臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

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Institution	Date	Title	Author
中原大學	2001-12	應用可拓理論中優度評價法於半導體晶片測試之檢驗項目嚴重程度排序問題 Using Grade Judgement Method of Extension Theory to Get Effective Information Feedback for Testing Items in Semiconductor Testing Site	沈育樹;侯廷俊;宮大川;Shum, Yu-Su;Ho, Ting-Chun;Gong, Dah-Chuan

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