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Showing items 1-8 of 8 (1 Page(s) Totally)
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| 國立交通大學 |
2017-04-21T06:49:16Z |
Testing Methods for Quaternary Content Addressable Memory Using Charge-Sharing Sensing Scheme
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Yang, Hao-Yu; Huang, Rei-Fu; Su, Chin-Lung; Lin, Kuan-Hong; Shu, Hang-Kaung; Peng, Chi-Wei; Chao, Mango C. -T. |
| 國立交通大學 |
2017-04-21T06:48:33Z |
Alternate Hammering Test for Application-Specific DRAMs and an Industrial Case Study
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Huang, Rei-Fu; Yang, Hao-Yu; Chao, Mango C. -T.; Lin, Shih-Chin |
| 國立交通大學 |
2014-12-08T15:36:45Z |
Testing Methods for a Write-Assist Disturbance-Free Dual-Port SRAM
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Yang, Hao-Yu; Lin, Chen-Wei; Huang, Chao-Ying; Lu, Ching-Ho; Lai, Chen-An; Chao, Mango C. -T.; Huang, Rei-Fu |
| 國立交通大學 |
2014-12-08T15:32:45Z |
Fault Models and Test Methods for Subthreshold SRAMs
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Lin, Chen-Wei; Chen, Hung-Hsin; Yang, Hao-Yu; Chao, Mango C-T; Huang, Rei-Fu |
| 國立交通大學 |
2014-12-08T15:29:08Z |
Fault Models and Test Methods for Subthreshold SRAMs
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Lin, Chen-Wei; Chen, Hung-Hsin; Yang, Hao-Yu; Huang, Chin-Yuan; Chao, Mango C. -T.; Huang, Rei-Fu |
| 國立交通大學 |
2014-12-08T15:23:46Z |
Testing Methodology of Embedded DRAMs
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Yang, Hao-Yu; Chang, Chi-Min; Chao, Mango C. -T.; Huang, Rei-Fu; Lin, Shih-Chin |
| 國立交通大學 |
2014-12-08T15:19:21Z |
Fault Models for Embedded-DRAM Macros
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Chao, Mango C. -T.; Yang, Hao-Yu; Huang, Rei-Fu; Lin, Shih-Chin; Chin, Ching-Yu |
| 國立交通大學 |
2014-12-08T15:04:25Z |
Testing Methodology of Embedded DRAMs
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Chang, Chi-Min; Chao, Mango C. -T.; Huang, Rei-Fu; Chen, Ding-Yuan |
Showing items 1-8 of 8 (1 Page(s) Totally)
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