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Institution	Date	Title	Author
國立成功大學	2008-11-21	Effect of hot carrier stress on RF reliability of 40 nm PMOSFETs with and without SiGe source/drain	Tang, Mao-Chyuan; Fang, Yean-Kuen; Wei, Sun-Chin; Chen, David C.; Yeh, Chune-Sin; Huang-Lu, Shiang

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	English \| 正體中文 \| 简体中文 \| 總筆數 :2856699
	造訪人次 : 53577298 線上人數 : 828 教育部委託研究計畫計畫執行:國立臺灣大學圖書館