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机构	日期	题名	作者
元智大學	Jul-22	Key Feature Identification for Monitoring Wafer-to-Wafer Variation in Semiconductor Manufacturing	Shu-Kai S. Fan; Chia-Yu Hsu; Du-Ming Tsai; Mabel C. Chou; Chih-Hung Jen; Jen-Hsuan Tsou
元智大學	Jul-20	Fast and Precise Positioning in PCBs Using Deep Neural Network Regression	Du-Ming Tsai; Yi-Hsiang Chou
元智大學	Jul-19	Key parameter identification and defective wafer detection of semiconductor manufacturing processes using image processing techniques	Shu-Kai S. Fan; Du-Ming Tsai; Fei He; Jui-Yu Huang; Chih-Hung Jen
元智大學	Jan-19	Defect detection in electronic surfaces using template-based Fourier image reconstruction	Du-Ming Tsai
元智大學	Jan-16	Crack detection in randomly textured surfaces using spiral search	Du-Ming Tsai; Y. J. Xie
元智大學	Jan-15	3-D vision-assist guidance for robots or the visually impaired	Du-Ming Tsai; Hao Hsu; Wei-Yao Chiu
元智大學	Jan-15	3-D vision-assist guidance for robots or the visually impaired	Du-Ming Tsai; Hao Hsu; Wei-Yao Chiu
元智大學	Jan-15	3-D vision-assist guidance for robots or the visually impaired	Du-Ming Tsai; Hao Hsu; Wei-Yao Chiu
元智大學	Feb-22	無瑕疵樣本之自編碼器神經網路於PCB表面瑕疵檢測	任柏澔; 徐子桓; Du-Ming Tsai
元智大學	Feb-22	Environment-Adaptable Printed-Circuit Board Positioning Using Deep Reinforcement Learning	Carlos Solorzano; Du-Ming Tsai
元智大學	Dec-14	Dual-mode detection for foreground segmentation in low-contrast video images	Wei-Yao Chiu; Du-Ming Tsai
元智大學	Aug-21	良性顫抖症之風險評估方法	黃玉晴; 梁庭繼; Du-Ming Tsai
元智大學	Aug-15	Defect detection in multi-crystal solar cells using clustering with uniformity measures	Du-Ming Tsai; Guan-Nan Li; Wei-Chen Li; Wei-Yao Chiu
元智大學	Aug-15	Defect detection in multi-crystal solar cells using clustering with uniformity measures	Du-Ming Tsai; Guan-Nan Li; Wei-Chen Li; Wei-Yao Chiu
元智大學	Aug-14	3-D vision-assist guidance for robots or the visually impaired	Du-Ming Tsai; H. Hsu; W. Y. Chiu
元智大學	Apr-21	Autofocus Measurement for Electronic Components Using Deep Regression	Saul A. Reynoso Farnes; Du-Ming Tsai; Wei-Yao Chiu
元智大學	Apr-17	Automatic vision-based grain optimization and analysis of multi-crystalline solar wafers using hierarchical region growing	Shu-Kai S. Fan; Du-Ming Tsai; Wei-Che Chuang
元智大學	Apr-17	Automatic vision-based grain optimization and analysis of multi-crystalline solar wafers using hierarchical region growing	Shu-Kai S. Fan; Du-Ming Tsai; Wei-Che Chuang
元智大學	2022-11-06	Environment-adaptable Printed-Circuit Board Positioning using Deep Reinforcement Learning	Carlos Solorzano; Du-Ming Tsai
元智大學	2019-12-02	Mura defect inspection in Liquid Crystal Display panels using optical flow-based motion analysis	Du-Ming Tsai; Hshin-Yang Tsai; Wei-Yao Chiu
國立交通大學	2019-08-20T06:33:52Z	「工業工程與系統管理之回顧與展望」特刊：序言	簡禎富; 王國明; 陳茂生; 廖慶榮; 江行全; 張瑞芬; 蔡篤銘; 王茂駿; 吳建瑋; Chen-Fu Chien; Kuo-Ming Wang; Mao-Sheng Chen; Ching-Jong Liao; Bernard C Jiang; Amy J. C. Trappey; Du-Ming Tsai; Mao-Jiun Wang; Chien-Wei Wu
元智大學	2019-02-25	Saw-mark Defect Detection in Heterogeneous Solar Wafer Images using GAN-based Training Samples Generation and CNN Classification	Du-Ming Tsai; Shu-Kai Fan; Yi-Quan Huang; Wei-Yao Chiu
元智大學	2018-12-05	Segmentation of coffee plantation area in satellite images using Fourier features	Du-Ming Tsai; Du-Ming Tsai; Wei-Yao Chiu
元智大學	2018-12	Segmentation of coffee plantation area in satellite images using Fourier features	Du-Ming Tsai; Wan-Ling Chen; Wei-Yao Chiu
元智大學	2018-05-20	Defect inspection of liquid-crystal-display (LCD) panels in repetitive pattern images using 2D Fourier image reconstruction	Du-Ming Tsai; Morris Fan; Yan Hsin Tseng

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