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| 臺大學術典藏 |
2018-09-10T04:49:47Z |
Dynamic analog testing via ATE digital test channels
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Su, CC; Chang, CS; Huang, HW; Tu, DS; Lee, C-L; Lin, Jerry CH; Su, CC; Chang, CS; Huang, HW; Tu, DS; Lee, C-L; Lin, Jerry CH; CHIA-LIN LEE |
| 國立交通大學 |
2014-12-08T15:25:45Z |
Dynamic analog testing via ATE digital test channels
|
Su, CC; Chang, CS; Huang, HW; Tu, DS; Lee, CL; Lin, JCH |
Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
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