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机构 日期 题名 作者
國立交通大學 2014-12-08T15:03:04Z BANDGAP SHRINKAGE OF DEGENERATE P-TYPE GAAS BY PHOTOLUMINESCENCE SPECTROSCOPY FENG, MS; FANG, CSA; CHEN, HD
國立交通大學 2014-12-08T15:03:03Z Effects of rapid thermal annealing on Si delta-doped GaInP grown by low pressure metalorganic chemical vapor deposition Wang, CJ; Feng, MS; Chan, SH; Wu, JW; Chang, CY; Sze, SM
國立交通大學 2014-12-08T15:02:54Z A bilayer Ti/Ag ohmic contact for highly doped n-type GaN films Guo, JD; Lin, CI; Feng, MS; Pan, FM; Chi, GC; Lee, CT
國立交通大學 2014-12-08T15:02:51Z Characterization of anodic aluminum oxide film and its application to amorphous silicon thin film transistors Liang, CW; Luo, TC; Feng, MS; Cheng, HC; Su, D
國立交通大學 2014-12-08T15:02:40Z Electrical properties of amorphous silicon films with different thicknesses in metal/insulator/semiconductor structures Tai, YH; Su, FC; Chang, WS; Feng, MS; Cheng, HC
國立交通大學 2014-12-08T15:02:38Z Growth and electrical characterization of Si delta-doped GaInP by low pressure metalorganic chemical vapor deposition Wang, CJ; Feng, MS; Chan, SH; Chang, CY; Wu, JH; Sze, SM
國立交通大學 2014-12-08T15:02:35Z Effects of the rear interface states and fixed charges on the electrical characteristics of thin film transistors with thin amorphous silicon layers Tai, YH; Su, FC; Feng, MS; Cheng, HC
國立交通大學 2014-12-08T15:02:34Z The dependence of the electrical characteristics of the GaN epitaxial layer on the thermal treatment of the GaN buffer layer Lin, CF; Chi, GC; Feng, MS; Guo, JD; Tsang, JS; Hong, JMH
國立交通大學 2014-12-08T15:02:34Z X-ray crystallographic study of GaN epitaxial films on Al2O3(0001) substrates with GaN buffer layers Lee, CH; Chi, GC; Lin, CF; Feng, MS; Guo, JD
國立交通大學 2014-12-08T15:02:33Z Analysis of influence of alkyl sources on deep levels in GaN by transient capacitance method Chen, JF; Chen, NC; Huang, WY; Lee, WI; Feng, MS

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