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Showing items 397486-397495 of 2348570 (234857 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:07:55Z |
ESD Avoiding Circuits for Solving OTP Memory Falsely Programmed Issues
|
Huang, Shao-Chang; Chen, Ke-Horng; Chen, Hsin-Ming; Ho, Ming-Chou; Shen, Rick Shih-Jye |
| 元智大學 |
2011-02 |
ESD Currents Induced in a Charged Human Body Approaching a Vehicle
|
Hsing-Yi Chen; Yu-Ching Chu |
| 國立成功大學 |
2005-06 |
ESD engineering of nitride-based LEDs
|
Su, Yan-Kuin; Chang, Shoou-Jinn; Wei, Sun-Chin; Chen, Shi-Ming; Li, W. L. |
| 國立交通大學 |
2014-12-08T15:17:09Z |
ESD failure mechanisms of analog I/O cells in 0.18-mu m CMOS technology
|
Ker, MD; Chen, SH; Chuang, CH |
| 國立交通大學 |
2014-12-08T15:40:18Z |
ESD implantation for subquarter-micron CMOS technology to enhance ESD robustness
|
Ker, MD; Hsu, HC; Peng, JJ |
| 國立交通大學 |
2014-12-08T15:19:14Z |
ESD implantations for on-chip ESD protection with layout consideration in 0.18-mu m salicided CMOS technology
|
Ker, MD; Chuang, CH; Lo, WY |
| 國立交通大學 |
2014-12-08T15:26:45Z |
ESD implantations in 0.18-mu m salicided CMOS technology for on-chip ESD protection with layout consideration
|
Ker, MD; Chuang, CH |
| 國立交通大學 |
2020-10-05T02:02:01Z |
ESD Improvements on Power N-Channel LDMOS Devices by the Composite Structure of Super Junctions Integrated With SCRs in the Drain Side
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Chen, Hung-Wei; Chen, Shen-Li; Huang, Yu-Ting; Chen, Hsun-Hsiang |
| 國立交通大學 |
2014-12-16T06:14:33Z |
ESD protection circuit
|
Ker; Ming-Dou; Lin; Kun-Hsien |
| 國立交通大學 |
2014-12-16T06:14:37Z |
ESD protection circuit
|
Ker; Ming-Dou; Lin; Kun-Hsien |
Showing items 397486-397495 of 2348570 (234857 Page(s) Totally)
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