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Showing items 11-19 of 19  (1 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-08T15:19:45Z INVESTIGATION OF JOULE HEATING EFFECT IN VARIOUS STAGES OF FAILURE IN FLIP-CHIP SOLDER JOINTS UNDER ACCELERATED ELECTROMIGRATION Hsiao, Hsiang Yao; Chen, Chih; Yao, D. J.
國立交通大學 2014-12-08T15:14:17Z Thermomigration in flip-chip SnPb solder joints under alternating current stressing Hsiao, Hsiang-Yao; Chen, Chih
國立交通大學 2014-12-08T15:13:50Z Erratum: "Thermomigration in flip-chip SnPb solder joints under alternate current stressing" [Appl. Phys. Lett. 90, 152105 (2007)] Hsiao, Hsiang-Yao; Chen, Chih
國立交通大學 2014-12-08T15:11:08Z Direct measurement of hot-spot temperature in flip-chip solder joints under current stressing using infrared microscopy Hsiao, Hsiang-Yao; Liang, S. W.; Ku, Min-Feng; Chen, Chih; Yao, Da-Jeng
國立交通大學 2014-12-08T15:09:48Z Thermomigration in Pb-free SnAg solder joint under alternating current stressing Hsiao, Hsiang-Yao; Chen, Chih
國立交通大學 2014-12-08T15:08:08Z Nonuniform and Negative Marker Displacements Induced by Current Crowding During Electromigration in Flip-Chip Sn-0.7Cu Solder Joints Liang, S. W.; Hsiao, Hsiang-Yao; Chen, Chih; Xu, Luhua; Tu, K. N.; Lai, Yi-Shao
國立交通大學 2014-12-08T15:03:39Z Measurement of Temperature Distribution in SnAg3.5 Flip-Chip Solder Joints during Current Stressing Using Infrared Microscopy Hsiao, Hsiang-Yao; Chen, Chih
國立交通大學 2014-12-08T15:01:53Z Measurement of Temperature Distribution in SnAg3.5 Flip-Chip Solder Joints during Current Stressing Using Infrared Microscopy Hsiao, Hsiang-Yao; Chen, Chih
國立成功大學 2014-10 Extremely anisotropic single-crystal growth in nanotwinned copper Lu, Chia-Ling; Lin, Han-Wen; Liu, Chien-Min; Huang, Yi-Sa; Lu, Tien-Lin; Liu, Tao-Chi; Hsiao, Hsiang-Yao; Chen, Chih; Kuo, Jui-Chao; Tu, King-Ning

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