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Institution Date Title Author
臺大學術典藏 2020-06-16T06:36:20Z Thermal modeling and device oise properties of three-dimensional-SOI technology Chen, T.W.;Chun, J.-H.;Lu, Y.-C.;Navid, R.;Wang, W.;Chen, C.-L.;Dutton, R.W.; Chen, T.W.; Chun, J.-H.; Lu, Y.-C.; Navid, R.; Wang, W.; Chen, C.-L.; Dutton, R.W.; YI-CHANG LU
國立臺灣大學 2009 Thermal Modeling and Device Noise Properties of Three-Dimensional–SOI Technology Chen, Tze Wee; Chun, Jung Hoon; Lu, Yi-chang; Navid, R.; Wang, Wei; Chen, Chang-Lee; Dutton, R.W.
臺大學術典藏 2009 Thermal Modeling and Device Noise Properties of Three-Dimensional–SOI Technology Chen, Tze Wee; Chun, Jung Hoon; Lu, Yi-Chang; Navid, R.; Wang, Wei; Chen, Chang-Lee; Dutton, R.W.; Chen, Tze Wee; Chun, Jung Hoon; Lu, Yi-chang; Navid, R.; Wang, Wei; Chen, Chang-Lee; Dutton, R.W.
國立臺灣大學 2007 A built-in technique for measuring substrate and power supply digital switching noise using PMOS-based differential sensors and a waveform sampler in system-on-chip applications Iorga, C.; Lu, Yi-Chang; Dutton, R.W.
臺大學術典藏 2007 A built-in technique for measuring substrate and power supply digital switching noise using PMOS-based differential sensors and a waveform sampler in system-on-chip applications Iorga, C.; Lu, Yi-Chang; Dutton, R.W.; Iorga, C.; Lu, Yi-Chang; Dutton, R.W.
國立臺灣大學 1989-09 Performance analysis of a BiNMOS device Kuo, J.B.; Rosseel, G.P.; Dutton, R.W.

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