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"fang yean kuen"的相关文件
显示项目 16-25 / 182 (共19页)
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| 國立成功大學 |
2012-02 |
Dependence of the Au/SnOx/n-LTPS/glass thin film MOS Schottky diode CO gas sensing performances on operating temperature
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Juang, Feng-Renn; Fang, Yean-Kuen; Chiu, Hung-Yu |
| 國立成功大學 |
2011-10 |
A Low-Flicker Noise Gate-Controlled Lateral-Vertical Bipolar Junction Transistor Array With 55-nm CMOS Technology
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Chen, Shuo-Mao; Fang, Yean-Kuen; Juang, Feng-Renn; Chen, Chia-Chung; Liu, Sally; Kuo, Chin-Wei; Chao, Chih-Ping; Tseng, Hua-Chou |
| 國立成功大學 |
2011-08-10 |
The low temperature polysilicon (LTPS) thin film MOS Schottky diode on glass substrate for low cost and high performance CO sensing applications
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Juang, Feng-Renn; Fang, Yean-Kuen; Chiang, Yen-Ting; Chou, Tse-Heng; Lin, Cheng-I.; Lin, Cheng-Wei |
| 國立成功大學 |
2011-05 |
Comparative Study of Carbon Monoxide Gas Sensing Mechanism for the LTPS MOS Schottky Diodes With Various Metal Oxides
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Juang, Feng-Renn; Fang, Yean-Kuen; Chiang, Yen-Ting; Chou, Tse-Heng; Lin, Cheng-I; Lin, Cheng-Wei; Liou, Yan-Wei |
| 國立高雄大學 |
2011-03 |
The Improvement of High-k/Metal Gate pMOSFET Performance and Reliability Using Optimized Si Cap/SiGe Channel Structure
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Yeh, Wen-Kuan; Chen, Yu-Ting; Huang, Fon-Shan; Hsu, Chia-Wei; Chen, Chun-Yu; Fang, Yean-Kuen; Gan, Kwang-Jow; Chen, Po-Ying |
| 國立成功大學 |
2011-03 |
The Improvement of High-k/Metal Gate pMOSFET Performance and Reliability Using Optimized Si Cap/SiGe Channel Structure
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Yeh, Wen-Kuan; Chen, Yu-Ting; Huang, Fon-Shan; Hsu, Chia-Wei; Chen, Chun-Yu; Fang, Yean-Kuen; Gan, Kwang-Jow; Chen, Po-Ying |
| 國立成功大學 |
2011-03 |
A Novel Method to Improve Laser Anneal Worsened Negative Bias Temperature Instability in 40-nm CMOS Technology
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Chen, Ming-Shing; Fang, Yean-Kuen; Juang, Feng-Renn; Chiang, Yen-Ting; Lin, Cheng-I; Lee, Tung-Hsing; Chou, Sam; Ning, Judy |
| 國立成功大學 |
2011-01 |
A High-Performance n-i-p SiCN Homojunction for Low-Cost and High-Temperature Ultraviolet Detecting Applications
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Juang, Feng-Renn; Fang, Yean-Kuen; Chiang, Yen-Ting; Chou, Tse-Heng; Lin, Cheng-I. |
| 國立高雄大學 |
2010 |
Improvement of TDDB reliability, characteristics of HfO2 high-k/metal gate MOSFET device with oxygen post deposition annealing
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Hsu, Chia-Wei; Fang, Yean-Kuen; Yeh, Wen-Kuan; Chen, Chun-Yu; Chiang, Yen-Ting; Juang, Feng-Renn; Lin, Chien-Ting; Lai, Chien-Ming |
| 國立成功大學 |
2009-10 |
The split-gate flash memory with an extra select gate for automotive applications
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Tsair, Yong-Shiuan; Fang, Yean-Kuen; Wang, Yu-Hsiung; Chu, Wen-Ting; Hsieh, Chia-Ta; Lin, Yung-Tao; Wang, Chung S.; Wong, Myron; Lee, Scott; Smolen, Richard; Liu, Bill |
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