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"chiou bs"的相关文件
显示项目 16-40 / 132 (共6页)
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| 國立交通大學 |
2014-12-08T15:44:43Z |
Analysis of the dielectric characteristics for polycrystalline Ba0.65Sr0.35TiO3 (II) - d.c. field dependence with a modified bias equation
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Liou, JW; Chiou, BS |
| 國立交通大學 |
2014-12-08T15:44:33Z |
Effect of aluminum seed layer on the crystallographic texture and electromigration resistance of physical vapor deposited copper interconnect
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Chin, YL; Chiou, BS; Wu, WF |
| 國立交通大學 |
2014-12-08T15:44:24Z |
The effect of polyimide passivation on the electromigration of Cu multilayer interconnections
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Jiang, JS; Chiou, BS |
| 國立交通大學 |
2014-12-08T15:44:11Z |
The influence of washing and calcination condition on urea-derived ceria-yttria-doped tetragonal zirconia powders
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Lin, JD; Duh, JG; Chiou, BS |
| 國立交通大學 |
2014-12-08T15:43:53Z |
Wettability of electroless Ni in the under bump metallurgy with lead free solder
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Young, BL; Duh, JG; Chiou, BS |
| 國立交通大學 |
2014-12-08T15:43:38Z |
Luminescent mechanisms of ZnS : Cu : Cl and ZnS : Cu : Al phosphors
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Chen, YY; Duh, JG; Chiou, BS; Peng, CG |
| 國立交通大學 |
2014-12-08T15:43:31Z |
Synthesis of Eu3+-activated yttrium oxysulfide red phosphor by flux fusion method
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Lo, CL; Duh, JG; Chiou, BS; Peng, CC; Ozawa, L |
| 國立交通大學 |
2014-12-08T15:43:06Z |
Novel chip standby current prediction model and ultrathin gate oxide scaling limit
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Su, HD; Chiou, BS; Lu, PC; Chang, MH; Lee, KH; Chao, CP; See, YC; Sung, JYC |
| 國立交通大學 |
2014-12-08T15:43:06Z |
Curing of polyimide and the effect of the TEOS SiO2 barrier layer on the electromigration of sputtered Cu with polyimide passivation
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Hung, HY; Chiou, BS |
| 國立交通大學 |
2014-12-08T15:43:05Z |
Current-temperature characteristics of low-temperature-sputtered (Ba,Sr)TiO3 films post treated by rapid thermal annealing
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Shye, DC; Chen, JS; Kuo, MW; Chou, BCS; Jan, CK; Wu, MF; Chiou, BS; Cheng, HC |
| 國立交通大學 |
2014-12-08T15:43:00Z |
The effect of ZnS content on the luminescence and electrical properties of ZnO : Zn phosphor
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Lin, CH; Chiou, BS; Chang, CH; Lin, JD |
| 國立交通大學 |
2014-12-08T15:42:28Z |
Barrier layer effect of tantalum on the electromigration in sputtered copper films on hydrogen silsesguioxane and Si0(2)
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Sung, WL; Chiou, BS |
| 國立交通大學 |
2014-12-08T15:42:26Z |
Effect of the tantalum barrier layer on the electromigration and stress migration resistance of physical-vapor-deposited copper interconnect
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Chin, YL; Chiou, BS; Wu, WF |
| 國立交通大學 |
2014-12-08T15:42:16Z |
Low-voltage cathodoluminescence properties of the Y2O2S : Eu red light emitting phosphor screen in field-emission environments
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Lo, CL; Duh, JG; Chiou, BS |
| 國立交通大學 |
2014-12-08T15:41:51Z |
Microstructure characteristics for anorthite composite glass with nucleating agents of TiO2 under non-isothermal crystallization
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Lo, CL; Duh, JG; Chiou, BS; Lee, WH |
| 國立交通大學 |
2014-12-08T15:41:41Z |
Engineering phosphors for improved brightness
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Lin, CH; Chiou, BS; Lin, JD |
| 國立交通大學 |
2014-12-08T15:41:23Z |
Preparation and cathodoluminescence of ZnO phosphor
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Lin, CH; Chiou, BS; Chang, CH; Lin, JD |
| 國立交通大學 |
2014-12-08T15:41:21Z |
Low temperature radio-frequency-sputtered (Ba, Sr)TiO3 films on Pt/TiN/Ti/Si substrates with various oxygen/argon mixing ratios
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Shye, DC; Chiou, BS; Lai, MJ; Hwang, CC; Jiang, CC; Chen, JS; Cheng, MH; Cheng, HC |
| 國立交通大學 |
2014-12-08T15:41:20Z |
Effects of post-oxygen plasma treatment on Pt/(Ba,Sr)TiO3/Pt capacitors at low substrate temperatures
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Shye, DC; Hwang, CC; Lai, MJ; Jaing, CC; Chen, JS; Huang, S; Juang, MH; Chiou, BS; Cheng, HC |
| 國立交通大學 |
2014-12-08T15:41:18Z |
Low temperature sintering and crystallisation behaviour of low loss anorthite-based glass-ceramics
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Lo, CL; Duh, JG; Chiou, BS |
| 國立交通大學 |
2014-12-08T15:41:08Z |
The effects of post excimer laser annealing on (Ba,Sr)TiO3 thin films at low substrate temperatures
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Shye, DC; Chiou, BS; Hwang, CC; Jaing, CC; Hsu, HW; Chen, JS; Cheng, HC |
| 國立交通大學 |
2014-12-08T15:41:07Z |
Dependence of polarization on temperature coefficient resistance of (Ba, Sr)TiO3 thin films post-treated by RTA
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Shye, DC; Chiou, BS; Kuo, MW; Chen, JS; Chou, BCS; Jan, CK; Wu, MF; Cheng, HC |
| 國立交通大學 |
2014-12-08T15:40:51Z |
A floating well method for exact capacitance-voltage measurement of nano technology
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Su, HD; Chiou, BS; Wu, SY; Chang, MH; Lee, KH; Chen, YS; Chao, CP; See, YC; Sun, JYC |
| 國立交通大學 |
2014-12-08T15:40:26Z |
Characteristics of oxide breakdown and related impact on device of ultrathin (2.2 nm) silicon dioxide
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Su, HD; Chiou, BS; Wu, SY; Chang, MH; Lee, KH; Chen, YS; Cha, CP; See, YC; Sun, JYC |
| 國立交通大學 |
2014-12-08T15:40:05Z |
Bi-mode breakdown test methodology of ultrathin oxide
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Su, HD; Chiou, BS; Ko, CY; Wu, SY; Chang, MH; Lee, KH; Chen, YS; Chao, CP; See, YC; Sun, JYC |
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