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Showing items 1-11 of 11 (1 Page(s) Totally)
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| 國立交通大學 |
2017-04-21T06:48:45Z |
ESD Protection Design for Wideband RF Applications in 65-nm CMOS Process
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Chu, Li-Wei; Lin, Chun-Yu; Ker, Ming-Dou; Song, Ming-Hsiang; Tseng, Jen-Chou; Jou, Chewn-Pu; Tsai, Ming-Hsien |
| 國立交通大學 |
2017-04-21T06:48:42Z |
Improving ESD Robustness of Stacked Diodes with Embedded SCR for RF Applications in 65-nm CMOS
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Lin, Chun-Yu; Fan, Mei-Lian; Ker, Ming-Dou; Chu, Li-Wei; Tseng, Jen-Chou; Song, Ming-Hsiang |
| 國立交通大學 |
2015-07-21T08:31:29Z |
ESD Protection Design for Radio-Frequency Integrated Circuits in Nanoscale CMOS Technology
|
Lin, Chun-Yu; Chu, Li-Wei; Tsai, Shiang-Yu; Ker, Ming-Dou; Song, Ming-Hsiang; Jou, Chewn-Pu; Lu, Tse-Hua; Tseng, Jen-Chou; Tsai, Ming-Hsien; Hsu, Tsun-Lai; Hung, Ping-Fang; Wei, Yu-Lin; Chang, Tzu-Heng |
| 國立交通大學 |
2014-12-08T15:30:06Z |
Compact and Low-Loss ESD Protection Design for V-Band RF Applications in a 65-nm CMOS Technology
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Chu, Li-Wei; Lin, Chun-Yu; Tsai, Shiang-Yu; Ker, Ming-Dou; Song, Ming-Hsiang; Jou, Chewn-Pu; Lu, Tse-Hua; Tseng, Jen-Chou; Tsai, Ming-Hsien; Hsu, Tsun-Lai; Hung, Ping-Fang; Chang, Tzu-Heng |
| 國立交通大學 |
2014-12-08T15:28:40Z |
Design of ESD Protection Cell for Dual-Band RF Applications in a 65-nm CMOS Process
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Chu, Li-Wei; Lin, Chun-Yu; Tsai, Shiang-Yu; Ker, Ming-Dou; Song, Ming-Hsiang; Jou, Chewn-Pu; Lu, Tse-Hua; Tseng, Jen-Chou; Tsai, Ming-Hsien; Hsu, Tsun-Lai; Hung, Ping-Fang; Chang, Tzu-Heng; Wei, Yu-Lin |
| 國立交通大學 |
2014-12-08T15:28:05Z |
ESD Protection Structure with Inductor-Triggered SCR for RF Applications in 65-nm CMOS Process
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Lin, Chun-Yu; Chu, Li-Wei; Ker, Ming-Dou; Song, Ming-Hsiang; Jou, Chewn-Pu; Lu, Tse-Hua; Tseng, Jen-Chou; Tsai, Ming-Hsien; Hsu, Tsun-Lai; Hung, Ping-Fang; Chang, Tzu-Heng |
| 國立交通大學 |
2014-12-08T15:09:48Z |
Board-Level ESD of Driver ICs on LCD Panel
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Tseng, Jen-Chou; Hsu, Chung-Ti; Tsai, Chia-Ku; Chen, Shu-Chuan; Ker, Ming-Dou |
| 國立臺灣大學 |
2008 |
Lateral Nonuniformity Effects of Border Traps on the Characteristics of Metal–Oxide–Semiconductor Field-Effect Transistors Subjected to High-Field Stresses
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Tseng, Jen-Chou; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2007 |
靜電放電產生之高電場電流脈衝對金氧半元件之效應
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曾仁洲; Tseng, Jen-Chou |
| 國立臺灣大學 |
2007 |
Effects of electrostatic discharge high-field current impulse on oxide breakdown
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Tseng, Jen-Chou; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2007 |
Oxide-trapped charges induced by electrostatic discharge impulse stress
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Tseng, Jen-Chou; Hwu, Jenn-Gwo |
Showing items 1-11 of 11 (1 Page(s) Totally)
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