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機構	日期	題名	作者
國立成功大學	2008-08	A high current gain gate-controlled lateral bipolar junction transistor with 90 nm CMOS technology for future RF SoC applications	Chen, Shuo-Mao; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lee, I. C.; Chiang, Yen-Ting
國立高雄大學	2008-07	Significantly improving sub-90 nm CMOSFET performances with notch-gate enhanced high tensile-stress contact etch stop layer	Hsu, Chia-Wei; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lin, Chien-Ting
國立成功大學	2008-06	Investigation and modeling of hot carrier effects on performance of 45-and 55-nm NMOSFETs with RF automatic measurement	Tang, Mao-Chyuan; Fang, Yean-Kuen; Liao, Wen-Shiang; Chen, David C.; Yeh, Chune-Sin; Chien, Shan-Chieh
國立成功大學	2008-05	Dynamic negative bias temperature instability (NBTI) of low-temperature polycrystalline silicon (LTPS) thin-film transistors	Liao, J. C.; Fang, Yean-Kuen; Kao, C. H.; Cheng, C. Y.
國立成功大學	2008-05	Investigation of bulk traps enhanced gate-induced leakage current in Hf-based MOSFETs	Liao, Jia-Ching; Fang, Yean-Kuen; Hou, Y. T.; Tseng, W. H.; Hsu, P. F.; Lin, K. C.; Huang, K. T.; Lee, T. L.; Liang, M. S.
國立成功大學	2008-04-30	Observations in trapping characteristics of positive bias temperature instability on high-k/metal gate n-type metal oxide semiconductor field effect transistor with the complementary multi-pulse technique	Liao, J. C.; Fang, Yean-Kuen; Hou, Y. T.; Wu, W. H.; Hung, C. L.; Hsu, P. F.; Lin, K. C.; Huang, K. T.; Lee, T. L.; Liang, M. S.
國立成功大學	2008-04	Observation of reliability of HfZrOX gate dielectric devices with different Zr/Hf ratios	Liao, Jing-Chyi; Fang, Yean-Kuen; Hou, Yong Tian; Tseng, Wei Hsiung; Yang, Chih I.; Hsu, Peng Fu; Chao, Yuen Shun; Lin, Kang Cheng; Huang, Kuo Tai; Lee, Tzu Liang; Liang, Meng Sung
國立成功大學	2008-04	Effect of etch stop layer stress on negative bias temperature instability of deep submicron p-type metal-oxide-semiconductor field effect transistors with dual gate oxide	Chen, Ming-Shing; Fang, Yean-Kuen; Lee, Tung-Hsing; Lin, Chien-Ting; Chiang, Yen-Ting; Ko, Joe; Sheu, Yau Kae; Shen, Tsong Lin; Liao, Wen Yi
國立成功大學	2008-03-31	Impact of the strained SiGe source/drain on hot carrier reliability for 45 nm p-type metal-oxide-semiconductor field-effect transistors	Cheng, C. Y.; Fang, Yean-Kuen; Hsieh, J. C.; Hsia, H.; Chen, W. M.; Lin, S. S.; Hou, C. S.
國立成功大學	2008-02-21	Mechanism and modelling of source/drain asymmetry variation in 65nm CMOS devices for SRAM and logic applications	Lee, Tung-Hsing; Fang, Yean-Kuen; Chiang, Yen-Ting; Lin, C. T.; Chen, Ming-Shing; Cheng, Osbert
國立成功大學	2008-02	Observation of room temperature negative differential resistance (NDR) in organic light-emitting diode with inorganic dopant	Fang, Yean-Kuen; Chiang, Yen-Ting; Chen, Shih-Fang; Lin, Chun-Yu; Hou, Shul-Ching; Hung, Chih-Sheng; Tsai, Tzong-Yow; Chang, Shiuan-Ho; Chou, Tse-Heng
國立成功大學	2008-02	A novel electrochromic device with high optical switching speed	Fang, Yean-Kuen; Chou, Tse-Heng; Lin, Chun-Yu; Chiang, Yen-Ting; Chen, Shih-Fang; Yang, Che-Yun; Chang, Shiuan-Ho; Lin, Chun-Sheng
國立高雄大學	2008	A high current gain gate-controlled lateral bipolar junction transistor with 90 nm CMOS technology for future RF SoC applications	Chen, Shuo-Mao; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lee, I.C.; Chiang, Yen-Ting
國立成功大學	2007-10	A novel STI etching technology to mitigate an inverse narrow width effect, and improve device performances for 90 nm node and beyond CMOS technology	Chiu, Hua-Yueh; Fang, Yean-Kuen; Chou, T. H.; Chiang, Yen-Ting; Lin, C. I.
國立成功大學	2007-09	CMOS dual-work-function engineering by using implanted Ni-FUSI	Lin, Chien-Ting; Ramin, Manfred; Pas, Michael; Wise, Rick; Fang, Yean-Kuen; Hsu, Che-Hua; Huang, Yao-Tsung; Cheng, Li-Wei; Ma, Mike
國立高雄大學	2007-05	Impacts of notched-gate structure on contact etch stop layer (CESL) stressed 90-nm nMOSFET	Lin, Chien-Ting; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lai, Chieh-Ming; Hsu, Che-Hua; Cheng, Li-Wei; Ma, Guang-Hwa
國立成功大學	2007-05	Impacts of notched-gate structure on contact etch stop layer (CESL) stressed 90-nm nMOSFET	Lin, Chien-Ting; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lai, Chieh-Ming; Hsu, Che-Hua; Cheng, Li-Wei; Ma, Guang-Hwa
國立成功大學	2007-05	Investigation and localization.of the SiGe source/drain (S/D) strain-induced defects in PMOSFET with 45-nm CMOS technology	Cheng, C. Y.; Fang, Yean-Kuen; Hsieh, J. C.; Hsia, H.; Sheu, Y. M.; Lu, W. T.; Chen, W. M.; Lin, S. S.
國立高雄大學	2007-04-30	Efficient mobility enhancement engineering on 65 nm fully silicide complementary metal-oxide-semiconductor field-effect-transistors using second contect etch stop layer process	Lai, Chieh-Ming; Fang, Yean-Kuen; Lin, Chien-Ting; Yeh, Wen-Kuan
國立成功大學	2007-04	Efficient mobility enhancement engineering on 65 nm fully silicide complementary metal-oxide-semiconductor field-effect-transistors using second contect etch stop layer process	Lai, Chieh-Ming; Fang, Yean-Kuen; Lin, Chien-Ting; Yeh, Wen-Kuan
國立成功大學	2007-04	Extra bonus on transistor optimization with stress enhanced notched-gate technology for sub-90 nm complementary metal oxide semiconductor field effect transistor	Lin, Chien-Ting; Fang, Yean-Kuen; Lai, Chieh-Ming; Yeh, Wen-Kuan; Hsu, Che-Hua; Cheng, Li-Wei; Huang, Yao-Tsung; Ma, Guang Hwa
國立成功大學	2007-02-26	Enhancing the crystallization fraction performance of nano-crystalline silicon thin films with argon and hydrogen annealing	Chen, S. F.; Fang, Yean-Kuen; Lee, T. H.; Lin, C. Y.; Lin, P. J.; Chang, S. H.; Chou, T. H.
國立高雄大學	2007-02	A novel strain method for enhancement of 90-nm node and beyond FUSI-gated CMOS performance	Lin, Chien-Ting; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lee, Tung-Hsing; Chen, Ming-Shing; Lai, Chieh-Ming; Hsu, Che-Hua; Chen, Liang-Wei; Cheng, Li-Wei; Ma, Mike
國立高雄大學	2007-02	The investigation of post-annealing-induced defects behavior on 90-nm in halo nMOSFETs with low-frequency noise and charge-pumping measuring	Lai, Chieh-Ming; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lin, Chien-Ting; Chou, T.H.
國立成功大學	2007-02	The investigation of post-annealing-induced defects behavior on 90-nm in halo nMOSFETs with low-frequency noise and charge-pumping measuring	Lai, Chieh-Ming; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lin, C. T.; Chou, T. H.
國立成功大學	2007-02	A novel strain method for enhancement of 90-nm node and beyond FUSI-gated CMOS performance	Lin, Chien-Ting; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lee, Tung-Hsing; Chen, Ming-Shing; Lai, Chieh-Ming; Hsu, Che-Hua; Chen, Liang-Wei; Cheng, Li-Wei; Ma, Mike
國立成功大學	2007-02	Mechanism of chemical mechanical planarization induced edge corrosion of copper line for Cu/Low-k SiOC interconnects	Hsu, Yung-Lung; Fang, Yean-Kuen; Chiang, Yen-Ting; Chou, Tse-Heng; Hong, Franklin Chau-Nan
國立成功大學	2007-01-08	Ultra high performance planar InGaAsPIN photodiodes for high speed optical fiber communication	Chang, Shiuan-Ho; Fang, Yean-Kuen; Ting, Shyh-Fann; Chen, Shih-Fang; Lin, Chun-Yue; Wu, Cheng-Yi
國立成功大學	2007	A comparative study of SiCN/si and SiCN/SiCN junctions for high-temperature ultraviolet detecting applications	Chou, Tse-Heng; Fang, Yean-Kuen; Yang, Che-Yun; Chiang, Yen-Ting; Shie, Jin-Shu; Chien, Chia-Chen
國立成功大學	2006-12	Effect of silicon thickness on contact-etch-stop-layer-induced silicon/buried-oxide interface stress for partially depleted SOI	Lin, Chien-Ting; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lee, Tung-Hsing; Chen, Ming-Shing; Hsu, Che-Hua; Chen, Liang-Wei; Cheng, Li-Wei; Ma, Mike
國立成功大學	2006-11-15	Design and fabrication of a TiO2/nano-silicon composite visible light photocatalyst	Lin, Chun-Yu; Fang, Yean-Kuen; Kuo, Che-Hao; Chen, Shih-Fang; Lin, Chun-Sheng; Chou, Tse-Heng; Lee, Yu-Hua; Lin, Jui-Che; Hwang, Sheng-Beng
國立成功大學	2006-11	The geometry effect of contact etch stop layer impact on device performance and reliability for 90-nm SOI nMOSFETs	Lai, Chieh-Ming; Fang, Yean-Kuen; Lin, Chien-Ting; Yeh, Wen-Kuan
國立成功大學	2006-10	Poly- and single-crystalline h-GaN grown on SiCN/Si(100) and SiCN/Si(111) substrates by MOCVD	Chang, Shiuan-Ho; Fang, Yean-Kuen; Ting, Shyh-Fann; Lin, Chun-Yue; Chen, Shih-Fang; Kuan, Hon; Liang, Chin-Yung
國立成功大學	2006-09-25	Enhancing photoluminescence of nanocrystalline silicon thin film with oxygen plasma oxidation	Lin, Chun-Yu; Fang, Yean-Kuen; Chen, Shih-Fang; Chang, Shiuan-Ho; Chou, Tse-Heng
國立成功大學	2006-06	The impacts of high tensile stress CESL and geometry design on device performance and reliability for 90 nm SOI nMOSFETs	Lai, Chieh-Ming; Fang, Yean-Kuen; Lin, Chien-Ting; Hsu, Chia-Wei; Yeh, Wen-Kuan
國立成功大學	2006-04	Investigation and modeling of stress interactions on 90 nm silicon on insulator complementary metal oxide semiconductor by various mobility enhancement approaches	Lin, Chien-Ting; Fang, Yean-Kuen; Yeh, Wen-Kuan; Lee, Tung-Hsing; Chen, Ming-Hing; Hsu, Che-Hua; Chen, Liang-Wei; Chang, Hui-Chen; Tsai, Cheng-Tzung; Ma, Mike
國立成功大學	2006-04	Systematic analysis and modeling of on-chip spiral inductors for complementary metal oxide semiconductor radio frequency integrated circuits applications	Tang, Mao-Chyuan; Fang, Yean-Kuen; Yeh, Wen-Kuan; Chen, S. H.; Yeh, Ta-Hsun
國立成功大學	2006-04	Stress technology impact on device performances and reliability for (100) sub-90 nm silicon-on-insulator complementary metal-oxide-semiconductor field-effect-transistors	Lai, Chieh-Ming; Fang, Yean-Kuen; Yeh, Wen-Kuan
國立成功大學	2006-02-25	Growth of nanocrystalline silicon thin film with layer-by-layer technique for fast photo-detecting applications	Lin, Chun-Yu; Fang, Yean-Kuen; Ling, Shih-Fang; Lin, Ping-Chang; Lin, Chun-Sheng; Chou, Tse-Heng; Hwang, Jenn Shyong; Lin, Kuang I.
國立成功大學	2006-01	Preferential coalescence of nanocrystalline silicon on different film substrates	Lin, C. Y.; Fang, Yean-Kuen; Chen, S. F.; Lin, C. S.; Chou, T. H.; Hwang, S. B.; Hwang, J. S.; Lin, K. I.
國立高雄大學	2006	The impact of stress enhanced technology for sub-90nm SOI MOSFETs	Yeh, Wen-Kuan; Lai, Chieh-Ming; Lin, Chien-Ting; Fang, Yean-Kuen
國立成功大學	2006	Failure mechanism of electromigration in via sidewall for copper dual damascene interconnection	Hsu, Y. L.; Fang, Yean-Kuen; Chiang, Yen-Ting; Chen, Shih-Fang; Lin, C. Y.; Chou, T. H.; Chang, S. H.
國立成功大學	2005-12	Fabrication of very high quantum efficiency planar InGaAsPIN photodiodes through prebake process	Chang, S. H.; Fang, Yean-Kuen; Ting, S. F.; Chen, S. F.; Lin, C. Y.; Lin, C. S.; Wu, C. Y.
國立成功大學	2005-10	Reliability studies of Hf-doped and NH3-nitrided gate dielectric for advanced CMOS application	Yang, Chih-Wei; Liang, M. S.; Fang, Yean-Kuen; Hou, T. H.; Yao, Liang-Gi; Chen, S. C.; Chen, S. F.; Lin, C. S.; Lin, C. Y.; Wang, W. D.; CHou, T. H.; Lin, P. J.
國立成功大學	2005-09	Investigation and modeling of stress effects on the formation of cobalt salicide	Hsu, Y. L.; Fang, Yean-Kuen; Fang, S. J.; Chu, P.; Ho, Y.
國立成功大學	2005-09	A high-efficiency CMOS image sensor with air gap in situ MicroLens (AGML) fabricated by 0.18-/-mu m CMOS technology	Hsu, Tzu-Hsuan; Fang, Yean-Kuen; Yaung, Dun-Nian; Wuu, Shou-Gwo; Chien, H. C.; Tseng, Chien-Hsien; Yao, L. L.; Wang, Wen-De; Wang, Chung-Shu; Chen, Shih-Fang
國立成功大學	2005-09	Effect of extrinsic impedance and parasitic capacitance on figure of merit of RF MOSFET	Yeh, Wen-Kuan; Ku, Chao-Ching; Chen, Shuo-Mao; Fang, Yean-Kuen; Chao, C. P.
國立成功大學	2005-08	Investigation of structure and properties of nanocrystalline silicon on various buffer layers	Lin, C. Y.; Fang, Yean-Kuen; Chen, S. F.; Lin, C. S.; CHou, T. H.; Hwang, Sheng-Beng; HWang, Jeen-Shing; Lin, K. I.
國立成功大學	2005-08	An effective method to improve the sensitivity of deep submicrometer CMOS image sensors	Hsu, Tzu-Hsuan; Fang, Yean-Kuen; Yaung, Dun-Nian; Lin, J. S.; Wuu, Shou-Gwo; Chien, H. C.; Tseng, Chien-Hsien; Wang, Chung-Shu; Chen, Shih-Fang; Lin, Chun-Yue; Lin, Chun-Sheng; Chou, Tse-Heng
國立成功大學	2005-05	Color mixing improvement of CMOS image sensor with air-gap-guard ring in deep-submicrometer CMOS technology	Hsu, Tzu-Hsuan; Fang, Yean-Kuen; Yaung, Dun-Nian; Wuu, Shou-Gwo; Chien, H. C.; Wang, Chung-Shu; Lin, J. S.; Tseng, Chien-Hsien; Chen, Shih-Fang; Lin, Chun-Sheng; Lin, Chun-Yue

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