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Showing items 16-25 of 89  (9 Page(s) Totally)
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Institution Date Title Author
元智大學 Jul-22 Key Feature Identification for Monitoring Wafer-to-Wafer Variation in Semiconductor Manufacturing Shu-Kai S. Fan; Chia-Yu Hsu; Du-Ming Tsai; Mabel C. Chou; Chih-Hung Jen; Jen-Hsuan Tsou
元智大學 Jul-20 Fast and Precise Positioning in PCBs Using Deep Neural Network Regression Du-Ming Tsai; Yi-Hsiang Chou
元智大學 Jul-19 Key parameter identification and defective wafer detection of semiconductor manufacturing processes using image processing techniques Shu-Kai S. Fan; Du-Ming Tsai; Fei He; Jui-Yu Huang; Chih-Hung Jen
元智大學 Jan-19 Defect detection in electronic surfaces using template-based Fourier image reconstruction Du-Ming Tsai
元智大學 Jan-16 Crack detection in randomly textured surfaces using spiral search Du-Ming Tsai; Y. J. Xie
元智大學 Jan-15 3-D vision-assist guidance for robots or the visually impaired Du-Ming Tsai; Hao Hsu; Wei-Yao Chiu
元智大學 Jan-15 3-D vision-assist guidance for robots or the visually impaired Du-Ming Tsai; Hao Hsu; Wei-Yao Chiu
元智大學 Jan-15 3-D vision-assist guidance for robots or the visually impaired Du-Ming Tsai; Hao Hsu; Wei-Yao Chiu
元智大學 Feb-22 無瑕疵樣本之自編碼器神經網路於PCB表面瑕疵檢測 任柏澔; 徐子桓; Du-Ming Tsai
元智大學 Feb-22 Environment-Adaptable Printed-Circuit Board Positioning Using Deep Reinforcement Learning Carlos Solorzano; Du-Ming Tsai

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