國立交通大學 |
2014-12-16T06:15:33Z |
ELECTRICAL STIMULATION SYSTEM AND METHOD USING MULTI-GROUP ELECTRODE ARRAY
|
CHOI, CHARLES TAK-MING; HSU, CHIEN-HUA |
臺大學術典藏 |
2020-02-26T01:34:05Z |
Electrical stimulation systems for cardiac tissue engineering
|
Tandon, N.; Cannizzaro, C.; Chao, P.-H.G.; Maidhof, R.; Marsano, A.; Au, H.T.H.; Radisic, M.; Vunjak-Novakovic, G.; GRACE PEN-HSIU CHAO |
國立聯合大學 |
2006 |
Electrical switching and transport in the Si/organic monolayer/Au and Si/organic bilayer/Al devices
|
Chia-Hsun Tu*, Yi-Sheng Lai, and Dim-Lee Kwong |
國立成功大學 |
2023-06 |
Electrical Sympathetic Neuromodulation Protects Bone Marrow Niche and Drives Hematopoietic Regeneration during Chemotherapy
|
Hsu;Ya-Ting;Chen;Li-Hsien;Liu;Ya-Hui;Chu;Shih-Kai;Chen;Tsai-Yun;Tsai;Kuen-Jer;Shen;Meng-Ru;Liu;Wentai |
國立成功大學 |
2019 |
Electrical synapses between mushroom body neurons are critical for consolidated memory retrieval in Drosophila
|
Shyu, W.-H.;Lee, W.-P.;Chiang, M.-H.;Chang, Chang C.-C.;Fu, T.-F.;Chiang, H.-C.;Wu, T.;Wu, C.-L. |
國立臺灣科技大學 |
2014 |
Electrical test method of open defects at data buses in 3D SRAM IC
|
Shiraishi Y., Hashizume M., Yotsuyanagi H., Tada T., Lu S.-K. |
國立臺灣科技大學 |
2017 |
Electrical test of resistive and capacitive open defects at data bus in 3D memory IC
|
Hashizume, M.;Shiraishi, Y.;Yotsuyanagi, H.;Yokoyama, H.;Tada, Tada T.;Lu, S.-K. |
國立交通大學 |
2014-12-16T06:13:58Z |
Electrical test structure applying 3D-ICS bonding technology for stacking error measurement
|
Chen Kuan-Neng; Li Shih-Wei |
國立交通大學 |
2014-12-16T06:15:00Z |
ELECTRICAL TEST STRUCTURE APPLYING 3D-ICS BONDING TECHNOLOGY FOR STACKING ERROR MEASUREMENT
|
Chen Kuan-Neng; Li Shih-Wei |
國立交通大學 |
2017-04-21T06:49:25Z |
Electrical Testing Structure for Stacking Error Measurement in 3D Integration
|
Lee, Shih-Wei; Kuo, Shu-Chiao; Chen, Kuan-Neng |
國立臺灣科技大學 |
2017 |
Electrical tests for capacitive open defects in assembled PCBs
|
Alia, F.A.B.;Odoriba, A.;Hashizume, M.;Yotsuyanagi, H.;Lu, S.-K. |
國立臺灣科技大學 |
2008 |
Electrical transients analysis for conductor rail gaps of Taipei rapid transit system
|
Shih W.-L.; Chen N.; Tzeng Y.-S. |
南台科技大學 |
2009-02 |
Electrical transport and ac conductivity properties of hydrogenated annealing V-doped ZnO
|
林春榮; S. H. Liu; J. C. A. Huang; C. R. Lin; X. Qi |
國立成功大學 |
2009-04-01 |
Electrical transport and ac conductivity properties of hydrogenated annealing V-doped ZnO
|
Liu, S. H.; Huang, Jung-Chun Andrew; Lin, C. R.; Qi, X. |
臺大學術典藏 |
2018-09-10T03:46:18Z |
Electrical transport and carrier density collapse in doped manganite thin films
|
Wang, L.M.;Yang, H.C.;Horng, H.E.; Wang, L.M.; Yang, H.C.; Horng, H.E.; LI-MIN WANG |
國立臺灣大學 |
2001 |
Electrical transport and carrier density collapse in doped manganite thin films
|
Wang, L. M.; Yang, H. C.; Horng, H. E. |
大葉大學 |
2001-07 |
Electrical transport and Carrier density collapse in doped-manganite thin films
|
Yang, H. C.;Horng, H. E.;Wang, Li-Min |
淡江大學 |
2023-11-15 |
Electrical transport and electronic properties of multiband metallic PdSn2
|
Chang, C.-C.;Hsu, C.-E.;Haung, J.-Y.;Liu, T.-C.;Cheng, C.-M.;Chen, W.-T.;Cheng, P.-Y.;Kuo, C.-N.;Lue, C.-S.;Lee, C.-C.;Huang, C.-L. |
國立成功大學 |
2023-11-15 |
Electrical transport and electronic properties of multiband metallic PdSn2
|
Chang;C, -C.;Hsu;C, -E.;Haung;J, -Y.;Liu;T, -C.;Cheng;C, -M.;Chen;W, -T.;Cheng;P, -Y.;Kuo;C, -N.;Lue;C, -S.;Lee;C, -C.;Huang;C, -L. |
國立成功大學 |
2008-08-11 |
Electrical transport and magnetic properties of Nd1-xNaxMnO3 manganites
|
Tang, T.; Tien, Cheng; Hou, B. Y. |
大葉大學 |
2012-11-08 |
Electrical Transport and Magnetic Properties of Sr-doped Lanthanum Titanate Thin Films
|
Sung, Huang-Huei;Huang, Chen-Yi;Lin, Cheng-Hsueh;Tsai, Jiun-Tzuen;Fan, Jung-Chuan;Lin, Chun-Rong |
大葉大學 |
2012-11-08 |
Electrical Transport and Magnetic Properties of Sr-doped Lanthanum Titanate Thin Films
|
Sung, H. H.;Huang, Chen-Yi;Lin, Cheng-Hsueh;Tsai, Jiun-Tzuen;Fan, Jung-Chuan;Lin, Chun-Rong |
國立交通大學 |
2014-12-08T15:05:00Z |
ELECTRICAL TRANSPORT AND SUPERCONDUCTIVITY IN THE AU-BI2SR1.8CA1.2CU2OY COMPOSITE SYSTEM
|
LIN, WY; LIN, JJ; CHEN, TM |
國立交通大學 |
2014-12-08T15:05:11Z |
ELECTRICAL TRANSPORT IN THE AG-BI2SR1.8CA1.2CU2OY COMPOSITE SYSTEM
|
LIN, JJ; CHEN, TM |
國立交通大學 |
2014-12-08T15:24:41Z |
Electrical transport in transparent conducting tin-doped indium oxide films
|
Yeh, S. S.; Lu, J. Y.; Shiu, M. W.; Lin, J. J. |