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Institution Date Title Author
臺大學術典藏 2018-09-10T09:18:21Z Charge transporting enhancement of NiO photocathodes for p-type dye-sensitized solar cells Hsu, C.-Y.; Chen, W.-T.; Chen, Y.-C.; Wei, H.-Y.; Yen, Y.-S.; Huang, K.-C.; Ho, K.-C.; Chu, C.-W.; Lin, J.T.; KUO-CHUAN HO
國立交通大學 2014-12-08T15:47:59Z Charge Trapping and Detrapping Behavior of Fluorinated HfO(2)/SiON Gate Stacked nMOSFET Chen, Yung-Yu; Hsieh, Chih-Ren
國立交通大學 2019-04-02T06:00:27Z Charge Trapping and Detrapping Behavior of Fluorinated HfO2/SiON Gate Stacked nMOSFET Chen, Yung-Yu; Hsieh, Chih-Ren
國立成功大學 2020-07-28 Charge Trapping Augmented Switchable Sub-band-gap Photoresponse of Zinc-Tin Oxide Thin-Film Transistor Hsiao;Yang-Hsuan;Leung;Tak-Pui;Li;Jeng-Ting;Shih;Li-Chung;Chen;Jen-Sue
國立成功大學 2009-03 Charge trapping behavior of SiO2-Anodic Al2O3-SiO2 gate dielectrics for nonvolatile memory applications Huang, Chun-Hsien; Li, En-Jui; Chang, Wai-Jyh; Wang, Na-Fu; Hung, Chen-I; Houng, Mau-Phon
國立臺灣大學 2007 Charge trapping characteristics of atomic-layer-deposited HfO2 films with Al2O3 as a blocking oxide for high-density non-volatile memory device applications Maikap, S.; Lee, H.Y.; Wang, T.Y.; Tzeng, P.J.; Wang, C.C.; Lee, L.S.; Liu, K.C.; Yang, J.R.; Tsai, M.J.
國立交通大學 2014-12-08T15:22:43Z Charge trapping induced drain-induced-barrier-lowering in HfO2/TiN p-channel metal-oxide-semiconductor-field-effect-transistors under hot carrier stress Lo, Wen-Hung; Chang, Ting-Chang; Tsai, Jyun-Yu; Dai, Chih-Hao; Chen, Ching-En; Ho, Szu-Han; Chen, Hua-Mao; Cheng, Osbert; Huang, Cheng-Tung
國立成功大學 2012-04-09 Charge trapping induced drain-induced-barrier-lowering in HfO2/TiN p-channel metal-oxide-semiconductor-field-effect-transistors under hot carrier stress Lo, Wen-Hung; Chang, Ting-Chang; Tsai, Jyun-Yu; Dai, Chih-Hao; Chen, Ching-En; Ho, Szu-Han; Chen, Hua-Mao; Cheng, Osbert; Huang, Cheng-Tung
國立交通大學 2014-12-08T15:21:35Z Charge trapping induced frequency-dependence degradation in n-MOSFETs with high-k/metal gate stacks Dai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Hung, Ya-Chi; Lo, Wen-Hung; Ho, Szu-Han; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Chen, Hua-Mao; Dai, Bai-Shan; Tsai, Tsung-Ming; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung
國立高雄師範大學 2008-12 Charge Trapping Memory Stack with Aluminum Oxide as the Tunnel Barrier J.F Yang;X.W. (Sharon) Wang;Y.L. Yang;T.P. Ma; 楊宜霖
國立東華大學 2006-07 Charge trapping properties at Si3N4/SiO2 interface studied by variable-temperature electrostatic force microscopy S. D. Tzeng ; S. Gwo
淡江大學 2003-11 Charge, Orbital, and Spin Ordering in the Strongly Correlated Electron System 杜昭宏
臺大學術典藏 2018-09-10T09:44:27Z Charge, spin, and heat transport in the proximity of metal/ferromagnet interface Huang, S.-Y.; Qu, D.; Chien, C.-L.; Huang, S.-Y.; Qu, D.; Chien, C.-L.; SSU-YEN HUANG
臺大學術典藏 2019-12-27T01:15:16Z Charge, spin, and heat transport in the proximity of metal/ferromagnet interface Huang, S.-Y.; Qu, D.; Chien, C.-L.; Huang, S.-Y.; Qu, D.; Chien, C.-L.; SSU-YEN HUANG
淡江大學 2024-07-31T04:11:16Z Charge-acquired Pb2+ boosts actively and selectively electrochemical carbon dioxide reduction reaction to formate Zhang, Ningce;Li, Daohao;Wang, Xiaoxia;Cai, Rongsheng;Dong, Chung-Li;Nga, Ta Thi Thuy;Zhang, Lijie;Yang, Dongjiang
臺大學術典藏 2018-09-10T05:58:34Z Charge-based capacitance measurement for bias-dependent capacitance YAO-WEN CHANG; Chang, Y.-W.; Chang, H.-W.; Lu, T.-C.; King, Y.-C.; Ting, W.; Ku, Y.-H.J.; Lu, C.-Y.
國立臺灣大學 1993-07 Charge-based current model for CMOS gates Wang, J.H.; Fan, J.T.; Fen, W.S.
國立臺灣大學 1994 Charge-Based Current Model for CMOS Gates Wang, J. H.; Fan, J. T.; 馮武雄; Wang, J. H.; Fan, J. T.; Feng, Wu-Shiung
國立成功大學 2004-03 Charge-compensating defect in ceria-doped strontium barium niobate by electron energy-loss spectroscopy and X-ray photoelectron spectroscopy Shiue, Jyh-Tzong; Fang, Tsang-Tse
國立交通大學 2014-12-08T15:05:08Z CHARGE-COUPLED DEVICE POLARIMETRY AND ITS MEASUREMENT OF THE STOKES VECTOR OF LIGHT TRANSMITTED BY A POLYMER PLATE CHAO, YF; HSIEH, WF
國立臺灣大學 1992 Charge-density distribution of heptasulfur imide (S7NH) Wang, Chih-Chieh; Hong, Ying-Ying; Ueng, Chun-Her; Wang, Yu
國立臺灣大學 1986-04 Charge-Density-Wave State in Alpha-U - A Multiple-Domain and Single-Q Structure CHEN, CH; LANDER, GH
國立成功大學 2019 Charge-dependent pair correlations relative to a third particle in p + Au and d + Au collisions at RHIC Adam, J.;Adamczyk, L.;Adams, J.R.;Adkins, J.K.;Agakishiev, G.;Aggarwal, M.M.;Ahammed, Z.;Alekseev, I.;Anderson, D.M.;Aoyama, R.;Aparin, Aparin A.;Arkhipkin, D.;Aschenauer, E.C.;Ashraf, M.U.;Atetalla, F.;Attri, Attri A.;Averichev, G.S.;Bairathi, V.;Barish, K.;Bassill, A.J.;Behera, A.;Bellwied, R.;Bhasin, A.;Bhati, A.K.;Bielcik, J.;Bielcikova, J.;Bland, L.C.;Bordyuzhin, I.G.;Brandenburg, J.D.;Brandin, A.V.;Bryslawskyj, J.;Bunzarov, I.;Butterworth, J.;Caines, H.;Calderón, derón de la Barca Sánchez M.;Cebra, D.;Chakaberia, I.;Chaloupka, P.;Chan, B.K.;Chang, F.-H.;Chang, Z.;Chankova-Bunzarova, N.;Chatterjee, A.;Chattopadhyay, S.;Chen, J.H.;Chen, X.;Cheng, J.;Cherney, M.;Christie, W.;Crawford, H.J.;Csanád, M.;Das, S.;Dedovich, T.G.;Deppner, I.M.;Derevschikov, A.A.;Didenko, L.;Dilks, C.;Dong, X.;Drachenberg, J.L.;Dunlop, J.C.;Edmonds, T.;Elsey, N.;Engelage, J.;Eppley, G.;Esha, R.;Esumi, S.;Evdokimov, O.;Ewigleben, J.;Eyser, O.;Fatemi, R.;Fazio, S.;Federic, P.;Fedorisin, J.;Feng, Y.;Filip, P.;Finch, E.;Fisyak, Y.;Fulek, L.;Gagliardi, C.A.;Galatyuk, T.;Geurts, F.;Gibson, A.;Gopal, K.;Grosnick, D.;Gupta, A.;Guryn, W.;Hamad, A.I.;Hamed, A.;Harris, J.W.;He, L.;Heppelmann, S.;Herrmann, N.;Holub, L.;Hong, Y.;Horvat, S.;Huang, B.;Huang, Huang H.Z.;Huang, S.L.;Huang, T.;Huang, X.;Humanic, T.J.;Huo, P.;Igo, G.;Jacobs, W.W.;Jena, C.;Jentsch, A.;Ji, Y.;Jia, Jia J.;Jiang, K.;Jowzaee, S.;Ju, X.;Judd, E.G.;Kabana, S.;Kagamaster, S.;Kalinkin, D.;Kang, Kang K.;Kapukchyan, D.;Kauder, Kauder K.;Ke, H.W.;Keane, D.;Kechechyan, A.;Kelsey, M.;Khyzhniak, Y.V.;Kikoła, D.P.;Kim, C.;Kinghorn, T.A.;Kisel, I.;Kisiel, A.;Kocan, M.;Kochenda, L.;Kosarzewski, L.K.;Kramarik, L.;Kravtsov, P.;Krueger, Krueger K.;Kulathunga, Mudiyanselage N.;Kumar, L.;Kunnawalkam, Elayavalli R.;Kwasizur, J.H.;Lacey, R.;Landgraf, J.M.;Lauret, J.;Lebedev, A.;Lednicky, R.;Lee, J.H.;Li, C.;Li, W.;Li, X.;Li, Y.;Liang, Y.;Licenik, R.;Lin, T.;Lipiec, A.;Lisa, M.A.;Liu, F.;Liu, H.;Liu, P.;Liu, T.;Liu, X.;Liu, Y.;Liu, Z.;Ljubicic, T.;Llope, W.J.;Lomnitz, M.;Longacre, R.S.;Luo, S.;Luo, X.;Ma, G.L.;Ma, L.;Ma, R.;Ma, Y.G.;Magdy, N.;Majka, R.;Mallick, D.;Margetis, S.;Markert, C.;Matis, H.S.;Matonoha, O.;Mazer, J.A.;Meehan, K.;Mei, J.C.;Minaev, N.G.;Mioduszewski, S.;Mishra, D.;Mohanty, B.;Mondal, Mondal M.M.;Mooney, I.;Moravcova, Z.;Morozov, D.A.;Nasim, M.;Nayak, K.;Nelson, J.M.;Nemes, D.B.;Nie, M.;Nigmatkulov, G.;Niida, T.;Nogach, L.V.;Nonaka, T.;Odyniec, G.;Ogawa, A.;Oh, K.;Oh, S.;Okorokov, V.A.;Page, B.S.;Pak, R.;Panebratsev, Y.;Pawlik, B.;Pawlowska, D.;Pei, H.;Perkins, C.;Pintér, R.L.;Pluta, J.;Porter, J.;Posik, M.;Pruthi, N.K.;Przybycien, M.;Putschke, J.;Quintero, A.;Radhakrishnan, S.K.;Ramachandran, S.;Ray, Ray R.L.;Reed, Reed R.;Ritter, H.G.;Roberts, J.B.;Rogachevskiy, O.V.;Romero, J.L.;Ruan, L.;Rusnak, J.;Rusnakova, O.;Sahoo, N.R.;Sahu, P.K.;Salur, Salur S.;Sandweiss, J.;Schambach, J.;Schmidke, W.B.;Schmitz, N.;Schweid, B.R.;Seck, F.;Seger, J.;Sergeeva, M.;Seto, R.;Seyboth, P.;Shah, N.;Shahaliev, E.;Shanmuganathan, P.V.;Shao, M.;Shen, F.;Shen, W.Q.;Shi, Shi S.S.;Shou, Q.Y.;Sichtermann, E.P.;Siejka, Siejka S.;Sikora, R.;Simko, M.;Singh, J.;Singha, Singha S.;Smirnov, D.;Smirnov, N.;Solyst, W.;Sorensen, P.;Spinka, H.M.;Srivastava, B.;Stanislaus, T.D.S.;Stefaniak, M.;Stewart, D.J.;Strikhanov, M.;Stringfellow, B.;Suaide, A.A.P.;Sugiura, T.;Sumbera, M.;Summa, B.;Sun, X.M.;Sun, Y.;Surrow, B.;Svirida, D.N.;Szymanski, P.;Tang, A.H.;Tang, Z.;Taranenko, A.;Tarnowsky, Tarnowsky T.;Thomas, J.H.;Timmins, A.R.;Tlusty, D.;Todoroki, Todoroki T.;Tokarev, M.;Tomkiel, C.A.;Trentalange, S.;Tribble, R.E.;Tribedy, P.;Tripathy, S.K.;Tsai, O.D.;Tu, B.;Tu, Z.;Ullrich, T.;Underwood, D.G.;Upsal, I.;Van, Buren G.;Vanek, J.;Vasiliev, A.N.;Vassiliev, I.;Videbæk, F.;Vokal, S.;Wang, F.;Wang, G.;Wang, P.;Wang, Y.;Webb, J.C.;Wen, L.;Westfall, G.D.;Wieman, H.;Wissink, S.W.;Witt, R.;Wu, Y.;Xiao, Z.G.;Xie, G.;Xie, W.;Xu, H.;Xu, N.;Xu, Q.H.;Xu, Y.F.;Xu, Z.;Yang, C.;Yang, Q.;Yang, S.;Yang, Yang Y.;Yang, Z.;Ye, Z.;Yi, L.;Yip, K.;Yoo, I.-K.;Zbroszczyk, H.;Zha, W.;Zhang, D.;Zhang, L.;Zhang, S.;Zhang, X.P.;Zhang, Y.;Zhang, Zhang Z.;Zhao, J.;Zhong, C.;Zhou, C.;Zhu, X.;Zhu, Zhu Z.;Zurek, M.;Zyzak, M.;Collaboration, STAR
國立成功大學 2022-07 Charge-Discharge Mechanism of High-Entropy Co-Free Spinel Oxide Toward Li+ Storage Examined Using Operando Quick-Scanning X-Ray Absorption Spectroscopy Luo;Xu-Feng;Patra;Jagabandhu;Chuang;Wei-Tsung;Nguyen;Xuyen, Thi;Ting;Jyh-Ming;Li;Ju;Pao;Chih-Wen;Chang;Jeng-Kuei
國立成功大學 2022 Charge-Discharge Properties of Sputtered Mg Anode in Flexible All-Solid-State Mg-Ion Batteries Chen, K.-J.;Hung, F.-Y.;He, Y.-T.

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