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机构 日期 题名 作者
臺大學術典藏 2021-09-02T00:05:24Z Modeling power vertical high-k MOS device with interface charges via superposition methodology-breakdown voltage and specific ON-resistance Wang Z;Wang X;Kuo J.B.; Wang Z; Wang X; Kuo J.B.; JAMES-B KUO
臺大學術典藏 2021-09-02T00:05:24Z On the form of 1-D nonlinear Poisson’s equation and the concept of neutralization voltage for non-uniformly doped MOSFETs Hong C;Kuo J.B;Chen Y.; Hong C; Kuo J.B; Chen Y.; JAMES-B KUO
臺大學術典藏 2021-09-02T00:05:23Z A Substrate-Dissipating (SD) Mechanism for a Ruggedness-Improved SOI LDMOS Device Wang B;Wang Z;Kuo J.B.; Wang B; Wang Z; Kuo J.B.; JAMES-B KUO
臺大學術典藏 2021-09-02T00:05:23Z A Unified Continuous and Discrete Model for Double-Gate MOSFETs with Spatially Varying or Pulsed Doping Profiles Hong C;Zhou J;Cheng Q;Zhu K;Kuo J.B;Chen Y.; Hong C; Zhou J; Cheng Q; Zhu K; Kuo J.B; Chen Y.; JAMES-B KUO
臺大學術典藏 2021-09-02T00:05:23Z Author's Reply to "comments on 'A General and Transformable Model Platform for Emerging Multi-Gate MOSFETs'" Hong C;Zhou J;Wang R;Huang J;Bai W;Kuo J.B;Chen Y.; Hong C; Zhou J; Wang R; Huang J; Bai W; Kuo J.B; Chen Y.; JAMES-B KUO
臺大學術典藏 2021-09-02T00:05:23Z Modeling of Breakdown Voltage for SOI Trench LDMOS Device Based on Conformal Mapping Wang Y;Wang Z;Bai T;Kuo J.B.; Wang Y; Wang Z; Bai T; Kuo J.B.; JAMES-B KUO
臺大學術典藏 2021-09-02T00:05:22Z A General and Transformable Model Platform for Emerging Multi-Gate MOSFETs Hong C;Zhou J;Huang J;Wang R;Bai W;Kuo J.B;Chen Y.; Hong C; Zhou J; Huang J; Wang R; Bai W; Kuo J.B; Chen Y.; JAMES-B KUO
臺大學術典藏 2018-09-10T05:18:26Z A hierarchical and multi-model based algorithm for lead detection and news program narrative parsing Kuo, J.-H.; Kuo, J.-B.; Chen, H.-W.; Wu, J.-L.; JA-LING WU
國立臺灣大學 2010 Shallow Trench Isolation-Related Narrow Channel Effect on the Kink Effect Behavior of 40nm PD SOI NMOS Device Hung, H. J.; Kuo, J. B.; Chen, D.; Tsai, C. T.; Yeh, C. S.
臺大學術典藏 2010 Modeling the parasitic bipolar device in the 40nm PD SOI NMOS device considering the floating body effect CHIH-HAO CHEN; Kuo J.B.; Chen D.; Yeh C.S.

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