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Taiwan Academic Institutional Repository >
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"huang ty"
Showing items 66-90 of 206 (9 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:44:10Z |
Electrical and compositional properties of co-silicided shallow p(+)-n junction using Si-capped/boron-doped Si1-xGex layer deposited by UHVCME
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Huang, HJ; Chen, KM; Chang, CY; Huang, TY |
| 國立交通大學 |
2014-12-08T15:44:07Z |
The reaction of Co and Si1-xGex for MOSFET with poly-Si1-xGex gate
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Chen, KM; Huang, HJ; Chang, CY; Huang, TY; Huang, GW; Chen, LP |
| 國立交通大學 |
2014-12-08T15:43:58Z |
Schottky barrier thin-film transistor (SBTFT) with silicided source/drain and field-induced drain extension
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Lin, HC; Yeh, KL; Huang, RG; Lin, CY; Huang, TY |
| 國立交通大學 |
2014-12-08T15:43:51Z |
Electrical properties of shallow p(+)-n junction using boron-doped Si1-xGex layer deposited by ultrahigh vacuum chemical molecular epitaxy
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Huang, HJ; Chen, KM; Chang, CY; Chao, TS; Huang, TY |
| 國立交通大學 |
2014-12-08T15:43:41Z |
Post-soft-breakdown characteristics of deep submicron NMOSFETs with ultrathin gate oxide
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Tsai, MY; Lin, HC; Lee, DY; Huang, TY |
| 國立交通大學 |
2014-12-08T15:43:40Z |
X-ray photoelectron spectroscopy of gate-quality silicon oxynitride films produced by annealing plasma-nitrided Si(100) in nitrous oxide
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Chen, HW; Landheer, D; Chao, TS; Hulse, JE; Huang, TY |
| 國立交通大學 |
2014-12-08T15:43:37Z |
Conduction mechanisms for off-state leakage current of Schottky barrier thin-film transistors
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Yeh, KL; Lin, HC; Huang, RG; Tsai, RW; Huang, TY |
| 國立交通大學 |
2014-12-08T15:43:36Z |
Improved low temperature characteristics of p-channel MOSFETs with Si1-xGex raised source and drain
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Huang, HJ; Chen, KM; Huang, TY; Chao, TS; Huang, GW; Chien, CH; Chang, CY |
| 國立交通大學 |
2014-12-08T15:43:27Z |
Electrical characteristics of thin cerium oxide film on silicon substrate by reactive DC sputtering
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Pan, TM; Chien, CH; Lei, TF; Chao, TS; Huang, TY |
| 國立交通大學 |
2014-12-08T15:43:22Z |
Improving the RF performance of 0.18 mu m CMOS with deep n-well implantation
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Su, JG; Hsu, HM; Wong, SC; Chang, CY; Huang, TY; Sun, JYC |
| 國立交通大學 |
2014-12-08T15:43:09Z |
The effects of low-pressure rapid thermal post-annealing on the properties of (Ba,Sr)TiO3 thin films deposited by liquid source misted chemical deposition
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Yang, MJ; Chien, CH; Leu, CC; Zhang, RJ; Wu, SC; Huang, TY; Tseng, TY |
| 國立交通大學 |
2014-12-08T15:42:51Z |
Impact of thermal stability on the characteristics of complementary metal oxide semiconductor transistors with TiN metal gate
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Wang, MF; Huang, TY; Kao, YC; Lin, HC; Chang, CY |
| 國立交通大學 |
2014-12-08T15:42:48Z |
Ambipolar Schottky-barrier TFTs
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Lin, HC; Yeh, KL; Huang, TY; Huang, RG; Sze, SM |
| 國立交通大學 |
2014-12-08T15:42:37Z |
Enhanced negative-bias-temperature instability of P-channel metal-oxide-semiconductor transistors due to plasma charging damage
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Lee, DY; Lin, HC; Wang, MF; Tsai, MY; Huang, TY; Wang, TH |
| 國立交通大學 |
2014-12-08T15:42:37Z |
Reduction of off-state leakage current in Schottky barrier thin-film transistors (SBTFT) by a field-induced drain
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Yeh, KL; Lin, HC; Huang, RG; Tsai, RW; Huang, TY |
| 國立交通大學 |
2014-12-08T15:42:33Z |
RF CMOS technology for MMIC
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Chang, CY; Su, JG; Wong, SC; Huang, TY; Sun, YC |
| 國立交通大學 |
2014-12-08T15:42:26Z |
Characterization of thin ZrO2 films deposited using Zr(O '-Pr)(2)(thd)(2) and O-2 on Si(100)
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Chen, HW; Landheer, D; Wu, X; Moisa, S; Sproule, GI; Chao, TS; Huang, TY |
| 國立交通大學 |
2014-12-08T15:42:25Z |
Characteristics of polycrystalline silicon thin-film transistors with electrical source/drain extensions induced by a bottom sub-gate
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Yu, M; Lin, HC; Chen, GH; Huang, TY; Lei, TF |
| 國立交通大學 |
2014-12-08T15:42:23Z |
A silicon nanowire with a Coulomb blockade effect at room temperature
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Hu, SF; Wong, WZ; Liu, SS; Wu, YC; Sung, CL; Huang, TY; Yang, TJ |
| 國立交通大學 |
2014-12-08T15:42:21Z |
Physical and electrical characterization of ZrO(2) gate insulators deposited on Si(100) using Zr(O(i)-Pr)(2)(thd)(2) and O(2)
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Chen, HW; Huang, TY; Landheer, D; Wu, X; Moisa, S; Sproule, GI; Chao, TS |
| 國立交通大學 |
2014-12-08T15:42:20Z |
Application of field-induced source/drain Schottky metal-oxide-semiconductor to fin-like body field-effect transistor
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Lin, HC; Wang, MF; Hou, FJ; Liu, JT; Huang, TY; Sze, SM |
| 國立交通大學 |
2014-12-08T15:42:17Z |
Reliability of laser-activated low-temperature polycrystalline silicon thin-film transistors
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Peng, DZ; Chang, TC; Zan, HW; Huang, TY; Chang, CY; Liu, PT |
| 國立交通大學 |
2014-12-08T15:42:09Z |
The extraction of MOSFET gate capacitance from S-parameter measurements
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Su, JG; Wong, SC; Chang, CY; Huang, TY |
| 國立交通大學 |
2014-12-08T15:42:06Z |
Self-aligned fabrication of thin-film transistors with field-induced drain
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Yu, CM; Lin, HC; Lin, CY; Yeh, KL; Huang, TY; Lei, TF |
| 國立交通大學 |
2014-12-08T15:41:57Z |
Simultaneous etching of polysilicon materials with different doping types by low-damage transformer-coupled plasma technique
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Hung, CC; Lin, HC; Wang, MF; Huang, TY; Shih, HC |
Showing items 66-90 of 206 (9 Page(s) Totally)
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