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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
臺大學術典藏 2018-09-10T05:29:21Z Diagnosis of Resistive and Stuck-open Defects in Digital CMOS IC Li, J. C.-M.; E. J. McCluskey; CHIEN-MO LI
臺大學術典藏 2018-09-10T04:59:51Z ELF-Murphy Data on Defects and Test Sets E. J. McCluskey; A. Alyamani; J. C. M. Li; C. W. Tseng; E. Volkerink; F. F. Feriani; E. Li; S. Mitra; CHIEN-MO LI
臺大學術典藏 2018-09-10T04:15:41Z Diagnosis for Sequence Dependent Chips Li, J. C.M.; E. J. McCluskey; CHIEN-MO LI
臺大學術典藏 2018-09-10T03:50:57Z Testing for Resistive and Stuck Opens Li, J. C.M.; Tseng, C.W.; E.J. McCluskey; CHIEN-MO LI
臺大學術典藏 2018-09-10T03:50:57Z Diagnosis of Tunneling Opens Li, J. C.M.; E.J. McCluskey; CHIEN-MO LI

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