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"tsai chia ku"
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| 國立交通大學 |
2014-12-08T15:28:41Z |
Failure Analysis on Gate-Driven ESD Clamp Circuit after TLP Stresses of Different Voltage Steps in a 16-V CMOS Process
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Dai, Chia-Tsen; Chiu, Po-Yen; Ker, Ming-Dou; Tsai, Fu-Yi; Peng, Yan-Hua; Tsai, Chia-Ku |
| 國立交通大學 |
2014-12-08T15:09:48Z |
Board-Level ESD of Driver ICs on LCD Panel
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Tseng, Jen-Chou; Hsu, Chung-Ti; Tsai, Chia-Ku; Chen, Shu-Chuan; Ker, Ming-Dou |
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