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Showing items 1-6 of 6 (1 Page(s) Totally)
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| 國立交通大學 |
2020-10-05T01:59:50Z |
Energy Transformation Between the Inductor and the Power Transistor for the Unclamped Inductive Switching (UIS) Test
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Nidhi, Karuna; Lee, Jian-Hsing; Huang, Shao-Chang; Ker, Ming-Dou |
| 國立交通大學 |
2019-08-02T02:15:29Z |
Avalanche Ruggedness Capability and Improvement of 5-V n-Channel Large-Array MOSFET in BCD Process
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Nidhi, Karuna; Ker, Ming-Dou; Lee, Jian-Hsing; Huang, Shao-Chang |
| 國立交通大學 |
2018-08-21T05:53:47Z |
Improving Safe-Operating-Area o f a 5-V n-Channel Large Array MOSFET in a 0.15-mu m BCD Process
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Nidhi, Karuna; Ker, Ming-Dou; Lin, Tingyou; Lee, Jian-Hsing |
| 國立交通大學 |
2014-12-08T15:30:52Z |
Semiself-Protection Scheme for Gigahertz High-Frequency Output ESD Protection
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Lee, Jian-Hsing; Huang, Shao-Chang; Su, Hung-Der; Chen, Ke-Horng |
| 國立交通大學 |
2014-12-08T15:23:27Z |
Two-stage trigger silicon-controller rectifier (SCR) for radio-frequency (RF) input and output protections in nanometer technologies
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Lee, Jian-Hsing; Wu, Yi-Hsun; Huang, Shao-Chang; Lee, Yu-Huei; Chen, Ke-Horng |
| 國立成功大學 |
2008-08 |
Dynamic turn-on mechanism of the n-MOSFET under high-current stress
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Yang, Dao-Hong; Chen, Jone F.; Lee, Jian-Hsing; Wu, Kuo-Ming |
Showing items 1-6 of 6 (1 Page(s) Totally)
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