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Showing items 375251-375275 of 2310111 (92405 Page(s) Totally) << < 15006 15007 15008 15009 15010 15011 15012 15013 15014 15015 > >> View [10|25|50] records per page
國立交通大學 |
2014-12-08T15:39:50Z |
Electrical properties of sputter deposited SrTiO3 gate dielectrics
|
Liu, CY; Tseng, TY |
大葉大學 |
2006-08 |
Electrical properties of sputtered-indium tin oxide film contacts on n-type GaN
|
Hwang, J. D.;Lin, C.C.;Chen, W.L. |
大葉大學 |
2008-01-28 |
Electrical properties of Sr-doped lanthanum titanate ceramics
|
Huang, J. W.;Chen, S. Y.;Sung, H. H. |
國立交通大學 |
2014-12-08T15:45:43Z |
Electrical properties of Ta2O5 thin films deposited on Cu
|
Ezhilvalavan, S; Tseng, TY |
國立交通大學 |
2014-12-08T15:46:41Z |
Electrical properties of Ta2O5 thin films deposited on Ta
|
Ezhilvalavan, S; Tseng, TY |
國立成功大學 |
2001-11-01 |
Electrical properties of TaxNy films by implementing OES in the sputtering system
|
Lu, Yang-Ming; Weng, R. J.; Hwang, Weng-Sing; Yang, Y. S. |
國立高雄第一科技大學 |
2001.11 |
Electrical properties of TaxNy films by implementing OES in the sputtering system
|
Y.M.Lu;R.J.Weng;W.S.Hwang;Y.S.Yang; 楊玉森 |
淡江大學 |
2015-05 |
Electrical properties of the (Gd2−xLix)Ti2O7−x co-existence with the LiO0.5 self-flux
|
Wen, Liang-Chang; Tsai, Yun-I; Hsu, Tzu-Huan; Wang, Ching-Hsien; Wu, Mong-Shin; Kao, Huey-Chuen I.; Lee, Maw-Chwain |
淡江大學 |
2013-12-15 |
Electrical properties of the (Y2-xLix)Ti2O7-x samples with LiO0.5 self-flux
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Wen, L.C.; Tsai, Y. I.; Lin, H. K.; Chang, S. C.; Lin, M.Y.; Chang, H.S.; Kao, H.-C.I.; Jang, L.Y.; Lee, M.C.; Lee, Y.S. |
淡江大學 |
2013-12-15 |
Electrical properties of the (Y2-xLix)Ti2O7-x samples with LiO0.5 self-flux
|
Wen, L.C.;Tsai, Y.I.;Lin, H.K.;Chang, S.C.;Lin, M.Y.;Chang, H.S.;Kao, H.-C.I.;Jang, L.Y.;Lee, M.C.;Lee, Y.S. |
國立交通大學 |
2014-12-08T15:43:55Z |
Electrical properties of the free-standing diamond film at high voltages
|
Huang, BR; Ke, WC; Chen, WK |
淡江大學 |
2012-10 |
Electrical properties of the GDC oxide and GDC carbonate composite
|
Wen, .C.; Tsai, Y.I.; Lin, H.K.; Chang, S.C.; Kao, H.-C.I.; Sheu, H.S.; Lee, M.C.; Lee, Y.S. Lee |
國立成功大學 |
2008-03 |
Electrical properties of the InP/InGaAs pnp heterostructure-emitter bipolar transistor
|
Tsai, Jung-Hui; Liu, Wen-Chau; Guo, D. F.; Kang, Y. Ch.; Chiu, Shao-Yen; Lone, W. Sh. |
國立臺灣海洋大學 |
2011-02-05 |
Electrical Properties of the InPInGaAs pnp Heterostructure-Emitter Bipolar Transistor
|
J. H. Tsai; W. Ch. Liu; D. F. Guo; Y. Ch. Kang; Sh. Y. Chiu; W. Sh. Lour |
元智大學 |
2016-07-04 |
Electrical Properties of the Polyvinyl Alcohol (PVA)/ZnO Composite Film Under Electric Fields Analyzed Using Photoluminescence Analysis
|
林祐華; Chau-Kuang Liau |
國立臺灣海洋大學 |
1997-10 |
Electrical Properties of the Positive Temperature Coefficient of Resistivity Materials with 490 ° C Critical Temperature
|
Yen-Yi Lin;Chen-Ti Hu;Horng-Yi Chang;I-Nan Lin |
國立交通大學 |
2014-12-08T15:46:06Z |
Electrical properties of the Si implantation in Mg doped p-GaN
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Lai, WC; Yokoyama, M; Tsai, CC; Chang, CS; Guo, JD; Tsang, JS; Chan, SH |
國立成功大學 |
2000-11 |
Electrical properties of thin gate dielectric grown by rapid thermal oxidation
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Lee, Jiann-Shing; Chang, Shoou-Jinn; Sun, Shi-Chung; Jang, Syun-Ming; Yu, Mo-Chiun |
國立聯合大學 |
2006 |
Electrical Properties of TiO2 Films by Controlled Deposition of Sol-Gel Process
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Y. W. Lin, Cheng-Shing Hsu, and P. C. Yao, |
國立交通大學 |
2014-12-08T15:02:23Z |
Electrical properties of ZnO varistors prepared by microwave sintering process
|
Chen, CS; Kuo, CT; Lin, IN |
大葉大學 |
2016-07-12 |
Electrical property improved of activate carbon based Supercapacitor by silver nanowires doping and ultrasonic spray process
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Huang, Jung-Jie;Zhang, Yu-Xuan;Hsueh, Yu-Lee |
中原大學 |
1996-12 |
Electrical Property of GaN Thin Films Grown by Atmospheric Pressure OMCVD
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Liao, S. M.;Wen, J. H.;Lan, S. M. |
淡江大學 |
2012-10 |
Electrical Pulse Triggered Reversible Assembly of Molecular Adlayers
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Lee, Shern-Long; Hsu, Yu-Ju; Wu, Hung-Jen; Lin, Hsing-An; Hsu, Hsiu-Fu; Chen, Chun-hsien |
臺大學術典藏 |
2018-09-10T09:17:32Z |
Electrical pulse triggered reversible assembly of molecular adlayers
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Lee, S. L.; Hsu, Y. J.; Wu, H. J.; Lin, H. A.; Hsu, H. F.; Chen, C. H.; CHUN-HSIEN CHEN |
國立交通大學 |
2014-12-08T15:27:01Z |
Electrical reliability issues of integrating low-K dielectrics with Cu metallization
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Wu, ZC; Shiung, ZW; Wang, CC; Fang, KL; Wu, RG; Liu, YL; Tsui, BY; Chen, MC; Chang, W; Chou, PF; Jang, SM; Yu, CH; Liang, MS |
Showing items 375251-375275 of 2310111 (92405 Page(s) Totally) << < 15006 15007 15008 15009 15010 15011 15012 15013 15014 15015 > >> View [10|25|50] records per page
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