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Showing items 1-5 of 5 (1 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:06:16Z |
CURRENT MULTIPLICATION IN MIS STRUCTURES
|
CHEIN, WJ; CHUNG, LL; TAN, FL |
| 國立交通大學 |
2014-12-08T15:06:04Z |
SPECIFIC CONTACT RESISTIVITY MEASUREMENT BY A VERTICAL KELVIN TEST STRUCTURE
|
TAN, FL; LEU, LY; CHUNG, LL |
| 國立交通大學 |
2014-12-08T15:06:03Z |
A POLYSILICON-ON-OXIDE (POSOX) ISOLATION STRUCTURE FOR BIPOLAR INTEGRATED-CIRCUITS
|
LEE, CL; TAN, FL; WU, NW; TANG, RB |
| 國立交通大學 |
2014-12-08T15:05:44Z |
CONTACT RESISTIVITIES OF AL AND TI ON SI MEASURED BY A SELF-ALIGNED VERTICAL KELVIN TEST RESISTOR STRUCTURE
|
WEN, LY; TAN, FL; CHUNG, LL |
| 國立交通大學 |
2014-12-08T15:04:37Z |
ELLIPSOMETRY STUDY ON REFRACTIVE-INDEX PROFILES OF THE SIO2/SI3N4/SIO2/SI STRUCTURE
|
TIEN, SC; CHUNG, LL; TAN, FL |
Showing items 1-5 of 5 (1 Page(s) Totally)
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