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"tong lee ing"的相关文件
显示项目 181-185 / 185 (共8页)
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| 國立交通大學 |
2014-12-08T15:07:02Z |
Continuously Improving Methods for Increasing the Running Efficiency of Equipment in 300-mm Semiconductor Fabrication
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Wang, Yu-Chih; Tong, Lee-Ing |
| 元培科技大學 |
2005-12 |
Integrating SPC and EPC for multivariate Autocorrelated Process
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Tong, Lee-Ing;Yang, Chien-Hui;Huang, Cheng-Yi ; Shou, Cheng-Chi |
| 元培科技大學 |
2004-12 |
Constructing Control Process for Wafer Defects Using Data Mining Technique
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Tong, Lee-Ing;Lee, Hsing-Yin; Huang, Chi-Feng; Lin, Chang-Ke;Yang, Chien-Hui |
| 元培科技大學 |
2003-12 |
Process Chart for Controlling Wafer Defects using Fuzzy Theory
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Tong, Lee-Ing;Yang, Chien-Hui;Chen, Min-Hsiang; Yu, Hsiang-Pai; Wang, Min-Chia |
| 國立勤益科技大學 |
2002 |
Statistical testing for assessing the performance of lifetime index of electronic components with exponential distribution
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Tong, Lee-Ing ; Chen, K.S.; Chen, H.T. |
显示项目 181-185 / 185 (共8页)
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