| 國立臺灣大學 |
2006-07 |
Measuring plasmon-resonance enhanced third-harmonic ��3 of Ag nanoparticles
|
Liu, T.-M.; Tai, S.-P.; Yu, C.-H.; Wen, Y.-C.; Chu, S.-W.; Chen, L.-J.; Prasad, M. R.; Lin, K.-J.; Sun, C.-K. |
| 國立臺灣科技大學 |
2013 |
Measuring position and orientation of sheet metal parts by a 5-beam laser probe
|
Lee, R.-T.;Shiou, F.-J. |
| 高雄醫學大學 |
2005 |
Measuring postpartum stress
|
洪志秀; Chich-Hsiu Hung |
| 亞洲大學 |
2008 |
Measuring Power System Harmonics and Interharmonics by an Improved Fast Fourier Transform-based Algorithm
|
G. W. Chang;C. I Chen;Y. J. Liu; M. C. Wu |
| 亞洲大學 |
2008-03 |
Measuring Power System Harmonics and Interharmonics by an Improved Fast Fourier Transform-based Algorithm
|
張文恭;G.W.Chang;陳正一;Chen, Cheng-I;Y.J.Liu;M.C.Wu |
| 國立交通大學 |
2014-12-08T15:29:44Z |
Measuring PPM Non-conformities for Processes with Asymmetric Tolerances
|
Pearn, W. L.; Wu, C. H. |
| 臺大學術典藏 |
2018-09-10T15:26:38Z |
Measuring Preferences for a Diabetes Pay-for-Performance for Patient (P4P4P) Program using a Discrete Choice Experiment
|
Chen, T.-T. ; Tung, T.-H. ; Hsueh, Y.-S. ; Tsai, M.-H. ; Liang, H.-M. ; Li, K.-L. ; Chung, K.-P. ; Tang, C.-H.; KUO-PIAO CHUNG |
| 元培科技大學 |
2005 |
Measuring Process Capability Based on Cpk with Gauge Measurement Errors.
|
Pearn; W. L. and Liao; M. Y. |
| 國立交通大學 |
2014-12-08T15:13:35Z |
Measuring process capability based on Cpmk with gauge measurement errors
|
Hsu, B. M.; Shu, M. H.; Pearn, W. L. |
| 正修科技大學 |
2006-04-00 |
Measuring Process Capability Based on Cpmk with Gauge Measurement Errors
|
許碧敏 |
| 淡江大學 |
2013-07 |
Measuring Process Capital from a System Model Perspective
|
Shang, Shari S.-C.; Wu, Ya-Ling |
| 國立政治大學 |
2013-07 |
Measuring process capital from a system model perspective
|
Shang, Shari S.C.;Wu, Y.-L.; 尚孝純 |
| 國立臺灣科技大學 |
2006 |
Measuring process performance based on expected loss for asymmetric tolerances
|
Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 國立交通大學 |
2014-12-08T15:15:20Z |
Measuring process performance based on expected loss with asymmetric tolerances
|
Pearn, W. L.; Chang, Y. C.; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2010 |
Measuring process performance based on Taguchi capability index in the presence of measurement errors
|
Wu, Chien-Wei |
| 國立交通大學 |
2014-12-08T15:39:50Z |
Measuring process yield based on the capability index C-pm
|
Pearn, WL; Lin, PC |
| 國立臺灣科技大學 |
2010 |
Measuring process yield by fuzzy lower confidence bounds
|
Wu, Chien-Wei; Liao, M. Y. |
| 國立臺灣科技大學 |
2013 |
Measuring process yield for nonlinear profiles
|
Wang, F.-K.;Guo, Y.-C. |
| 國立臺灣科技大學 |
2013 |
Measuring process yield for nonlinear profiles
|
Wang, F.-K.;Guo, Y.-C. |
| 國立臺灣科技大學 |
2014 |
Measuring process yield for nonlinear profiles
|
Wang, F.-K.;Guo, Y.-C. |
| 國立臺灣海洋大學 |
2011-06-06 |
Measuring production and consumption efficiencies using the SBM-NDEA approach: the case of low-cost carriers
|
Yu-Chun Chang;Ming-Miin Yu |
| 國立臺灣海洋大學 |
2014-01 |
Measuring production and consumption efficiencies using the slack-based measure network data envelopment analysis approach: the case of low-cost carriers
|
Yu-Chun Chang;Ming-Miin Yu |
| 國立臺灣大學 |
1993 |
Measuring Production Efficiency in a Not-for-Profit Setting: An Extension
|
Li, Shu-Hsing; Mensah, Yaw M. |
| 臺大學術典藏 |
2018-09-10T04:36:59Z |
Measuring Production Efficiency in a Not-for-Profit Setting: An Extension
|
Shu-Hsing Li;Yaw M. Mensah; Shu-Hsing Li; Yaw M. Mensah; SHU-HSING LI |
| 國立交通大學 |
2014-12-08T15:17:17Z |
Measuring production performance of different product mixes in semiconductor fabrication
|
Chung, Shu-Hsing; Pearn, Wen Lea; Lee, Amy H. I. |
