|
"fang yean kuen"的相关文件
显示项目 46-70 / 182 (共8页)
<< < 1 2 3 4 5 6 7 8 > >>
每页显示[10|25|50]项目
| 國立成功大學 |
2008-08 |
A high current gain gate-controlled lateral bipolar junction transistor with 90 nm CMOS technology for future RF SoC applications
|
Chen, Shuo-Mao; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lee, I. C.; Chiang, Yen-Ting |
| 國立高雄大學 |
2008-07 |
Significantly improving sub-90 nm CMOSFET performances with notch-gate enhanced high tensile-stress contact etch stop layer
|
Hsu, Chia-Wei; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lin, Chien-Ting |
| 國立成功大學 |
2008-06 |
Investigation and modeling of hot carrier effects on performance of 45-and 55-nm NMOSFETs with RF automatic measurement
|
Tang, Mao-Chyuan; Fang, Yean-Kuen; Liao, Wen-Shiang; Chen, David C.; Yeh, Chune-Sin; Chien, Shan-Chieh |
| 國立成功大學 |
2008-05 |
Dynamic negative bias temperature instability (NBTI) of low-temperature polycrystalline silicon (LTPS) thin-film transistors
|
Liao, J. C.; Fang, Yean-Kuen; Kao, C. H.; Cheng, C. Y. |
| 國立成功大學 |
2008-05 |
Investigation of bulk traps enhanced gate-induced leakage current in Hf-based MOSFETs
|
Liao, Jia-Ching; Fang, Yean-Kuen; Hou, Y. T.; Tseng, W. H.; Hsu, P. F.; Lin, K. C.; Huang, K. T.; Lee, T. L.; Liang, M. S. |
| 國立成功大學 |
2008-04-30 |
Observations in trapping characteristics of positive bias temperature instability on high-k/metal gate n-type metal oxide semiconductor field effect transistor with the complementary multi-pulse technique
|
Liao, J. C.; Fang, Yean-Kuen; Hou, Y. T.; Wu, W. H.; Hung, C. L.; Hsu, P. F.; Lin, K. C.; Huang, K. T.; Lee, T. L.; Liang, M. S. |
| 國立成功大學 |
2008-04 |
Observation of reliability of HfZrOX gate dielectric devices with different Zr/Hf ratios
|
Liao, Jing-Chyi; Fang, Yean-Kuen; Hou, Yong Tian; Tseng, Wei Hsiung; Yang, Chih I.; Hsu, Peng Fu; Chao, Yuen Shun; Lin, Kang Cheng; Huang, Kuo Tai; Lee, Tzu Liang; Liang, Meng Sung |
| 國立成功大學 |
2008-04 |
Effect of etch stop layer stress on negative bias temperature instability of deep submicron p-type metal-oxide-semiconductor field effect transistors with dual gate oxide
|
Chen, Ming-Shing; Fang, Yean-Kuen; Lee, Tung-Hsing; Lin, Chien-Ting; Chiang, Yen-Ting; Ko, Joe; Sheu, Yau Kae; Shen, Tsong Lin; Liao, Wen Yi |
| 國立成功大學 |
2008-03-31 |
Impact of the strained SiGe source/drain on hot carrier reliability for 45 nm p-type metal-oxide-semiconductor field-effect transistors
|
Cheng, C. Y.; Fang, Yean-Kuen; Hsieh, J. C.; Hsia, H.; Chen, W. M.; Lin, S. S.; Hou, C. S. |
| 國立成功大學 |
2008-02-21 |
Mechanism and modelling of source/drain asymmetry variation in 65nm CMOS devices for SRAM and logic applications
|
Lee, Tung-Hsing; Fang, Yean-Kuen; Chiang, Yen-Ting; Lin, C. T.; Chen, Ming-Shing; Cheng, Osbert |
| 國立成功大學 |
2008-02 |
Observation of room temperature negative differential resistance (NDR) in organic light-emitting diode with inorganic dopant
|
Fang, Yean-Kuen; Chiang, Yen-Ting; Chen, Shih-Fang; Lin, Chun-Yu; Hou, Shul-Ching; Hung, Chih-Sheng; Tsai, Tzong-Yow; Chang, Shiuan-Ho; Chou, Tse-Heng |
| 國立成功大學 |
2008-02 |
A novel electrochromic device with high optical switching speed
|
Fang, Yean-Kuen; Chou, Tse-Heng; Lin, Chun-Yu; Chiang, Yen-Ting; Chen, Shih-Fang; Yang, Che-Yun; Chang, Shiuan-Ho; Lin, Chun-Sheng |
| 國立高雄大學 |
2008 |
A high current gain gate-controlled lateral bipolar junction transistor with 90 nm CMOS technology for future RF SoC applications
|
Chen, Shuo-Mao; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lee, I.C.; Chiang, Yen-Ting |
| 國立成功大學 |
2007-10 |
A novel STI etching technology to mitigate an inverse narrow width effect, and improve device performances for 90 nm node and beyond CMOS technology
|
Chiu, Hua-Yueh; Fang, Yean-Kuen; Chou, T. H.; Chiang, Yen-Ting; Lin, C. I. |
| 國立成功大學 |
2007-09 |
CMOS dual-work-function engineering by using implanted Ni-FUSI
|
Lin, Chien-Ting; Ramin, Manfred; Pas, Michael; Wise, Rick; Fang, Yean-Kuen; Hsu, Che-Hua; Huang, Yao-Tsung; Cheng, Li-Wei; Ma, Mike |
| 國立高雄大學 |
2007-05 |
Impacts of notched-gate structure on contact etch stop layer (CESL) stressed 90-nm nMOSFET
|
Lin, Chien-Ting; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lai, Chieh-Ming; Hsu, Che-Hua; Cheng, Li-Wei; Ma, Guang-Hwa |
| 國立成功大學 |
2007-05 |
Impacts of notched-gate structure on contact etch stop layer (CESL) stressed 90-nm nMOSFET
|
Lin, Chien-Ting; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lai, Chieh-Ming; Hsu, Che-Hua; Cheng, Li-Wei; Ma, Guang-Hwa |
| 國立成功大學 |
2007-05 |
Investigation and localization.of the SiGe source/drain (S/D) strain-induced defects in PMOSFET with 45-nm CMOS technology
|
Cheng, C. Y.; Fang, Yean-Kuen; Hsieh, J. C.; Hsia, H.; Sheu, Y. M.; Lu, W. T.; Chen, W. M.; Lin, S. S. |
| 國立高雄大學 |
2007-04-30 |
Efficient mobility enhancement engineering on 65 nm fully silicide complementary metal-oxide-semiconductor field-effect-transistors using second contect etch stop layer process
|
Lai, Chieh-Ming; Fang, Yean-Kuen; Lin, Chien-Ting; Yeh, Wen-Kuan |
| 國立成功大學 |
2007-04 |
Efficient mobility enhancement engineering on 65 nm fully silicide complementary metal-oxide-semiconductor field-effect-transistors using second contect etch stop layer process
|
Lai, Chieh-Ming; Fang, Yean-Kuen; Lin, Chien-Ting; Yeh, Wen-Kuan |
| 國立成功大學 |
2007-04 |
Extra bonus on transistor optimization with stress enhanced notched-gate technology for sub-90 nm complementary metal oxide semiconductor field effect transistor
|
Lin, Chien-Ting; Fang, Yean-Kuen; Lai, Chieh-Ming; Yeh, Wen-Kuan; Hsu, Che-Hua; Cheng, Li-Wei; Huang, Yao-Tsung; Ma, Guang Hwa |
| 國立成功大學 |
2007-02-26 |
Enhancing the crystallization fraction performance of nano-crystalline silicon thin films with argon and hydrogen annealing
|
Chen, S. F.; Fang, Yean-Kuen; Lee, T. H.; Lin, C. Y.; Lin, P. J.; Chang, S. H.; Chou, T. H. |
| 國立高雄大學 |
2007-02 |
A novel strain method for enhancement of 90-nm node and beyond FUSI-gated CMOS performance
|
Lin, Chien-Ting; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lee, Tung-Hsing; Chen, Ming-Shing; Lai, Chieh-Ming; Hsu, Che-Hua; Chen, Liang-Wei; Cheng, Li-Wei; Ma, Mike |
| 國立高雄大學 |
2007-02 |
The investigation of post-annealing-induced defects behavior on 90-nm in halo nMOSFETs with low-frequency noise and charge-pumping measuring
|
Lai, Chieh-Ming; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lin, Chien-Ting; Chou, T.H. |
| 國立成功大學 |
2007-02 |
The investigation of post-annealing-induced defects behavior on 90-nm in halo nMOSFETs with low-frequency noise and charge-pumping measuring
|
Lai, Chieh-Ming; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lin, C. T.; Chou, T. H. |
显示项目 46-70 / 182 (共8页)
<< < 1 2 3 4 5 6 7 8 > >>
每页显示[10|25|50]项目
|
