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"lei tan fu"的相关文件
显示项目 46-55 / 112 (共12页) << < 1 2 3 4 5 6 7 8 9 10 > >> 每页显示[10|25|50]项目
| 國立交通大學 |
2014-12-08T15:25:30Z |
Analysis of pentacene thin film transistors in different atmospheres
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Wang, Yu-Wu; Cheng, Horng-Long; Wang, Yi-Kai; Hu, Tang-Hsiang; Ho, Jia-Chong; Lee, Cheng-Chung; Lei, Tan-Fu; Yeh, Ching-Fa |
| 國立交通大學 |
2014-12-08T15:25:06Z |
Effect of chemical mechanical polish process on low-temperature poly-SiGe thin-film transistors
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Shieh, Ming-Shan; Chen, Chih-Yang; Hsu, Yuan-Jiun; Wang, Shen-De; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:25:06Z |
Process induced instability and reliability issues in low temperature poly-Si thin film transistors
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Chen, Chih-Yang; Wang, Shen-De; Shieh, Ming-Shan; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Lee, Jam-Wen; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:17:43Z |
PolySi-SiO2-ZrO2-SiO2-Si flash memory incorporating a sol-gel-derived ZrO2 charge trapping layer
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Hsu, Tzu-Hsiang; You, Hsin-Chiang; Ko, Fu-Hsiang; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:16:08Z |
Hafnium silicate nanocrystal memory using sol-gel-spin-coating method
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You, Hsin-Chiang; Hsu, Tze-Hsiang; Ko, Fu-Hsiang; Huang, Jiang-Wen; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:16:08Z |
SONOS-type flash memory using an HfO2 as a charge trapping layer deposited by the sol-gel spin-coating method
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You, Hsin-Chiang; Hsu, Tze-Hsiang; Ko, Fu-Hsiang; Huang, Jiang-Wen; Yang, Wen-Luh; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:57Z |
Fringing electric field effect on 65-nm-node fully depleted silicon-on-insulator devices
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Ma, Ming-Wen; Chao, Tien-Sheng; Kao, Kuo-Hsing; Huang, Jyun-Siang; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:43Z |
The impact of deep Ni salicidation and NH3 plasma treatment on nano-SOI FinFETs
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You, Hsin-Chiang; Kuo, Po-Yi; Ko, Fu-Hsiang; Chao, Tien-Sheng; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:32Z |
High-kappa material sidewall with source/drain-to-gate non-overlapped structure for low standby power applications
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Ma, Ming-Wen; Chao, Tien-Sheng; Kao, Kuo-Hsing; Huang, Jyun-Siang; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:31Z |
Plasma damage-enhanced negative bias temperature instability in low-temperature polycrystalline silicon thin-film transistors
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Chen, Chih-Yang; Lee, Jam-Wem; Chen, Wei-g Chen; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Lee, Po-Hao; Wang, Shen-De; Lei, Tan-Fu |
显示项目 46-55 / 112 (共12页) << < 1 2 3 4 5 6 7 8 9 10 > >> 每页显示[10|25|50]项目
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