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| 國立成功大學 |
2009-05-08 |
高頻自動量測系統之建立及其應用在深次微米元件高頻特性之研究
|
湯懋泉; Tang, Mao-Chyuan |
| 國立成功大學 |
2009-05-08 |
高頻自動量測系統之建立及其應用在深次微米元件高頻特性之研究
|
湯懋泉; Tang, Mao-chyuan |
| 國立成功大學 |
2009-04 |
Hot-Carrier and Fowler-Nordheim (FN) Tunneling Stresses on RF Reliability of 40-nm PMOSFETs With and Without SiGe Source/Drain
|
Tang, Mao-Chyuan; Fang, Yean-Kuen; Chen, David C.; Yeh, Chune-Sin |
| 國立成功大學 |
2008-11-21 |
Effect of hot carrier stress on RF reliability of 40 nm PMOSFETs with and without SiGe source/drain
|
Tang, Mao-Chyuan; Fang, Yean-Kuen; Wei, Sun-Chin; Chen, David C.; Yeh, Chune-Sin; Huang-Lu, Shiang |
| 國立成功大學 |
2008-06 |
Investigation and modeling of hot carrier effects on performance of 45-and 55-nm NMOSFETs with RF automatic measurement
|
Tang, Mao-Chyuan; Fang, Yean-Kuen; Liao, Wen-Shiang; Chen, David C.; Yeh, Chune-Sin; Chien, Shan-Chieh |
| 國立臺灣大學 |
2008 |
PMOS Hole Mobility Enhancement Through SiGe Conductive Channel and Highly Compressive ILD- SiNx Stressing Layer
|
Liao, Wen-Shiang; Liaw, Yue-Gie; Tang, Mao-Chyuan; Chen, Kun-Ming; Huang, Sheng-Yi; Peng, C.-Y.; Liu, Chee Wee |
| 臺大學術典藏 |
2008 |
PMOS Hole Mobility Enhancement Through SiGe Conductive Channel and Highly Compressive ILD- SiNx Stressing Layer
|
Liao, Wen-Shiang; Liaw, Yue-Gie; Tang, Mao-Chyuan; Chen, Kun-Ming; Huang, Sheng-Yi; Peng, C.-Y.; Liu, Chee Wee; Liao, Wen-Shiang; Liaw, Yue-Gie; Tang, Mao-Chyuan; Chen, Kun-Ming; Huang, Sheng-Yi; Peng, C.-Y.; Liu, Chee Wee |
| 國立成功大學 |
2006-04 |
Systematic analysis and modeling of on-chip spiral inductors for complementary metal oxide semiconductor radio frequency integrated circuits applications
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Tang, Mao-Chyuan; Fang, Yean-Kuen; Yeh, Wen-Kuan; Chen, S. H.; Yeh, Ta-Hsun |
Showing items 1-8 of 8 (1 Page(s) Totally)
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