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教育部委託研究計畫 計畫執行:國立臺灣大學圖書館
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顯示項目 572076-572085 / 2348973 (共234898頁) << < 57203 57204 57205 57206 57207 57208 57209 57210 57211 57212 > >> 每頁顯示[10|25|50]項目
| 元培科技大學 |
2005 |
Measuring Process Capability Based on Cpk with Gauge Measurement Errors.
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Pearn; W. L. and Liao; M. Y. |
| 國立交通大學 |
2014-12-08T15:13:35Z |
Measuring process capability based on Cpmk with gauge measurement errors
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Hsu, B. M.; Shu, M. H.; Pearn, W. L. |
| 正修科技大學 |
2006-04-00 |
Measuring Process Capability Based on Cpmk with Gauge Measurement Errors
|
許碧敏 |
| 淡江大學 |
2013-07 |
Measuring Process Capital from a System Model Perspective
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Shang, Shari S.-C.; Wu, Ya-Ling |
| 國立政治大學 |
2013-07 |
Measuring process capital from a system model perspective
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Shang, Shari S.C.;Wu, Y.-L.; 尚孝純 |
| 國立臺灣科技大學 |
2006 |
Measuring process performance based on expected loss for asymmetric tolerances
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Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 國立交通大學 |
2014-12-08T15:15:20Z |
Measuring process performance based on expected loss with asymmetric tolerances
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Pearn, W. L.; Chang, Y. C.; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2010 |
Measuring process performance based on Taguchi capability index in the presence of measurement errors
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Wu, Chien-Wei |
| 國立交通大學 |
2014-12-08T15:39:50Z |
Measuring process yield based on the capability index C-pm
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Pearn, WL; Lin, PC |
| 國立臺灣科技大學 |
2010 |
Measuring process yield by fuzzy lower confidence bounds
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Wu, Chien-Wei; Liao, M. Y. |
顯示項目 572076-572085 / 2348973 (共234898頁) << < 57203 57204 57205 57206 57207 57208 57209 57210 57211 57212 > >> 每頁顯示[10|25|50]項目
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