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Taiwan Academic Institutional Repository >
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"huang ty"
Showing items 126-150 of 206 (9 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:27:25Z |
A model for photoresist-induced charging damage in ultra-thin gate oxides
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Lin, HC; Chien, CH; Wang, MF; Huang, TY; Chang, CY |
| 國立交通大學 |
2014-12-08T15:27:09Z |
Breakdown characteristics of ultra-thin gate oxides caused by plasma charging
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Chen, CC; Lin, HC; Chang, CY; Chien, CH; Huang, TY |
| 國立交通大學 |
2014-12-08T15:27:08Z |
Characterization and lithographic parameters extraction for the modified resists
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Ko, FH; Lu, JK; Chu, TC; Huang, TY; Yang, CC; Sheu, JT; Huang, HL |
| 國立交通大學 |
2014-12-08T15:27:07Z |
New insights on RF CMOS stability related to bias, scaling, and temperature
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Su, JG; Wong, SC; Chang, CY; Chiu, KY; Huang, TY; Ou, CT; Kao, CH; Chao, CJ |
| 國立交通大學 |
2014-12-08T15:27:02Z |
Plasma process induced damage in sputtered TiN metal gate capacitors with ultra-thin nitrided oxide
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Chen, CC; Lin, HC; Chang, CY; Chao, TS; Huang, SC; Wu, WF; Huang, TY; Liang, MS |
| 國立交通大學 |
2014-12-08T15:27:02Z |
Improved plasma charging immunity in ultra-thin gate oxide with fluorine and nitrogen implantation
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Chen, CC; Lin, HC; Chang, CY; Huang, CC; Chien, CH; Huang, TY; Liang, MS |
| 國立交通大學 |
2014-12-08T15:26:58Z |
Characterization and modeling of out-diffusion of cesium, manganese and zinc impurities from deep ultraviolet photoresist
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Ko, FH; Wang, MY; Wang, TK; Yang, CC; Huang, TY; Wu, CS |
| 國立交通大學 |
2014-12-08T15:26:56Z |
Film characterization and evaluation of process performance for the modified electron beam resist
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Ko, FH; Ting, JH; Chou, CT; Hsiao, LT; Huang, TY; Dai, BT |
| 國立交通大學 |
2014-12-08T15:26:54Z |
Thermal stability of PVD TiN gate and its impacts on characteristics of CMOS transistors
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Wang, MF; Kao, YC; Huang, TY; Lin, HC; Chang, CY |
| 國立交通大學 |
2014-12-08T15:26:48Z |
Investigations of bulk dynamic threshold-voltage MOSFET with 65GHz "normal-mode" Ft and 220GHz "over-drive mode" Ft for RF applications
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Chang, CY; Su, JG; Hsu, HM; Wong, SC; Huang, TY; Sun, YC |
| 國立交通大學 |
2014-12-08T15:26:36Z |
Process and doping species dependence of negative-bias-temperature instability for p-channel MOSFETs
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Lee, DY; Lin, HC; Chiang, WJ; Lu, WT; Huang, GW; Huang, TY; Wang, T |
| 國立交通大學 |
2014-12-08T15:26:17Z |
Effects of plasma treatments on the characteristics of poly-Si thin-film transistors having electrical junctions induced by a bottom sub-gate
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Yu, CM; Lin, HC; Lei, TF; Huang, TY |
| 國立交通大學 |
2014-12-08T15:26:17Z |
Characteristics of Schottky barrier poly-Si thin film transistors with excimer laser annealing treatment
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Yeh, KL; Lin, HC; Tsai, RW; Lee, MH; Huang, TY |
| 國立交通大學 |
2014-12-08T15:26:17Z |
Impacts of HF etching on ultra-thin core gate oxide integrity in dual gate oxide CMOS technology
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Lee, DY; Lin, HC; Chen, CL; Huang, TY; Wang, TH; Lee, TL; Chen, SC; Liang, MS |
| 國立交通大學 |
2014-12-08T15:25:49Z |
Strongly regular graphs associated with bent functions
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Huang, TY; You, KH |
| 國立交通大學 |
2014-12-08T15:25:47Z |
NBTI effects of pMOSFETs with different nitrogen dose imlantation
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Lee, YJ; Tang, LC; Wu, MH; Chao, TS; Ho, PT; Lai, D; Yang, WL; Huang, TY |
| 國立交通大學 |
2014-12-08T15:25:46Z |
EEG-based fuzzy neural network estimator for driving performance
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Wu, RC; Lin, CT; Liang, SF; Huang, TY; Jung, TP |
| 國立交通大學 |
2014-12-08T15:25:46Z |
Estimating driving performance based on EEG spectrum and fuzzy neural network
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Wu, RC; Lin, CT; Liang, SF; Huang, TY; Chen, YC; Jung, TP |
| 國立交通大學 |
2014-12-08T15:25:43Z |
A novel methodology for extracting effective density-of-states in poly-Si thin-film transistors
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Lin, HC; Yeh, KL; Lee, MH; Su, YC; Huang, TY; Shen, SW; Lin, HY |
| 國立交通大學 |
2014-12-08T15:25:40Z |
The impact of uniaxial strain engineering on channel backscattering in nanoscale MOSFETs
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Lin, HN; Chen, HW; Ko, CH; Ge, CH; Lin, HC; Huang, TY; Lee, WC; Tang, DD |
| 國立交通大學 |
2014-12-08T15:25:22Z |
Assessment of driver's driving performance and alertness using EEG-based fuzzy neural networks
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Lin, CT; Chen, YC; Wu, RC; Liang, SF; Huang, TY |
| 國立交通大學 |
2014-12-08T15:25:22Z |
Classification of driver's cognitive responses from EEG analysis
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Liang, SF; Lin, CT; Wu, RC; Huang, TY; Chao, WH |
| 國立交通大學 |
2014-12-08T15:25:11Z |
Channel backscattering characteristics of strained PMOSFETs with embedded SiGe source/drain
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Lin, HN; Chen, HW; Ko, CH; Ge, CH; Lin, HC; Huang, TY; Lee, WC |
| 國立交通大學 |
2014-12-08T15:19:33Z |
An improved approach for small-signal equivalent-circuit parameter determination of InGaP/GaAs HBT
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Chen, HY; Chen, KM; Huang, GW; Chang, CY; Huang, TY |
| 國立交通大學 |
2014-12-08T15:18:51Z |
High voltage applications and NBTI effects of DT-pMOSFETS with reverse Schottky substrate contacts
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Lee, YJ; Chao, TS; Huang, TY |
Showing items 126-150 of 206 (9 Page(s) Totally)
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