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Showing items 181-185 of 185  (19 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-08T15:07:02Z Continuously Improving Methods for Increasing the Running Efficiency of Equipment in 300-mm Semiconductor Fabrication Wang, Yu-Chih; Tong, Lee-Ing
元培科技大學 2005-12 Integrating SPC and EPC for multivariate Autocorrelated Process Tong, Lee-Ing;Yang, Chien-Hui;Huang, Cheng-Yi ; Shou, Cheng-Chi
元培科技大學 2004-12 Constructing Control Process for Wafer Defects Using Data Mining Technique Tong, Lee-Ing;Lee, Hsing-Yin; Huang, Chi-Feng; Lin, Chang-Ke;Yang, Chien-Hui
元培科技大學 2003-12 Process Chart for Controlling Wafer Defects using Fuzzy Theory Tong, Lee-Ing;Yang, Chien-Hui;Chen, Min-Hsiang; Yu, Hsiang-Pai; Wang, Min-Chia
國立勤益科技大學 2002 Statistical testing for assessing the performance of lifetime index of electronic components with exponential distribution Tong, Lee-Ing ; Chen, K.S.; Chen, H.T.

Showing items 181-185 of 185  (19 Page(s) Totally)
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