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"huang ty"的相关文件
显示项目 26-35 / 206 (共21页)
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| 亞洲大學 |
201501 |
CCL5/CCR5 axis induces vascular endothelial growth factor-mediated tumor angiogenesis in human osteosarcoma microenvironment
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Wang, SW;Wang, SW;Liu, SC;Liu, SC;Sun, HL;Sun, HL;Huang, TY;Huang, TY;Chan, CH;Chan, CH;Yang, CY;Yang, CY;Yeh, HI;Yeh, HI;黃元勵;HUANG, YUAN-LI;Chou WY, ;Lin YM, ;Tang, CH;Tang, CH |
| 亞洲大學 |
2015-01 |
CCL5/CCR5 axis induces vascular endothelial growth factor-mediated tumor angiogenesis in human osteosarcoma microenvironment
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Wang, SW;Wang, SW;Liu, SC;Liu, SC;Sun, HL;Sun, HL;Huang, TY;Huang, TY;Chan, CH;Chan, CH;Yang, CY;Yang, CY;Yeh, HI;Yeh, HI;黃元勵;HUANG, YUAN-LI;Chou WY, ;Lin YM, ;Tang, CH;Tang, CH |
| 國立交通大學 |
2014-12-08T15:49:20Z |
Effects of N2O-annealed sacrificial oxide on the short-channel effects of nMOSFETs
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Jong, FC; Huang, TY; Chao, TS; Lin, HC; Wang, MF; Chang, CY |
| 國立交通大學 |
2014-12-08T15:49:16Z |
Evaluation of plasma charging damage in ultrathin gate oxides
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Lin, HC; Chen, CC; Chien, CH; Hsein, SK; Wang, MF; Chao, TS; Huang, TY; Chang, CY |
| 國立交通大學 |
2014-12-08T15:49:00Z |
Rugged surface polycrystalline silicon film formed by rapid thermal chemical vapor deposition for dynamic random access memory stacked capacitor application
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Lin, M; Chang, CY; Huang, TY; Kuo, UJ |
| 國立交通大學 |
2014-12-08T15:48:56Z |
Improving radiation hardness of EEPROM/flash cell by N2O annealing
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Huang, TY; Jong, FC; Chao, TS; Lin, HC; Leu, LY; Young, K; Lin, CH; Chiu, KY |
| 國立交通大學 |
2014-12-08T15:48:55Z |
Comparison of N-2 and NH3 plasma passivation effects on polycrystalline silicon thin-film transistors
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Lee, YS; Lin, HY; Lei, TF; Huang, TY; Chang, TC; Chang, CY |
| 國立交通大學 |
2014-12-08T15:47:36Z |
Improvement of reliability of metal-oxide semiconductor field-effect transistors with N2O nitrided gate oxide and N2O polysilicon gate reoxidation
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Lai, CS; Chao, TS; Lei, TF; Lee, CL; Huang, TY; Chang, CY |
| 國立交通大學 |
2014-12-08T15:47:03Z |
The effects of shallow germanium halo doping on N-channel metal oxide semiconductor field effect transistors
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Wang, MF; Chien, CH; Chao, TS; Lin, HC; Jong, FC; Huang, TY; Chang, CY |
| 國立交通大學 |
2014-12-08T15:46:47Z |
Oxide thickness dependence of plasma charging damage
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Lin, HC; Chen, CC; Wang, MF; Hsien, SK; Chien, CH; Huang, TY; Chang, CY |
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