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Showing items 16-40 of 132  (6 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-08T15:44:43Z Analysis of the dielectric characteristics for polycrystalline Ba0.65Sr0.35TiO3 (II) - d.c. field dependence with a modified bias equation Liou, JW; Chiou, BS
國立交通大學 2014-12-08T15:44:33Z Effect of aluminum seed layer on the crystallographic texture and electromigration resistance of physical vapor deposited copper interconnect Chin, YL; Chiou, BS; Wu, WF
國立交通大學 2014-12-08T15:44:24Z The effect of polyimide passivation on the electromigration of Cu multilayer interconnections Jiang, JS; Chiou, BS
國立交通大學 2014-12-08T15:44:11Z The influence of washing and calcination condition on urea-derived ceria-yttria-doped tetragonal zirconia powders Lin, JD; Duh, JG; Chiou, BS
國立交通大學 2014-12-08T15:43:53Z Wettability of electroless Ni in the under bump metallurgy with lead free solder Young, BL; Duh, JG; Chiou, BS
國立交通大學 2014-12-08T15:43:38Z Luminescent mechanisms of ZnS : Cu : Cl and ZnS : Cu : Al phosphors Chen, YY; Duh, JG; Chiou, BS; Peng, CG
國立交通大學 2014-12-08T15:43:31Z Synthesis of Eu3+-activated yttrium oxysulfide red phosphor by flux fusion method Lo, CL; Duh, JG; Chiou, BS; Peng, CC; Ozawa, L
國立交通大學 2014-12-08T15:43:06Z Novel chip standby current prediction model and ultrathin gate oxide scaling limit Su, HD; Chiou, BS; Lu, PC; Chang, MH; Lee, KH; Chao, CP; See, YC; Sung, JYC
國立交通大學 2014-12-08T15:43:06Z Curing of polyimide and the effect of the TEOS SiO2 barrier layer on the electromigration of sputtered Cu with polyimide passivation Hung, HY; Chiou, BS
國立交通大學 2014-12-08T15:43:05Z Current-temperature characteristics of low-temperature-sputtered (Ba,Sr)TiO3 films post treated by rapid thermal annealing Shye, DC; Chen, JS; Kuo, MW; Chou, BCS; Jan, CK; Wu, MF; Chiou, BS; Cheng, HC
國立交通大學 2014-12-08T15:43:00Z The effect of ZnS content on the luminescence and electrical properties of ZnO : Zn phosphor Lin, CH; Chiou, BS; Chang, CH; Lin, JD
國立交通大學 2014-12-08T15:42:28Z Barrier layer effect of tantalum on the electromigration in sputtered copper films on hydrogen silsesguioxane and Si0(2) Sung, WL; Chiou, BS
國立交通大學 2014-12-08T15:42:26Z Effect of the tantalum barrier layer on the electromigration and stress migration resistance of physical-vapor-deposited copper interconnect Chin, YL; Chiou, BS; Wu, WF
國立交通大學 2014-12-08T15:42:16Z Low-voltage cathodoluminescence properties of the Y2O2S : Eu red light emitting phosphor screen in field-emission environments Lo, CL; Duh, JG; Chiou, BS
國立交通大學 2014-12-08T15:41:51Z Microstructure characteristics for anorthite composite glass with nucleating agents of TiO2 under non-isothermal crystallization Lo, CL; Duh, JG; Chiou, BS; Lee, WH
國立交通大學 2014-12-08T15:41:41Z Engineering phosphors for improved brightness Lin, CH; Chiou, BS; Lin, JD
國立交通大學 2014-12-08T15:41:23Z Preparation and cathodoluminescence of ZnO phosphor Lin, CH; Chiou, BS; Chang, CH; Lin, JD
國立交通大學 2014-12-08T15:41:21Z Low temperature radio-frequency-sputtered (Ba, Sr)TiO3 films on Pt/TiN/Ti/Si substrates with various oxygen/argon mixing ratios Shye, DC; Chiou, BS; Lai, MJ; Hwang, CC; Jiang, CC; Chen, JS; Cheng, MH; Cheng, HC
國立交通大學 2014-12-08T15:41:20Z Effects of post-oxygen plasma treatment on Pt/(Ba,Sr)TiO3/Pt capacitors at low substrate temperatures Shye, DC; Hwang, CC; Lai, MJ; Jaing, CC; Chen, JS; Huang, S; Juang, MH; Chiou, BS; Cheng, HC
國立交通大學 2014-12-08T15:41:18Z Low temperature sintering and crystallisation behaviour of low loss anorthite-based glass-ceramics Lo, CL; Duh, JG; Chiou, BS
國立交通大學 2014-12-08T15:41:08Z The effects of post excimer laser annealing on (Ba,Sr)TiO3 thin films at low substrate temperatures Shye, DC; Chiou, BS; Hwang, CC; Jaing, CC; Hsu, HW; Chen, JS; Cheng, HC
國立交通大學 2014-12-08T15:41:07Z Dependence of polarization on temperature coefficient resistance of (Ba, Sr)TiO3 thin films post-treated by RTA Shye, DC; Chiou, BS; Kuo, MW; Chen, JS; Chou, BCS; Jan, CK; Wu, MF; Cheng, HC
國立交通大學 2014-12-08T15:40:51Z A floating well method for exact capacitance-voltage measurement of nano technology Su, HD; Chiou, BS; Wu, SY; Chang, MH; Lee, KH; Chen, YS; Chao, CP; See, YC; Sun, JYC
國立交通大學 2014-12-08T15:40:26Z Characteristics of oxide breakdown and related impact on device of ultrathin (2.2 nm) silicon dioxide Su, HD; Chiou, BS; Wu, SY; Chang, MH; Lee, KH; Chen, YS; Cha, CP; See, YC; Sun, JYC
國立交通大學 2014-12-08T15:40:05Z Bi-mode breakdown test methodology of ultrathin oxide Su, HD; Chiou, BS; Ko, CY; Wu, SY; Chang, MH; Lee, KH; Chen, YS; Chao, CP; See, YC; Sun, JYC

Showing items 16-40 of 132  (6 Page(s) Totally)
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