Oxide Dielectrics for IC Applications
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Tsai, Tsung-Ming; Chang, Kuan-Chang; Chang, Ting-Chang; Syu, Yong-En; Chuang, Siang-Lan; Chang, Geng-Wei; Liu, Guan-Ru; Chen, Min-Chen; Huang, Hui-Chun; Liu, Shih-Kun; Tai, Ya-Hsiang; Gan, Der-Shin; Yang, Ya-Liang; Young, Tai-Fa; Tseng, Bae-Heng; Chen, Kai-Huang; Tsai, Ming-Jinn; Ye, Cong; Wang, Hao; Sze, Simon M. |
| 國立成功大學 |
2012-11-26 |
The suppressed negative bias illumination-induced instability in In-Ga-Zn-O thin film transistors with fringe field structure
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Chen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Hsieh, Tien-Yu; Chen, Te-Chih; Wu, Chang-Pei; Chou, Cheng-Hsu; Chung, Wang-Cheng; Chang, Jung-Fang; Tai, Ya-Hsiang |
顯示項目 151-200 / 203 (共5頁)
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